Anh Quoc Luong

US Patent:

20110103235, May 5, 2011

Filed:

Oct 27, 2010

Appl. No.:

12/913718

Inventors:

Anh Luong - Santa Clara CA, US
Justin Gregg - San Francisco CA, US

International Classification:

H04L 12/26
H04W 84/02

US Classification:

370245, 370249, 370338

Abstract:

A system for performing wireless local area network testing of wireless devices may include a wireless local area network tester and a device under test. The tester and device under test may communicate over a wireless link. To ensure that the tester accurately analyzes test data, a data rate table is used that specifies fixed data transmission rates to be used by the device under test under both high-quality link conditions and low-quality link conditions. This forces the device under test to transmit control packets at the same high data rate during packet loopback testing, regardless of link quality. When the captured control packets are analyzed at the tester, both low-link-quality data and high-link-quality data may be analyzed using a common test template, ensuring accurate results.

US Patent:

20120207030, Aug 16, 2012

Filed:

Feb 10, 2011

Appl. No.:

13/025116

Inventors:

Anh Luong - Santa Clara CA, US

International Classification:

H04L 12/26

US Classification:

370245

Abstract:

An electronic device may include wireless circuitry such as cellular telephone transceiver circuitry and wireless local area network (WLAN) transceiver circuitry. The telephone transceiver may be used to establish long-range wireless connectivity, whereas the WLAN transceiver may be used to establish short-range wireless connectivity. The performance of the WLAN transceiver may suffer in the presence of heat-generating operations. The performance of the WLAN transceiver may be tested using test equipment while the electronic device is configured in a test mode and a normal user mode. During testing, the WLAN transceiver may be directed to transmit radio-frequency signals while the telephone transceiver is toggled on and off. The test equipment may be used to analyze the radio-frequency signals to measure the transmit power level, transmitter constellation error, transmit spectrum mask, and other performance parameters to determine whether that device under test satisfies design criteria.

US Patent:

20130055119, Feb 28, 2013

Filed:

Aug 23, 2011

Appl. No.:

13/216196

Inventors:

Anh Luong - Santa Clara CA, US

International Classification:

G06F 3/048

US Classification:

715764

Abstract:

An electronic device displays a first page in a set of pages on a display; detects a first gesture at a location on a touch-sensitive surface corresponding to a predefined area on the display; in response to detecting the first gesture, displays a navigation object in proximity to the predefined area; detects a second gesture on the touch-sensitive surface with respect to the navigation object; and in response to detecting the second gesture, performs a navigation operation with respect to the first page at a specified velocity and in accordance with a direction of the second gesture. The velocity of the operation is based on a condition of the second gesture with respect to the navigation object.

US Patent:

20130149972, Jun 13, 2013

Filed:

Dec 12, 2011

Appl. No.:

13/323709

Inventors:

Anh Luong - Santa Clara CA, US
Daniel C. Kong - Mountain View CA, US

International Classification:

H04W 24/00

US Classification:

455 6714

Abstract:

Wireless communications circuitry such as radio-frequency power amplifiers may be tested using a test station. A test station may include a test host and a test unit coupled to the test host. The power amplifiers may be configured to transmit radio-frequency signals in allocated resource blocks within a particular radio channel. The power amplifier circuits may be configured to transmit signals utilizing only an allocated portion of its total available resource blocks so that the transmitted signals are output at maximum power levels. The power amplifiers may transmit in resource blocks near a low channel edge during a first time period and may transmit in resource blocks near a high channel edge during a second time period. The test unit may receive the signals generated from the power amplifiers and may perform desired radio-frequency measurements (e.g., test unit may measure adjacent channel leakage radio, signal-to-interference ratio, error vector magnitude, etc.).

US Patent:

20130288610, Oct 31, 2013

Filed:

Apr 30, 2012

Appl. No.:

13/460718

Inventors:

Yuping Toh - San Francisco CA, US
Anh Luong - Santa Clara CA, US

International Classification:

H04B 17/00

US Classification:

455 6714, 455 6711

Abstract:

A test system for calibrating wireless electronic devices is provided. The test system may include a test host, a radio communication tester, and a temperature chamber in which an electronic device under test (DUT) may be tested. The DUT may include a temperature sensor for monitoring an internal temperature of the DUT and may include power amplifier circuitry for outputting radio-frequency test signals. The tester may be used to measure output power levels of the radio-frequency test signals when the DUT is operating at a given reference temperature and when the DUT is operating at target operating temperature levels other than the given reference temperature. Power amplifier output level offset compensation values may be computed by comparing output power levels measured at each of the target operating temperatures to output power levels measured at the given reference temperature and may be stored in the DUT prior to normal operation.

US Patent:

8054221, Nov 8, 2011

Filed:

Nov 15, 2010

Appl. No.:

12/946813

Inventors:

Anh Luong - Santa Clara CA, US
Daniel C. Kong - Mountain View CA, US

Assignee:

Apple Inc. - Cupertino CA

International Classification:

G01S 19/23

US Classification:

34235762

Abstract:

A portable user device may provide Global Positioning System (GPS) services. The device may include a GPS receiver. The GPS receiver may provide accurate information about the current location of the device. A user may use the device to perform tasks. Certain tasks may generate excess heat or de-generate heat that causes the GPS receiver to perform unsatisfactorily. Methods are provided that can test GPS receiver performance during acquisition mode and during tracking mode. During testing, the GPS receiver may be given a predetermined amount of time to acquire a GPS fix. The GPS receiver may be tested repeatedly to acquire successive GPS fixes. After a desired number of tests are performed, a success rate may be calculated. If the success rate is satisfactory, the GPS receiver satisfies design criteria. If the success rate is not satisfactory, the GPS receiver may be reconfigured with new settings.

US Patent:

20150365946, Dec 17, 2015

Filed:

May 28, 2015

Appl. No.:

14/724734

Inventors:

- Cupertino CA, US
Anh Q. Luong - Santa Clara CA, US

International Classification:

H04W 72/04
H04L 1/00
H04W 76/02

Abstract:

An electronic device has wireless communications circuitry. The wireless circuitry may transmit and receive wireless signals over a network having first and second wireless base stations. The first base station may establish a primary wireless connection with the device using selected connection settings and may transmit the selected connection settings to the second base station. The second base station may copy the received connection settings to establish a secondary wireless connection with the device while the primary connection is simultaneously maintained. After the primary and secondary connections have been established, the first and second base stations may transmit data streams to the electronic device over different frequency bands in a carrier aggregation link. By using the second base station to copy the received connection settings that were used by the first base station to establish the primary connection, the connection time for establishing the carrier aggregation link may be improved.

US Patent:

20140160955, Jun 12, 2014

Filed:

Dec 12, 2012

Appl. No.:

13/712713

Inventors:

- Cupertino CA, US
Anh Q. Luong - Santa Clara CA, US

Assignee:

Apple Inc. - Cupertino CA

International Classification:

H04W 24/06

US Classification:

370252

Abstract:

A test system for testing a wireless electronic device is provided. The test system may include a test host and a tester. The test host may instruct a wireless electronic device under test (DUT) to transmit radio-frequency uplink signals in selected uplink resource blocks of an uplink channel in a desired Long Term Evolution (LTE) frequency band. The tester may convey radio-frequency test data to the DUT in a selected downlink resource block of a downlink channel in the desired LTE frequency band. The DUT may measure data reception throughput values associated with the test data. The test host may compare the measured data reception throughput values to threshold data reception throughput values to characterize the radio-frequency performance of the DUT. The test system may test the radio-frequency performance of the DUT for test data in some or all downlink resource blocks of the downlink channel.