Barron L Cain from 1000 Knoll Ter, Roswell, GA 30075, age 57, Phone: 7706421938

Test System Having A Sub-System To Sub-System Bridge
view source
US Patent:

8230278, Jul 24, 2012
Filed:

Nov 26, 2007
Appl. No.:

11/944855
Inventors:

Charles Lutz - Flowery Branch GA, US
Jason Spielvogel - Wheeling WV, US
Nicole Nall - Lithonia GA, US
Barron Cain - Roswell GA, US
William Keyes - Dacula GA, US
Gregory Irwin - Duluth GA, US
Assignee:

AT&T Intellectual Property, I, LP - Atlanta GA
International Classification:

G01R 31/28
US Classification:

714724, 370242
Abstract:

A test system having a sub-system to sub-system bridge may be provided that utilizes the useful attributes of a plurality of circuit testing techniques, while reducing deficiencies associated with certain types of circuit testing. A bridged test system structure is utilized to facilitate circuit testing that is more effective and time efficient. The method analyzes performance data acquired by a first component for one or more circuits, and sends that performance data to a second test component. The second test component provides test signals to the circuits, using the performance date to enhance the use of the test signals, and also provides test response data for the circuits in response to the provided test signals.

Test System Having A Sub-System To Sub-System Bridge
view source
US Patent:

8443245, May 14, 2013
Filed:

Jun 26, 2012
Appl. No.:

13/533308
Inventors:

Charles Lutz - Flowery Branch GA, US
Jason Spielvogel - Wheeling WV, US
Nicole Nall - Lithonia GA, US
Barron Cain - Roswell GA, US
William Keyes - Dacula GA, US
Gregory Irwin - Duluth GA, US
Assignee:

AT&T Intellectual Property I, L.P. - Atlanta GA
International Classification:

G01R 31/28
US Classification:

714724, 370242
Abstract:

A test system having a sub-system to sub-system bridge may be provided that utilizes the useful attributes of a plurality of circuit testing techniques, while reducing deficiencies associated with certain types of circuit testing. A bridged test system structure is utilized to facilitate circuit testing that is more effective and time efficient. The method analyzes performance data acquired by a first component for one or more circuits, and sends that performance data to a second test component. The second test component provides test signals to the circuits, using the performance date to enhance the use of the test signals, and also provides test response data for the circuits in response to the provided test signals.

Methods, Systems, And Computer Program Products For Providing Network Outage Information
view source
US Patent:

20080086661, Apr 10, 2008
Filed:

Oct 9, 2006
Appl. No.:

11/545651
Inventors:

Aaron Harrell - Charlotte NC, US
Jackie Walker - Charlotte NC, US
John Jopp - Kannapolis NC, US
Roy Allen - Cherryville NC, US
Kirk Brown - Concord NC, US
Joel Wilson - Olin NC, US
Barron Cain - Roswell GA, US
Thomas Prange - Salisbury NC, US
International Classification:

G06F 11/00
US Classification:

714100
Abstract:

Exemplary embodiments relate to methods, systems, user devices and computer program products for providing network status information. Methods include receiving alarm data for an event from a plurality of sources. The alarm data includes a plurality of alarm records each including a site identifier. The alarm data is processed to create report data. The processing includes assigning an attribute of failed to each of the site identifiers that are specified in more than a threshold number of the alarm records. The report data comprises at least digital loop carrier information. The report data is transmitted to a mechanized loop test (MLT) testing system capable of generating MLT test results. The MLT test results are used to adjust the digital loop carrier information included in the report data, wherein the digital loop carrier information specifies a quantity of digital carrier loop lines that are out of service

Test System Having A Sub-System To Sub-System Bridge
view source
US Patent:

20130318415, Nov 28, 2013
Filed:

May 1, 2013
Appl. No.:

13/874690
Inventors:

Jason Spielvogel - Wheeling WV, US
Nicole Hall - Lithonia GA, US
Barron Cain - Roswell GA, US
William Keyes - Dacula GA, US
Gregory Irwin - Duluth GA, US
Assignee:

AT&T Intellectual Property I, L.P. - Atlanta GA
International Classification:

G01R 31/317
US Classification:

714734
Abstract:

A test system having a sub-system to sub-system bridge may be provided that utilizes the useful attributes of a plurality of circuit testing techniques, while reducing deficiencies associated with certain types of circuit testing. A bridged test system structure is utilized to facilitate circuit testing that is more effective and time efficient. The method analyzes performance data acquired by a first component for one or more circuits, and sends that performance data to a second test component. The second test component provides test signals to the circuits, using the performance date to enhance the use of the test signals, and also provides test response data for the circuits in response to the provided test signals.