Allen L Evans

age ~62

from Dripping Springs, TX

Also known as:
  • Allen Lewis Evans
  • Allen Sylvia Evans
  • Allan L Evans
  • Lewis Evans Allen
  • Lewis Evens Allen

Allen Evans Phones & Addresses

  • Dripping Springs, TX
  • Austin, TX
  • Hays, TX
  • Dripping Spgs, TX
  • 1008 Canyon View Rd, Dripping Springs, TX 78620 • 5128943870

Education

  • Degree:
    Associate degree or higher

Emails

Wikipedia References

Allen Evans Photo 1

Allen V. Evans

Name / Title
Company / Classification
Phones & Addresses
Allen Evans
Treasurer
St. Alban's Episcopal Church, Manchaca
Allen W Evans
Incorporator
EVANS INVESTMENT CORPORATION

Resumes

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Fellow And Senior Manager Fab 25 Films And Polish

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Location:
5204 east Ben White Blvd, Austin, TX 78741
Industry:
Semiconductors
Work:
Cypress Semiconductor Corporation
Fellow and Senior Manager Fab 25 Films and Polish

Spansion
Spansion Fellow and Six Sigma Black Belt

Amd 1986 - 2004
Senior Member Technical Staff
Education:
St.edward's University 1990 - 1995
Master of Business Administration, Masters
University of Cincinnati 1981 - 1986
Bachelors, Electronics Engineering, Electronics
Skills:
Semiconductors
Semiconductor Industry
Six Sigma
Design of Experiments
Failure Analysis
Silicon
Spc
Ic
Metrology
Cross Functional Team Leadership
Thin Films
Jmp
Cmos
Yield
Cvd
Manufacturing
Product Engineering
Engineering Management
Statistical Process Control
Characterization
Continuous Improvement
Pvd
Product Development
Soc
Engineering
Photolithography
Product Marketing
Analog
Asic
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Allen Evans

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Allen Evans

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Allen Evans

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Industry:
Biotechnology
Work:
ArcMed BioFirm
Owner
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Allen Evans

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Education:
The University of Georgia
Doctor of Jurisprudence, Doctorates, Law
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Allen Evans

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Location:
United States
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Allen Evans

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Location:
United States

Isbn (Books And Publications)

The Splendour of St. Jacques

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Author
Allen Evans

ISBN #
0919095097

Medicine Doctors

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Allen M. Evans

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Specialties:
Otolaryngology, Plastic Surgery within the Head & Neck
Work:
Sante Community PhysiciansCentral California Ear Nose & Throat Medical Group
1351 E Spruce Ave STE 100, Fresno, CA 93720
5594323303 (phone), 5594321468 (fax)
Education:
Medical School
Washington University School of Medicine
Graduated: 1986
Procedures:
Rhinoplasty
Sinus Surgery
Tonsillectomy or Adenoidectomy
Hearing Evaluation
Inner Ear Tests
Thyroid Gland Removal
Conditions:
Abdominal Hernia
Acute Pharyngitis
Acute Sinusitis
Acute Upper Respiratory Tract Infections
Allergic Rhinitis
Languages:
English
Spanish
Description:
Dr. Evans graduated from the Washington University School of Medicine in 1986. He works in Fresno, CA and specializes in Otolaryngology and Plastic Surgery within the Head & Neck. Dr. Evans is affiliated with Clovis Community Medical Center and Saint Agnes Medical Center.

Us Patents

  • Method For Controlling Optical Properties Of Antireflective Coatings

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  • US Patent:
    6403151, Jun 11, 2002
  • Filed:
    Apr 18, 2000
  • Appl. No.:
    09/552164
  • Inventors:
    Bradley Marc Davis - Austin TX
    Craig William Christian - Buda TX
    Allen Lewis Evans - Austin TX
  • Assignee:
    Advanced Micro Devices, Inc. - Austin TX
  • International Classification:
    B05D 506
  • US Classification:
    427162, 427 8, 42725529, 42725537, 427579, 2041921, 438786, 438787
  • Abstract:
    A method is used by a semiconductor processing tool. The method comprises forming a first layer above a substrate layer, and forming an inorganic bottom antireflective coating layer above the first layer by introducing at least two gases at a preselected ratio into the semiconductor processing tools. A signal indicating that the semiconductor processing tool has been serviced is received, and the ratio of the gases is varied in response to receiving the signal to control optical parameters of the bottom antireflective coating layer to enhance subsequent photolithographic processes.
  • Method And Apparatus For Determining Measurement Frequency Based On Hardware Age And Usage

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  • US Patent:
    6469518, Oct 22, 2002
  • Filed:
    Jan 7, 2000
  • Appl. No.:
    09/479180
  • Inventors:
    Bradley M. Davis - Austin TX
    Allen L. Evans - Austin TX
    Craig W. Christian - Buda TX
  • Assignee:
    Advanced Micro Devices, Inc. - Austin TX
  • International Classification:
    G01R 2700
  • US Classification:
    324600, 700 31, 700 97, 700109, 700121
  • Abstract:
    A processing line includes a processing tool, a measurement tool, and an automatic process controller. The processing tool is adapted to process articles. The measurement tool is adapted to measure a characteristic of selected articles at a measurement frequency. The automatic process controller is adapted to change the measurement frequency based on a usage characteristic of the processing tool. A method for monitoring a processing tool includes processing a plurality of articles in the processing tool; measuring a characteristic of selected articles at a measurement frequency; and changing the measurement frequency based on a usage characteristic of the processing tool.
  • Method And Apparatus For Reducing Deposition Variation By Modeling Post-Clean Chamber Performance

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  • US Patent:
    6512991, Jan 28, 2003
  • Filed:
    Jul 12, 2000
  • Appl. No.:
    09/614312
  • Inventors:
    Bradley M. Davis - Austin TX
    Allen L. Evans - Austin TX
    Craig W. Christian - Buda TX
  • Assignee:
    Advanced Micro Devices, Inc. - Austin TX
  • International Classification:
    G01K 120
  • US Classification:
    702136, 702130, 702 88, 702 99, 702106
  • Abstract:
    A method for reducing deposition thickness variation in a processing tool comprises storing a post-clean performance model of the processing tool; receiving at least one of a showerhead age and a tool idle time associated with the processing tool as an input parameter; determining temperature control parameters based on the input parameter and the post-clean performance model; and modifying an operating recipe of the processing tool based on the temperature control parameters. A processing system includes a processing tool and an automatic process controller. The processing tool is adapted to process wafers in accordance with an operating recipe. The automatic process controller is adapted to store a post-clean performance model of the processing tool, receive at least one of a showerhead age and a tool idle time associated with the processing tool as an input parameter, determine temperature control parameters based on the input parameter and the post-clean performance model, and modify the operating recipe of the processing tool based on the temperature control parameters.
  • Method Of Reducing Interlayer Dielectric Thickness Variation Feeding Into A Planarization Process

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  • US Patent:
    6514865, Feb 4, 2003
  • Filed:
    Jan 11, 2002
  • Appl. No.:
    10/044532
  • Inventors:
    Allen L. Evans - Dripping Springs TX
  • Assignee:
    Advanced Micro Devices, Inc. - Austin TX
  • International Classification:
    H01L 21302
  • US Classification:
    438710, 438 14, 438 5
  • Abstract:
    A method is provided that comprises forming a first dielectric layer on a workpiece, measuring a thickness of the first dielectric layer, and forming a second dielectric layer above the first dielectric layer, the second dielectric layer being formed to a thickness that is determined based upon the measured thickness of the first dielectric layer.
  • Method And System For Controlling The Plasma Treatment Of A Titanium Nitride Layer Formed By A Chemical Vapor Deposition Process

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  • US Patent:
    6558963, May 6, 2003
  • Filed:
    Jul 25, 2000
  • Appl. No.:
    09/625711
  • Inventors:
    Allen Lewis Evans - Austin TX
    H. Jim Fulford - Austin TX
  • Assignee:
    Advanced Micro Devices, Inc. - Austin TX
  • International Classification:
    H01L 2166
  • US Classification:
    438 14, 438680, 438648
  • Abstract:
    In general, the present invention is directed to a method of forming titanium nitride layers. In one illustrative embodiment, the method comprises forming a layer of titanium nitride by a chemical vapor deposition process, sensing a thickness of the layer of titanium nitride, and providing the sensed thickness of the layer of titanium nitride to a controller. The method further comprises determining at least one parameter of a plasma process to be performed on the layer of titanium nitride based upon the sensed thickness of the layer of titanium nitride and performing the plasma process comprised of the determined at least one parameter on the layer of titanium nitride.
  • Method For Preventing Or Reducing Delamination Of Deposited Insulating Layers

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  • US Patent:
    6649541, Nov 18, 2003
  • Filed:
    Aug 1, 2001
  • Appl. No.:
    09/920490
  • Inventors:
    Allen Lewis Evans - Dripping Springs TX
    David E. Brown - Austin TX
    Michael J. Satterfield - Round Rock TX
    Arturo N. Morosoff - Austin TX
  • Assignee:
    Advanced Micro Devices, Inc. - Austin TX
  • International Classification:
    H01L 21469
  • US Classification:
    438791, 438761, 438758, 438787, 438681
  • Abstract:
    The method disclosed herein provides a semiconducting substrate, positioning the substrate in a high density plasma process chamber, and forming a layer of silicon-rich silicon dioxide above the substrate using a high density plasma process with an oxygen/silane flowrate ratio that is less than or equal to 0. 625. In another embodiment, the method provides a semiconducting substrate having a partially formed integrated circuit device formed thereabove, the integrated circuit device having a plurality of conductive interconnections, e. g. , conductive lines or conductive plugs, formed thereon, and positioning the substrate in a high density plasma process chamber. The method further includes forming a first layer of silicon dioxide between the plurality of conductive interconnections using a high density plasma process with an oxygen/silane flowrate ratio less than 1. 0, and forming a layer of insulating material above the first layer between the conductive interconnections. In another aspect of the present invention, an integrated circuit device has of a plurality of conductive interconnections, e. g.
  • Control Mechanism For Matching Process Parameters In A Multi-Chamber Process Tool

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  • US Patent:
    6684122, Jan 27, 2004
  • Filed:
    Jan 3, 2000
  • Appl. No.:
    09/476892
  • Inventors:
    Craig W. Christian - Buda TX
    Bradley M. Davis - Austin TX
    Allen L. Evans - Austin TX
  • Assignee:
    Advanced Micro Devices, Inc. - Austin TX
  • International Classification:
    G06F 1900
  • US Classification:
    700121, 700110, 700 28
  • Abstract:
    The invention, in its various aspects and embodiments, is a method and apparatus for controlling the operation of a multi-chamber process tool in a semiconductor fabrication process. The method comprises setting a plurality of operation parameters for the conduct of a predetermined operation in each of a plurality of process chambers in a multi-chamber process tool; performing the predetermined operation in each of the process chambers; examining a physical characteristic of a processed wafer from each of the process chambers; determining from the examined physical characteristics whether the operating conditions in each of the process chambers match; and resetting at least one operating parameter so that the operating conditions in each of the process chambers will match. The apparatus comprises a processing tool, a review station, and a tool controller. The processing tool includes a plurality of process chambers and an operation controller.
  • Method Of Forming An Electronic Device

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  • US Patent:
    8171627, May 8, 2012
  • Filed:
    Dec 21, 2007
  • Appl. No.:
    11/962714
  • Inventors:
    Bryon K. Hance - Austin TX, US
    Brian D. White - Kyle TX, US
    William Brennan - Austin TX, US
    Joseph W. Wiseman - Austin TX, US
    Allen Evans - Dripping Springs TX, US
  • Assignee:
    Spansion LLC - Sunnyvale CA
  • International Classification:
    H05K 3/02
  • US Classification:
    29847, 29825, 29846, 438634, 438637
  • Abstract:
    A process of forming an electronic device including forming a first ultraviolet (“UV”) blocking layer over a conductive feature, wherein the first UV blocking layer lies within 90 nm of the conductive structure; forming a first insulating layer over the first UV blocking layer; and patterning the first insulating layer and the first UV blocking layer to form a first opening extending to the conductive feature, wherein during the process, the first UV blocking layer is exposed to UV radiation.

Plaxo

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Allen Evans

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self employed
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Evans, Allen

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Lennox Industries
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Maurice Allen Evans

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3 J's Consulting Firm
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Allen R Evans

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Las VegasBally Technologies

Flickr

Myspace

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Allen Evans

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Locality:
Stourbridge, United Kingdom
Gender:
Male
Birthday:
1944
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Allen Evans

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Locality:
Phoenix, Az
Gender:
Male
Birthday:
1944
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Allen Evans

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Locality:
Abilene, TX
Gender:
Male
Birthday:
1942
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allen evans

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Locality:
LOMA, Montana
Gender:
Male
Birthday:
1948
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Allen Evans

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Locality:
Emporia, Virginia
Gender:
Male
Birthday:
1946
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Allen Evans

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Locality:
Oman
Gender:
Male
Birthday:
1949
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allen evans

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Locality:
WASHINGTON, Washington DC
Gender:
Male
Birthday:
1947
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Allen Evans

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Locality:
Louisiana
Gender:
Male
Birthday:
1950

Googleplus

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Allen Evans

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Allen Evans

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Allen Evans

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Allen Evans

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Allen Evans

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Allen Evans

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Allen Evans

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Allen Evans

Classmates

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Allen Evans

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Schools:
Franklin Junior High School Minneapolis MN 1980-1984
Community:
Rondeana Sandbeck, Myles Everett, Jillanne Gilliam, Lee Carter
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Allen Evans

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Schools:
King Edward High School Vancouver Saudi Arabia 1950-1954
Community:
Olivia Jensen, Jeannette Glover, Lawrence Larry, Jim Greenwood, Sharon Bethune
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Allen Evans

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Schools:
Phoenix Job Corps Center Phoenix AZ 2000-2004
Community:
Ryan Martinez, Nancy Baldwin, Herlinda Ochoa
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Allen Evans

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Schools:
Sherwood Forest Elementary School New Orleans LA 1978-1981, Ashurst Elementary School Quantico VA 1980-1981
Community:
Kris King, Wayne Fitz, Avis Payton, Dana Washington, Nancy Wilhite, Conrad Vaillancourt
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Allen Evans

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Schools:
Osceola High School Seminole FL 1997-2001
Community:
Chris Allison, Barbara Weaver, Carolyn Schneider
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Allen Evans

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Schools:
Tintic High School Eureka UT 1991-1995
Community:
Janice Jewkes, Toni Malmstrom, Rebecca Lamb, Steve Archuletta
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Allen Evans

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Schools:
Sunrise Acres Elementary School Las Vegas NV 1971-1972, Roy W. Martin Junior High School Las Vegas NV 1972-1973, Ed Von Tobel Junior High School Las Vegas NV 1973-1974
Community:
Donna Koon, Jennifer Lambert, Tracy Shelton, Karen Scharer, Sabra Michelle
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Allen Evans

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Schools:
Beall Junior Senior High School Frostburg MD 1962-1966
Community:
Sonya Tucker, Tammy Iman

Youtube

allen evans sings lady111

cowboy

  • Category:
    Music
  • Uploaded:
    24 Apr, 2010
  • Duration:
    3m 48s

EOU African Drumming Ensemble: KeBendo

Eastern Oregon Univeristy African Djembe Drumming Ensemble performance...

  • Category:
    Music
  • Uploaded:
    05 Jun, 2009
  • Duration:
    5m

Allen Iverson 17pts vs Tyreke Evans Kings NBA...

Samuel Dalembert learned Friday that an uncle, a carpenter feared dead...

  • Category:
    Sports
  • Uploaded:
    16 Jan, 2010
  • Duration:
    4m 38s

Bob Evans - It's Not Fair (Lily Allen Cover)

Bob Evans covers Lily Allen's, 'Not Fair' on Triple J's Like A Version.

  • Category:
    Music
  • Uploaded:
    09 May, 2009
  • Duration:
    3m 43s

N&W CLASS "A" 2-6-6-4 S-Gauge

Restored after 4 years in the shops. This is an American Hand Made "S"...

  • Category:
    Howto & Style
  • Uploaded:
    15 Apr, 2010
  • Duration:
    9m 56s

Raw talent Allen evans Mr. bball and football...

Allen evans highlights for John adams 09 season the first three games ...

  • Category:
    Sports
  • Uploaded:
    12 Sep, 2009
  • Duration:
    2m 40s

Facebook

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Travis Allen Evans

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Allen Evans Photo 47

Allen Lynn Evans

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Justin Allen Evans

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Allen Pinhead Evans

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Mike Allen Evans

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Allen Evans

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Allen Evans Photo 52

Vnie Allen Evans

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Allen Evans Photo 53

Allen Suge Evans

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Get Report for Allen L Evans from Dripping Springs, TX, age ~62
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