Ambarish D Chhatre

age ~40

from Danville, CA

Also known as:
  • Rish Chhatre
Phone and address:
683 Park Hill Rd, Danville, CA 94526

Ambarish Chhatre Phones & Addresses

  • 683 Park Hill Rd, Danville, CA 94526
  • Tahoe Vista, CA
  • San Jose, CA
  • San Ramon, CA
  • Milpitas, CA

Work

  • Company:
    Lam research
    Sep 2009
  • Position:
    Mechanical engineer i

Education

  • Degree:
    B.S.
  • School / High School:
    San Jose State University
    2003 to 2009
  • Specialities:
    Mechanical Engineering, Business, Mathematics

Industries

Semiconductors

Resumes

Ambarish Chhatre Photo 1

Mechanical Engineer I At Lam Research

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Position:
Mechanical Engineer I at Lam Research
Location:
San Francisco Bay Area
Industry:
Semiconductors
Work:
Lam Research since Sep 2009
Mechanical Engineer I

Lam Research Jun 2008 - Sep 2008
Ops Change Analyst
Education:
San Jose State University 2003 - 2009
B.S., Mechanical Engineering, Business, Mathematics
Name / Title
Company / Classification
Phones & Addresses
Ambarish Chhatre
Managing
One Stop Tutoring, LLC
Educational · Nonclassifiable Establishments · School/Educational Services
1445 Fruitdale Ave, San Jose, CA 95128

Us Patents

  • Edge Seal For Lower Electrode Assembly

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  • US Patent:
    20130097840, Apr 25, 2013
  • Filed:
    Oct 20, 2011
  • Appl. No.:
    13/277873
  • Inventors:
    David Schaefer - Fremont CA, US
    Ambarish Chhatre - San Jose CA, US
    Keith William Gaff - Fremont CA, US
    Sung Lee - Pleasanton CA, US
  • Assignee:
    Lam Research Corporation - Fremont CA
  • International Classification:
    B23P 11/00
    H01L 21/3065
  • US Classification:
    29428, 15634552
  • Abstract:
    A lower electrode assembly useful for supporting a semiconductor substrate in a plasma processing chamber includes a temperature controlled lower base plate, an upper plate, a mounting groove surrounding a bond layer and an edge seal comprising an elastomeric band having an outer concave surface in an uncompressed state, the band mounted in the groove such that upper and lower ends of the band are axially compressed and a maximum outward bulging of the band is no greater than a predetermined distance.
  • Edge Seal For Lower Electrode Assembly

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  • US Patent:
    20130340942, Dec 26, 2013
  • Filed:
    Jun 20, 2012
  • Appl. No.:
    13/528194
  • Inventors:
    David Schaefer - Fremont CA, US
    Ambarish Chhatre - San Jose CA, US
    Keith William Gaff - Fremont CA, US
    Brooke Mesler Lai - Fremont CA, US
  • Assignee:
    Lam Research Corporation - Fremont CA
  • International Classification:
    F16J 15/02
    H02N 13/00
  • US Classification:
    15634551, 29505, 277628
  • Abstract:
    A lower electrode assembly useful for supporting a semiconductor substrate in a plasma processing chamber includes a temperature controlled lower base plate, an upper plate, a mounting groove surrounding a bond layer and an edge seal comprising an elastomeric band having an outer concave surface in an uncompressed state, the band mounted in the groove such that upper and lower ends of the band are axially compressed and a maximum outward bulging of the band is no greater than a predetermined distance.
  • System And Method For Performing Hot Water Seal On Electrostatic Chuck

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  • US Patent:
    20130052339, Feb 28, 2013
  • Filed:
    Aug 26, 2011
  • Appl. No.:
    13/219540
  • Inventors:
    Hong Shih - Santa Clara CA, US
    Tuochuan Huang - Saratoga CA, US
    David Schaefer - Fremont CA, US
    Ambarish Chhatre - San Ramon CA, US
    John Daugherty - Fremont CA, US
    MingHang Wu - Renton WA, US
    Clifford La Croix - Livermore CA, US
  • International Classification:
    B05D 5/12
  • US Classification:
    4271264, 427 58
  • Abstract:
    A method is provided for treating a bipolar ESC having a front surface and a back surface, the front surface including an anodized layer. The method includes eliminating the anodized layer, disposing a new anodized layer onto the front surface, and treating the new anodized layer with water to seal the new anodized layer.
  • Components And Processes For Managing Plasma Process Byproduct Materials

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  • US Patent:
    20210225616, Jul 22, 2021
  • Filed:
    Jan 7, 2019
  • Appl. No.:
    16/960017
  • Inventors:
    - Fremont CA, US
    Ambarish (Rish) Chhatre - Danville CA, US
    Dan Marohl - San Jose CA, US
    Tamarak Pandhumsoporn - Fremont CA, US
    Ignacio (Nacho) Chazaro - Mountain View CA, US
  • International Classification:
    H01J 37/32
    B24C 1/06
  • Abstract:
    Components and processes are disclosed herein for managing non-volatile and/or low-volatility byproduct materials that are generated within a plasma processing region of a plasma processing chamber during performance of various plasma-based processes on a substrate. The components include a top window structure, a liner structure, an edge ring structure, a focus ring structure, a ground ring structure, a substrate access port shield, an insert liner for a port opening in a chamber wall, and an exhaust baffle assembly for positioning within an exhaust channel connected to the chamber. One or more process-exposed surface(s) of the various components are subjected to a surface roughening/texturizing process to impart a surface roughness and/or engineered topography to the process-exposed surface that promotes adhesion and retention of plasma process byproduct materials. The various components with roughened/texturized process-exposed surface(s) are configured for use in lead zirconate titanate (PZT) film etching and/or platinum (Pt) film etching processes.
  • Coil And Window For Plasma Processing System

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  • US Patent:
    20200234920, Jul 23, 2020
  • Filed:
    Jan 22, 2019
  • Appl. No.:
    16/253948
  • Inventors:
    - Fremont CA, US
    Dan MAROHL - San Jose CA, US
    Ambarish CHHATRE - Danville CA, US
    Ming-Te LIN - Danville CA, US
    Andras KUTHI - Thousand Oaks CA, US
  • International Classification:
    H01J 37/32
    H01L 21/67
  • Abstract:
    An apparatus for processing substrates is provided. A plasma processing chamber is provided. At least one substrate support for supporting at least one substrate is in the plasma processing chamber. At least one gas inlet is provided for flowing gas into the plasma processing chamber. A dielectric window forms a cover for the plasma processing chamber. The dielectric window comprises an outer dielectric window ring with a central aperture and an inner concaved dielectric window extending across the central aperture, wherein the inner concaved dielectric window forms a volume in fluid communication with an interior of the plasma processing chamber, and wherein the at least one gas inlet flows gas into the volume of the inner concaved dielectric window. An outer coil assembly is adjacent to the outer dielectric window ring. An inner coil assembly surrounds the inner concaved dielectric window.
  • Edge Seal For Lower Electrode Assembly

    view source
  • US Patent:
    20180106371, Apr 19, 2018
  • Filed:
    Dec 15, 2017
  • Appl. No.:
    15/843849
  • Inventors:
    - Fremont CA, US
    Ambarish Chhatre - San Jose CA, US
    Keith William Gaff - Fremont CA, US
    Sung Lee - Pleasanton CA, US
    Brooke Mesler Lai - Fremont CA, US
  • International Classification:
    F16J 15/02
    H01J 37/32
    H02N 13/00
    H01L 21/683
  • Abstract:
    An edge seal for sealing an outer surface of a lower electrode assembly configured to support a semiconductor substrate in a plasma processing chamber, the lower electrode assembly including an annular groove defined between a lower member and an upper member of the lower electrode assembly. The edge seal includes an elastomeric band configured to be arranged within the groove, the elastomeric band having an annular upper surface, an annular lower surface, an inner surface, and an outer surface. When the elastomeric band is in an uncompressed state, the outer surface of the elastomeric band is concave. When the upper and lower surfaces are axially compressed at least 1% such that the elastomeric band is in a compressed state, an outward bulging of the outer surface is not greater than a predetermined distance. The predetermined distance corresponds to a maximum outer diameter of the elastomeric band in the uncompressed state.
  • System And Method For Performing Hot Water Seal On Electrostatic Chuck

    view source
  • US Patent:
    20150235889, Aug 20, 2015
  • Filed:
    May 5, 2015
  • Appl. No.:
    14/704602
  • Inventors:
    - Fremont CA, US
    Tuochuan Huang - Saratoga CA, US
    David Schaefer - Fremont CA, US
    Ambarish Chhatre - San Ramon CA, US
    John Daugherty - Fremont CA, US
    MingHang Wu - Renton WA, US
    Clifford La Croix - Livermore CA, US
  • Assignee:
    LAM RESEARCH CORPORATION - Fremont CA
  • International Classification:
    H01L 21/683
  • Abstract:
    A method is provided for treating a bipolar ESC having a front surface and a back surface, the front surface including an anodized layer. The method includes eliminating the anodized layer, disposing a new anodized layer onto the front surface, and treating the new anodized layer with water to seal the new anodized layer.

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