Alejandro G Castillo

US Patent:

20120030655, Feb 2, 2012

Filed:

Jul 29, 2010

Appl. No.:

12/846284

Inventors:

Alejandro de Castillo - Austin TX, US

International Classification:

G06F 9/44

US Classification:

717125, 717131

Abstract:

A graphical program is analyzed, where the graphical program includes an I/O interface including one or more ordered parameters for providing input to or receiving output from the graphical program. A function is generated in a textual programming language based on the analyzing, where the function implements the functionality of the graphical program, and includes a textual function I/O interface with the one or more ordered parameters of the I/O interface of the graphical program. User input is received specifying a modified textual function I/O interface that differs from the textual function I/O interface. A wrapper for the function is generated with the modified textual function I/O interface, where the wrapper includes the function, and where during execution the wrapper receives or outputs values in accordance with the modified textual function I/O interface, and provides values to or receives values from the function via the textual function I/O interface.

US Patent:

20210357421, Nov 18, 2021

Filed:

May 15, 2020

Appl. No.:

16/875669

Inventors:

- Austin TX, US
Michael Watson - Austin TX, US
Alejandro del Castillo - Austin TX, US
Daren K. Wilson - Austin TX, US

International Classification:

G06F 16/25
G06F 16/28
G06F 16/22
G06F 16/16

Abstract:

A method to dynamically analyze measurement data comprising measurement data sets as the measurement data is received and moved to a data warehouse. The program instructions may receive the measurement data and may extract first metadata from the measurement data. The program instructions may then extract and analyze measurement data points in the measurement data to determine if the measurement data points meet a first criteria and generate second metadata in response to determining that the measurement data points meet the first criteria. The program instructions may then provide the measurement data points, the first metadata and the second metadata to a data warehouse for storage. The analysis of the measurement data and creation of new metadata may be performed dynamically as the data is acquired and stored in the data warehouse.