Brent William Thordarson

US Patent:

6828773, Dec 7, 2004

Filed:

Mar 21, 2002

Appl. No.:

10/103392

Inventors:

Jonathan Ernest Buczkowski - Aurora CO
David Lawrence Dummer - Fort Collins CO
Julie L Stahmer - Fort Collins CO
Brent W Thordarson - Ft Collins CO

Assignee:

Agilent Technologies, Inc. - Palo Alto CA

International Classification:

G01R 3126

US Classification:

3241581, 324765

Abstract:

A fixture assembly is presented. The fixture assembly includes a device assembly for mating with a device under test and a tester interface assembly for mating with the device assembly on one side and a tester on a second side. In the method and apparatus of the present invention, the device assembly includes a probe field specific to a device under test and may be changed to accommodate a different device, without changing the tester interface assembly. The tester interface assembly includes a frame used for alignment and structural support. The frame interfaces with a probe plate on one side and a load plate on the other side. The probe plate holds a plurality of probes in place while the load plate provides a plurality of holes for the probes to extend downward through the load plate. A printed circuit board (PCB) is positioned below the load plate and makes contact with the ends of the probes. The entire tester interface assembly is positioned on top of an electronic tester and maps points of contact in the tester with the probe field of the device assembly.

US Patent:

7009381, Mar 7, 2006

Filed:

Oct 10, 2003

Appl. No.:

10/685327

Inventors:

Chris R. Jacobsen - Fort Collins CO, US
Phillip A. Driggers - Loveland CO, US
John E. Siefers - Loveland CO, US
Brent W. Thordarson - Fort Collins CO, US

Assignee:

Agilent Technologies, Inc. - Palo Alto CA

International Classification:

G01R 31/26

US Classification:

3241581, 324765

Abstract:

A fixture assembly is presented. The fixture assembly includes a device interface assembly for mating with a device under test and a tester interface assembly for mating with the device interface assembly on one side and a tester on a second side. In the method and apparatus of the present invention, the device interface assembly includes a probe field specific to a device under test and may be changed to accommodate a different device, without changing the tester interface assembly. The tester interface assembly includes a custom electronic module and a standardized electronic module, which are both coupled to a PCB interface in the tester interface assembly. As such, both standardized and specialized test may be modified and changed without redesigning the tester interface assembly.

US Patent:

7190583, Mar 13, 2007

Filed:

Aug 29, 2005

Appl. No.:

11/214085

Inventors:

Tracy W. Fendley - Fort Collins CO, US
Rick T. Euker - Loveland CO, US
Brent W. Thordarson - Fort Collins CO, US

Assignee:

Verigy Pte Ltd - Singapore

International Classification:

H05K 7/20
G01R 31/02

US Classification:

361701, 361696, 361702, 324760, 165 804, 165 805

Abstract:

Although various embodiments of the method and apparatus of the present invention have been illustrated in the accompanying Drawings and described in the foregoing Detailed Description, it will be understood that the invention is not limited to the embodiments disclosed, but is capable of numerous rearrangements, modifications and substitutions without departing from the spirit of the invention as set forth herein.

US Patent:

D3384160, Aug 17, 1993

Filed:

Jul 25, 1988

Appl. No.:

7/224501

Inventors:

James E. Berry - Fort Collins CO
Brent W. Thordarson - Fort Collins CO
Michael L. Christensen - Loveland CO

Assignee:

Hewlett-Packard Company - Palo Alto CA

US Classification:

D10 75