Robert Starkston - Phoenix AZ, US Andrew Proctor - Chandler AZ, US Steve Terry - Glendale AZ, US
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
H01L 21/301
US Classification:
438462, 438463
Abstract:
A method for singulating dies from a wafer includes laser scribing a continuous line on each side of the die, and laser ablating an area adjacent the laser scribed continuous line on each side of the die. The laser ablations in the area adjacent the laser scribed continuous line on each side of the die being spaced from one another. The method also includes sawing the laser abated area adjacent the continuous line. A method for singulating dies from a wafer includes laser scribing a first continuous line, laser scribing a second continuous line spaced apart from the first continuous line, and laser scribing a third continuous line. The third continuous line positioned between the first continuous line and the second continuous line. The third continuous line overlaps the second continuous line and the third continuous line.
Robert Starkston - Phoenix AZ, US Andrew Proctor - Chandler AZ, US Steve Terry - Glendale AZ, US
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
H01L 21/301 H01L 21/304
US Classification:
700166, 264400, 2191216, 483463
Abstract:
A method for singulating dies from a wafer includes laser scribing a continuous line on each side of the die, and laser ablating an area adjacent the laser scribed continuous line on each side of the die. The laser ablations in the area adjacent the laser scribed continuous line on each side of the die being spaced from one another. The method also includes sawing the laser abated area adjacent the continuous line. A method for singulating dies from a wafer includes laser scribing a first continuous line, laser scribing a second continuous line spaced apart from the first continuous line, and laser scribing a third continuous line. The third continuous line positioned between the first continuous line and the second continuous line. The third continuous line overlaps the second continuous line and the third continuous line.
Apparatus And Method For Mitigating Surface Imperfections On Die Backside Film
Described is an apparatus which comprises: a die having a first side and a second side opposite to the first side; a die backside film (DBF) or die attach film (DAF) disposed over the first side of the die; and a fluorocarbon layer disposed over the DBF or DAF. Described is a method which comprises: applying a die backside film (DBF) over a first side of a die, wherein the die has a second side which metal bumps; and applying a plasma polymerization process to treat the DBF with a fluorocarbon plasma.
"It helps place us nationally, and puts us in the national conversation," said Andrew Proctor, the executive director of Literary Arts. "Any national cultural moment is great for the city, and this is a national moment."