Benjamin M Jacobs

US Patent:

20220377244, Nov 24, 2022

Filed:

Aug 3, 2022

Appl. No.:

17/817248

Inventors:

- Morrisville NC, US
John Damiano, JR. - Holly Springs NC, US
David P. Nackashi - Raleigh NC, US
Daniel Stephen Gardiner - Wake Forest NC, US
Mark Uebel - Morrisville NC, US
Alan Philip Franks - Durham NC, US
Benjamin Jacobs - Apex NC, US
Joshua Brian Friend - Raleigh NC, US
Katherine Elizabeth Marusak - Cary NC, US
Benjamin Bradshaw Larson - Cary NC, US

International Classification:

H04N 5/232
G06T 7/33
G06T 7/215

Abstract:

Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.

US Patent:

20220247934, Aug 4, 2022

Filed:

Jan 26, 2022

Appl. No.:

17/585222

Inventors:

- Morrisville NC, US
John Damiano, JR. - Holly Springs NC, US
David P. Nackashi - Raleigh NC, US
Daniel Stephen Gardiner - Wake Forest NC, US
Mark Uebel - Morrisville NC, US
Alan Philip Franks - Durham NC, US
Benjamin Jacobs - Apex NC, US
Joshua Brian Friend - Raleigh NC, US
Katherine Elizabeth Marusak - Cary NC, US
Benjamin Bradshaw Larson - Cary NC, US

International Classification:

H04N 5/232
G06T 7/215
G06T 7/33

Abstract:

Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.

US Patent:

20210112203, Apr 15, 2021

Filed:

Nov 18, 2020

Appl. No.:

16/951297

Inventors:

- Morrisville NC, US
John Damiano, JR. - Holly Springs NC, US
David P. Nackashi - Raleigh NC, US
Daniel Stephen Gardiner - Wake Forest NC, US
Mark Uebel - Morrisville NC, US
Alan Philip Franks - Durham NC, US
Benjamin Jacobs - Apex NC, US

International Classification:

H04N 5/232
G06T 7/215
G06T 7/33

Abstract:

Control system configured for sample tracking in an electron microscope environment registers a movement associated with a region of interest located within an active area of a sample under observation with an electron microscope. The registered movement includes at least one directional constituent. The region of interest is positioned within a field of view of the electron microscope. The control system directs an adjustment of the electron microscope control component to one or more of dynamically center and dynamically focus the view through the electron microscope of the region of interest. The adjustment comprises one or more of a magnitude element and a direction element.