Asher S Lazarus

US Patent:

7197419, Mar 27, 2007

Filed:

Feb 3, 2005

Appl. No.:

11/050324

Inventors:

Michael Stephen Floyd - Austin TX, US
Asher Shlomo Lazarus - Austin TX, US
Brian Chan Monwai - Austin TX, US

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G06F 17/40

US Classification:

702130, 702132, 713322, 713501, 374100, 323907

Abstract:

A system and method are provided for monitoring temperature within a specified integrated circuit. Usefully, the system comprises at least one oscillator device proximate to the integrated circuit for generating signal pulses at a frequency that varies as a function of the temperature adjacent to the oscillator device. The system further comprises a control unit for establishing sample acquisition periods of invariant time duration based on an time invariant reference clock. A sampling component is coupled to count the number of pulses generated by the oscillator device during each of a succession of the time invariant sample acquisition periods, and a threshold component responsive to the respective count values for the succession of sample acquisition periods provides notice when at least some of the count values have a value associated with a prespecified excessive temperature level.

US Patent:

7873890, Jan 18, 2011

Filed:

Jun 30, 2008

Appl. No.:

12/164699

Inventors:

Abel Alaniz - Austin TX, US
Robert B. Gass - Pflugerville TX, US
Asher S. Lazarus - Austin TX, US

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G01R 31/28
G01R 31/02
G01R 31/26

US Classification:

714732, 714724, 714726, 714729, 714733, 714736, 714738, 714739, 714742, 324759, 324763, 324765

Abstract:

A method, system and computer program product for performing device characterization Logic Built-In Self-Test (LBIST) in an IC device. Test parameters of the LBIST are saved in a memory of the IC device, and nominal operational parameters of the IC device are used to define a signature of the LBIST. A determination whether the LBIST is passed or failed is made within the characterized IC device.

US Patent:

7895490, Feb 22, 2011

Filed:

May 20, 2008

Appl. No.:

12/123547

Inventors:

Benjamin Robert Gass - Pflugerville TX, US
Abel Alaniz - Cedar Park TX, US
Asher Shlomo Lazarus - Austin TX, US
Timothy M. Skergan - Austin TX, US

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G01R 31/28

US Classification:

714732, 714726, 714733

Abstract:

A method for testing an electronic circuit comprises selecting a plurality of test patterns arranged in an order. The method tests an electronic circuit by applying to the electronic circuit a first subset range of the plurality of test patterns sequentially in the order, from a first test pattern to a first log interval after the first test pattern, thereby generating a first associated output. The method compares the first associated output with a first known output of the plurality of known outputs. In the event the first associated output does not match the first known output, the method stores indicia of the first mismatch; causes the electronic circuit to appear to assume the first known output state; and proceeds with additional test procedures.

US Patent:

8086925, Dec 27, 2011

Filed:

May 20, 2008

Appl. No.:

12/123540

Inventors:

Benjamin Robert Gass - Pflugerville TX, US
Abel Alaniz - Cedar Park TX, US
Asher Shlomo Lazarus - Austin TX, US
Timothy M. Skergan - Austin TX, US

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G01R 31/28

US Classification:

714738

Abstract:

A method for testing an electronic circuit comprises selecting a first log interval, a first log start pattern, a first log end pattern, and a first subset range of LBIST patterns from a plurality of LBIST patterns arranged in an order, wherein each LBIST pattern of the subset range of LBIST patterns causes an associated output of an electronic circuit. The method tests an electronic circuit in a first test by applying to the electronic circuit the first subset range of LBIST patterns sequentially in the order, thereby generating a first plurality of associated outputs. The method stores a first subset of associated outputs based on the first log interval, the first log start pattern, and the first log end pattern. The method compares the subset of associated outputs with known outputs to identify a first output mismatch.

US Patent:

20040225461, Nov 11, 2004

Filed:

Apr 28, 2003

Appl. No.:

10/425395

Inventors:

Michael Floyd - Austin TX, US
Asher Lazarus - Austin TX, US

Assignee:

International Business Machines Corporation

International Classification:

G06F003/00

US Classification:

702/085000, 710/060000, 714/047000, 702/099000

Abstract:

An integrated circuit device and system of devices in which a device interface incorporates dynamic, elastic calibration facilities. The interface includes a calibration manager and circuitry for monitoring the interface signals to detect the presence of signal skew, delay, or other degradation. If the monitor detects an out-of-calibration interface, the calibration manager initiates a dynamic calibration procedure. The calibration manager can also initiate the dynamic calibration procedure in response to an event such as the detection of a correctable error on the interface. By proactively monitoring the interface for degradation, the calibration manager is responsive to environmental changes as they occur and is efficient in its use of the calibration procedure by invoking it only when calibration is required.