Brett R Henderson

US Patent:

20130219990, Aug 29, 2013

Filed:

Mar 29, 2013

Appl. No.:

13/853890

Inventors:

Joe Fitzpatrick - Glendale CA, US
Brett Henderson - Salt Lake City UT, US
Anthoniraj Lourdhusamy - West Jordan UT, US
Lee Sorensen - West Jordan UT, US
James Steppan - Park City UT, US

Assignee:

EmiSense Technologies, LLC - San Juan Capistrano CA

International Classification:

G01N 33/00
G01M 15/10

US Classification:

73 2331

Abstract:

A sensor includes a housing, a central sensor electrode assembly, an insulating member, and a trace. The central sensor electrode assembly is coupled to a supply side of a voltage source. The insulating member is coupled between the housing and the central sensor electrode assembly. The insulating member circumscribes a section of the central sensor electrode assembly. The trace is coupled to the insulating member and circumscribes the section of the central sensor electrode assembly. The trace directs at least a portion of leakage current away from a voltage ground offset on an opposite side of the central sensor electrode assembly.

US Patent:

20170284899, Oct 5, 2017

Filed:

Jan 9, 2017

Appl. No.:

15/402035

Inventors:

- Ladera Ranch CA, US
Joe Fitzpatrick - Glendale CA, US
Brett Henderson - Salt Lake City UT, US
Anthoniraj Lourdhusamy - West Jordan UT, US
Lee Sorensen - West Jordan UT, US
James Steppan - Park City UT, US

Assignee:

EmiSense Technologies, LLC - Ladera Ranch CA

International Classification:

G01M 15/10
G01N 33/00
G01N 15/06

Abstract:

A sensor includes an electrode and a seed structure. The electrode is configured to measure current due to movement of particulate matter relative to the electrode. The seed structure is deposited on the electrode. The seed structure includes a plurality of elongated members extending outward from the surface of the electrode. The elongated members are configured to promote charge transfer to particles and/or agglomerates of the particulate matter during operation of the sensor.

US Patent:

20170234743, Aug 17, 2017

Filed:

Feb 28, 2017

Appl. No.:

15/444427

Inventors:

- Ladera Ranch CA, US
- Livermore CA, US
Joseph Jay Fitzpatrick - Glendale CA, US
Gangqiang Wang - Salt Lake City UT, US
Brett Tamatea Henderson - Salt Lake City UT, US
Anthoniraj Lourdhusamy - West Jordan UT, US
James John Steppan - Park City UT, US
Klaus Karl Allmendinger - San Juan Capistrano CA, US

International Classification:

G01K 13/02
G01N 27/406
G01N 33/00
G01N 27/407

Abstract:

A device for signal processing. The device includes a signal generator, a signal detector, and a processor. The signal generator generates an original waveform. The signal detector detects an affected waveform. The processor is coupled to the signal detector. The processor receives the affected waveform from the signal detector. The processor also compares at least one portion of the affected waveform with the original waveform. The processor also determines a difference between the affected waveform and the original waveform. The processor also determines a value corresponding to a unique portion of the determined difference between the original and affected waveforms. The processor also outputs the determined value.

US Patent:

20170234827, Aug 17, 2017

Filed:

Feb 28, 2017

Appl. No.:

15/444416

Inventors:

- Ladera Ranch CA, US
- Livermore CA, US
Joseph Jay Fitzpatrick - Glendale CA, US
Gangqiang Wang - Salt Lake City UT, US
Brett Tamatea Henderson - Salt Lake City UT, US
Anthoniraj Lourdhusamy - West Jordan UT, US
James John Steppan - Park City UT, US
Klaus Karl Allmendinger - San Juan Capistrano CA, US

International Classification:

G01N 27/406
G01K 13/02
G01N 33/00
G01N 27/407

Abstract:

A device for signal processing. The device includes a signal generator, a signal detector, and a processor. The signal generator generates an original waveform. The signal detector detects an affected waveform. The processor is coupled to the signal detector. The processor receives the affected waveform from the signal detector. The processor also compares at least one portion of the affected waveform with the original waveform. The processor also determines a difference between the affected waveform and the original waveform. The processor also determines a value corresponding to a unique portion of the determined difference between the original and affected waveforms. The processor also outputs the determined value.

US Patent:

20170234828, Aug 17, 2017

Filed:

Feb 28, 2017

Appl. No.:

15/444420

Inventors:

- Ladera Ranch CA, US
- Livermore CA, US
Joseph Jay Fitzpatrick - Glendale CA, US
Gangqiang Wang - Salt Lake City UT, US
Brett Tamatea Henderson - Salt Lake City UT, US
Anthoniraj Lourdhusamy - West Jordan UT, US
James John Steppan - Park City UT, US
Klaus Karl Allmendinger - San Juan Capistrano CA, US

International Classification:

G01N 27/406
G01N 33/00
G01K 13/02
G01N 27/407

Abstract:

A method for analysis of a gas stream. The method includes identifying an affected region of an affected waveform signal corresponding to at least one characteristic of the gas stream. The method also includes calculating a voltage-current time differential between the affected region of the affected waveform signal and a corresponding region of an original waveform signal. The affected region and the corresponding region of the waveform signals have a sensitivity specific to the at least one characteristic of the gas stream. The method also includes generating a value for the at least one characteristic of the gas stream based on the calculated voltage-current time differential.

US Patent:

20160194252, Jul 7, 2016

Filed:

Jan 7, 2015

Appl. No.:

14/591840

Inventors:

- Ladera Ranch CA, US
Joseph Fitzpatrick - Glendale CA, US
James John Steppan - Park City UT, US
Leta Yar-Li Woo - Oakland CA, US
Brett Tamatea Henderson - Salt Lake City UT, US
Frank Bell - Sandy UT, US

Assignee:

EMISENSE TECHNOLOGIES, LLC - Ladera Ranch CA

International Classification:

C04B 35/64
G01N 27/406
B32B 18/00
G01N 27/407

Abstract:

A method is described. The method is a method for making a constraining ceramic assembly. The method includes applying at least one metallic electrode to a substrate. The method also includes applying a porous ceramic layer to the substrate to cover the metallic electrode. The method also includes sintering the substrate, the porous ceramic layer, and the metallic electrode together at a sintering temperature above a melting point of the metallic electrode.

US Patent:

20150101937, Apr 16, 2015

Filed:

Oct 16, 2013

Appl. No.:

14/055562

Inventors:

- Livermore CA, US
- Ladera Ranch CA, US
Joseph Jay Fitzpatrick - Glendale CA, US
Gangqiang Wang - Salt Lake City UT, US
Brett Tamatea Henderson - Salt Lake City UT, US
Anthoniraj Lourdhusamy - West Jordan UT, US
James John Steppan - Park City UT, US
Klaus Karl Allmendinger - San Juan Capistrano CA, US

Assignee:

Lawrence Livermore National Security, LLC - Livermore CA
EmiSense Technologies, LLC - Ladera Ranch CA

International Classification:

G01N 27/407
H03K 4/90
G01K 13/02

US Classification:

205775, 702130, 327133, 204424

Abstract:

A device for signal processing. The device includes a signal generator, a signal detector, and a processor. The signal generator generates an original waveform. The signal detector detects an affected waveform. The processor is coupled to the signal detector. The processor receives the affected waveform from the signal detector. The processor also compares at least one portion of the affected waveform with the original waveform. The processor also determines a difference between the affected waveform and the original waveform. The processor also determines a value corresponding to a unique portion of the determined difference between the original and affected waveforms. The processor also outputs the determined value.

US Patent:

20140144208, May 29, 2014

Filed:

Jan 28, 2014

Appl. No.:

14/166658

Inventors:

- Ladera Ranch CA, US
Joe Fitzpatrick - Glendale CA, US
Brett Henderson - Salt Lake City UT, US
Anthoniraj Lourdhusamy - West Jordan UT, US
Lee Sorensen - West Jordan UT, US
James Steppan - Park City UT, US

Assignee:

EmiSense Technologies, LLC - Ladera Ranch CA

International Classification:

G01N 33/00
C23C 30/00
G01M 15/10

US Classification:

73 2331, 427123, 427 58

Abstract:

A sensor includes an electrode and a seed structure. The electrode is configured to measure current due to movement of particulate matter relative to the electrode. The seed structure is deposited on the electrode. The seed structure includes a plurality of elongated members extending outward from the surface of the electrode. The elongated members are configured to promote charge transfer to particles and/or agglomerates of the particulate matter during operation of the sensor.