Zachariah Baum - San Francisco CA, US Aaron Baum - San Francisco CA, US
International Classification:
G06F017/00
US Classification:
707104100
Abstract:
A system and method of providing media recommendations and media segments based on expert choice lists is disclosed. Expert choice lists consisting of media segment references are retrieved through a data network and stored cumulatively in a database as records with text descriptor fields. Users of the suggestion system make requests in the form of text search descriptors and a desired output descriptor type. Descriptors of the output type in the expert choice list database are scored by the frequency with which they appear in expert choice lists possessing matches to the search descriptors. A list of the top-scoring descriptors is returned. In an alternate preferred embodiment, media segment references are scored by the frequency of their appearance in lists with matches to the search descriptors. The highest-scoring segment references are used to generate a playlist so that the recommended media segments can be presented to the user automatically.
An inflatable device serving in one or more roles as furniture and/or equipment for exercise, recreation, and/or therapeutic equipment, or in some combination of these functions is disclosed. The device consists of an inflatable base () with one or more cavities or holes, with rounded inflatable spheroid(s) () in said cavities or holes. The device may optionally include a system of straps (and ) or a form-fitting covering around the base, which may serve to correct an asymmetry in said base. The device may include a weighted base (). The device may also include means for generating lights, sound, and/or video (and/or ) responsive to the actions of users on or around the device.
Electron Beam Microscope Using Electron Beam Patterns
An electron beam microscope includes an electron beam pattern source, a vacuum enclosure, electron optics, a detector and a processor. The electron beam pattern source generates a sequence of electron beam patterns for illuminating a set of pixels on a specimen. The electron optics directs the sequence of electron beam patterns to the specimen. The detector detects a result of an interaction between each of the electron beam patterns and the specimen and produces a sequence of detector signals. The processor, in response to the sequence of detector signals, generates an image including a pixel value representative of each of the illuminated of pixels on the specimen. The electron beam microscope preferably includes a deflector for deflecting each of the electron beam patterns relative to the specimen.
Aaron W. Baum - San Francisco CA James Edward Schneider - Fairfield OH
Assignee:
The Board of Trustees of the Leland Stanford Jr. University - Stanford CA
International Classification:
H01J 4006
US Classification:
313542
Abstract:
An electron beam source includes a cathode having an electron emission surface including an active area for emission of electrons and a cathode shield assembly including a conductive shield disposed in proximity to the electron emission surface of the cathode. The shield has an opening aligned with the active area. The electron beam source further includes a device for stimulating emission of electrons from the active area of the cathode, electron optics for forming the electrons into an electron beam and a vacuum enclosure for maintaining the cathode at high vacuum. The cathode may be a negative electron affinity photocathode formed on a light-transmissive substrate. The shield protects non-emitting areas of the emission surface from contamination and inhibits cathode materials from contaminating components of the electron beam source. The cathode may be moved relative to the opening in the shield so as to align an new active area with the opening. Getter materials and sources of activation material may be incorporated into the shield assembly.
Electron Sources Utilizing Negative Electron Affinity Photocathodes With Ultra-Small Emission Areas
Aaron Wolf Baum - San Francisco CA Kenneth A. Costello - Union City CA
Assignee:
Intevac, Inc. - Santa Clara CA Board of Trustees of the Leland Stanford Jr. University - Stanford CA
International Classification:
H01J 4006
US Classification:
313542
Abstract:
An electron source includes a negative electron affinity photocathode on a light-transmissive substrate and a light beam generator for directing a light beam through the substrate at the photocathode for exciting electrons into the conduction band. The photocathode has at least one active area for emission of electrons with dimensions of less than about two micrometers. The electron source further includes electron optics for forming the electrons into an electron beam and a vacuum enclosure for maintaining the photocathode at high vacuum. In one embodiment, the active emission area of the photocathode is defined by the light beam that is incident on the photocathode. In another embodiment, the active emission area of the photocathode is predefined by surface modification of the photocathode. The source provides very high brightness from an ultra-small active emission area of the photocathode.