Alok S Doshi

age ~43

from Fremont, CA

Also known as:
  • Alok Dosmi
Phone and address:
43940 Rosemere Dr, Fremont, CA 94539

Alok Doshi Phones & Addresses

  • 43940 Rosemere Dr, Fremont, CA 94539
  • Milpitas, CA
  • San Jose, CA
  • Auburn, AL
  • Sunnyvale, CA

Resumes

Alok Doshi Photo 1

Member Of Technical Staff

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Location:
43940 Rosemere Dr, Fremont, CA 94539
Industry:
Semiconductors
Work:
Altera
Member of Technical Staff

Altera Mar 2010 - Feb 2013
Senior Test Development Engineer

Altera Feb 2006 - Feb 2010
Advanced Test Development Engineer
Education:
Auburn University 2003 - 2006
Master of Science, Masters, Electrical Engineering
Languages:
English
Alok Doshi Photo 2

Alok Doshi

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Alok Doshi Photo 3

Alok Doshi

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Alok Doshi Photo 4

Alok Doshi

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Us Patents

  • Automatic Test Pattern Generation System For Programmable Logic Devices

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  • US Patent:
    8516322, Aug 20, 2013
  • Filed:
    Sep 28, 2009
  • Appl. No.:
    12/568136
  • Inventors:
    Jayabrata Ghosh Dastidar - Santa Clara CA, US
    Alok Shreekant Doshi - Sunnyvale CA, US
    Binh Vo - Los Gatos CA, US
    Kalyana Ravindra Kantipudi - Sunnyvale CA, US
    Sergey Timokhin - Palo Alto CA, US
  • Assignee:
    Altera Corporation - San Jose CA
  • International Classification:
    G01R 31/3183
    G01R 31/40
  • US Classification:
    714738, 714725
  • Abstract:
    A programmable integrated circuit may contain multiple logic blocks. Computing equipment may be used to run automated tools that process a design for the programmable integrated circuit to perform corresponding circuit tests. A translation tool may translate a transistor-level description of circuitry on the programmable integrated circuit into a gate-level description. A block-level test configuration data generation tool may generate block-level test configuration data files. The test configuration data files may be used as constraints for an automatic test pattern generation tool that produces block-level test vectors. A full-chip propagation tool may use the block-level test vectors, block-level test configuration data files, and full-chip constraints to produce corresponding full-chip test configuration data and full-chip test vectors for testing the integrated circuit. A translation tool may convert the configuration data and test vectors into a tester file.
  • Techniques For Protecting Security Features Of Integrated Circuits

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  • US Patent:
    20190026497, Jan 24, 2019
  • Filed:
    Sep 24, 2018
  • Appl. No.:
    16/140528
  • Inventors:
    - San Jose CA, US
    Ting Lu - Austin TX, US
    Brian Wong - Mountain View CA, US
    Alok Doshi - Milpitas CA, US
    Yun Sum Wong - Sunnyvale CA, US
  • Assignee:
    Altera Corporation - San Jose CA
  • International Classification:
    G06F 21/70
    H04L 9/08
    G09C 1/00
    H04L 9/32
    G06F 1/26
    G06F 3/06
  • Abstract:
    An integrated circuit includes a control circuit and a one-time programmable circuit. The control circuit determines if the one-time programmable circuit is programmed in response to an attempt to access a mode of the integrated circuit after the integrated circuit powers up. The control circuit generates a signal to indicate to a user of the integrated circuit that the mode of the integrated circuit has been previously accessed if the control circuit determines that the one-time programmable circuit has been programmed to indicate a previous access to the mode of the integrated circuit.
  • Techniques For Protecting Security Features Of Integrated Circuits

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  • US Patent:
    20170257222, Sep 7, 2017
  • Filed:
    Mar 4, 2016
  • Appl. No.:
    15/061622
  • Inventors:
    - San Jose CA, US
    Ting Lu - Austin TX, US
    Brian Wong - Mountain View CA, US
    Alok Doshi - Milpitas CA, US
    Yun Sum Wong - Sunnyvale CA, US
  • Assignee:
    Altera Corporation - San Jose CA
  • International Classification:
    H04L 9/32
    G06F 1/26
  • Abstract:
    An integrated circuit includes a control circuit, a one-time programmable circuit, and a security feature. The control circuit determines if the one-time programmable circuit is programmed in response to a request by a user of the integrated circuit to access the security feature. The control circuit generates a signal to indicate to the user of the integrated circuit that the security feature has been previously accessed if the control circuit determines that the one-time programmable circuit has been programmed to indicate a previous access to the security feature. The control circuit causes the one-time programmable circuit to be programmed in response to the request if the control circuit determines that the one-time programmable circuit has not been programmed.

Googleplus

Alok Doshi Photo 5

Alok Doshi

Lived:
San Jose, CA
Work:
Altera
Alok Doshi Photo 6

Alok Doshi

Alok Doshi Photo 7

Alok Doshi

Alok Doshi Photo 8

Alok Doshi

Youtube

Juhi & Alok Full Cinematic Video

  • Duration:
    18m 25s

Juhi & Alok's Wedding Promo

  • Duration:
    3m 36s

Love you to the moon and back!

  • Duration:
    2m 39s

Malav Alok Doshi (ESK034)

  • Duration:
    47s

Deaf Cancer Survivors - THE HANGOUT - Convo

On Wednesday, July 13, at 5pm CT, watch cancer survivors Maleni Chaito...

  • Duration:
    41m 39s

In Conversation with 2022 Royal Gold Medallis...

In May 2022, RIBA President Simon Allford travelled to Ahmedabad, Indi...

  • Duration:
    25m 47s

It's Us.. You and Me!

  • Duration:
    3m 54s

My Movie 2

  • Duration:
    58s

Plaxo

Alok Doshi Photo 9

Avani Alok Doshi

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Matunga (e), Mumbai
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Alok Doshi

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Alok Doshi's Public Pla...

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Alok Doshi's Public Profile on Plaxo. Plaxo helps members like Alok Doshi keep in touch with the people who really matter, helping them to connect, keep each other's ...

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Alok Doshi

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Alok Doshi

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Alok Doshi

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Alok Doshi

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Alok Doshi Photo 16

Alok Doshi

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