Boaz E Gelernter

Deceased

from Long Branch, NJ

Also known as:
  • Doaz Gelernter
  • Baoz Gelernter
  • Gelernter Boaz
  • Boaz R
Phone and address:
217 Park Ave, West End, NJ 07740
7322290752

Boaz Gelernter Phones & Addresses

  • 217 Park Ave, Long Branch, NJ 07740 • 7322290752
  • 34 Sidney Pl #Uppr Uppr, Brooklyn, NY 11201
  • Spring Valley, NY
  • 217 Park Ave, Long Branch, NJ 07740

Us Patents

  • Line Source Antenna For Small Angle Electronic Beam Scanning

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  • US Patent:
    40926478, May 30, 1978
  • Filed:
    Dec 27, 1976
  • Appl. No.:
    5/754642
  • Inventors:
    John Joseph Borowick - Bricktown NJ
    Boaz Gelernter - Elberon NJ
    Nathan Lipetz - Oakhurst NJ
    Richard A. Stern - Allenwood NJ
  • Assignee:
    The United States of America as represented by the Secretary of the Army - Washington DC
  • International Classification:
    H01Q 1310
    H01Q 100
    H01Q 326
  • US Classification:
    343768
  • Abstract:
    A line source antenna adapted for a light weight, compact phased array ra and consisting of a plurality of series fed radiating slots periodically located in the narrow side wall of a length of waveguide together with non-reciprocal latching ferrite phase shifters including dielectric loading sections and matching transformer sections on either side of phase shifters located between adjacent slot pairs.
  • Antenna Performance Evaluation Method And Apparatus

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  • US Patent:
    48110230, Mar 7, 1989
  • Filed:
    Apr 25, 1988
  • Appl. No.:
    7/185735
  • Inventors:
    Boaz Gelernter - Long Branch NJ
    Dick M. Joe - Anaheim CA
  • Assignee:
    The United States of America as represented by the Secretary of the Army - Washington DC
  • International Classification:
    H01Q 330
  • US Classification:
    343703
  • Abstract:
    Phased array antennas are rapidly tested for performance degradation utilng a beam steering computer unit and built-in test equipment. The antenna includes a plurality of bays in a planar matrix, each bay having subarray modules containing pairs of dipoles. The beam steering unit controls scanning of driver cards having drivers which apply bias voltages to phase shifter diodes or bits of various fixed angular sizes in a main array and subarray. The bits are sequentially tested for current faults, with information obtained on number, size, and location of failed bits determining performance degradation of a predetermined threshold. Larger phase bits of the main array are given more weight than smaller subarray bits. The effect of the failures on sum beam gain and azimuth and elevation differences pattern null depths are computed and compared with the threshold to indicate whether performance is acceptable.

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