Brian D Doherty

US Patent:

20070092359, Apr 26, 2007

Filed:

Oct 13, 2006

Appl. No.:

11/580697

Inventors:

Richard Pickreign - Harvard MA, US
Jeffrey Tawyer - Danvers MA, US
Brian Doherty - Weston MA, US

International Classification:

B65G 1/00

US Classification:

414281000

Abstract:

An improved automated material handling system that allows an overhead hoist supported by a suspended track to access Work-In-Process (WIP) parts from storage locations beside the track. The automated material handling system includes an overhead hoist transport vehicle for transporting an overhead hoist on a suspended track, and one or more storage bins for storing WIP parts located beside the track. Each storage bin is either a movable shelf or a fixed shelf. To access a WIP part from a selected shelf, the overhead hoist transport vehicle moves along the suspended track to a position at the side of the shelf. Next, the movable shelf moves to a position underneath the overhead hoist. Alternatively, overhead hoist moves to a position above the fixed shelf. The overhead hoist is then operated to pick a desired WIP part directly from the shelf, or to place one or more WIP parts directly to the shelf. Once the WIP part is held by the overhead hoist, the overhead hoist transport vehicle moves the WIP part to a workstation or processing machine on the product manufacturing floor.

US Patent:

47641142, Aug 16, 1988

Filed:

Jan 13, 1986

Appl. No.:

6/818484

Inventors:

Robert L. Jeffcoat - Bedford MA
Khushroo M. Captain - Cambridge MA
Brian J. Doherty - Marblehead MA

Assignee:

Foster-Miller, Inc. - Waltham MA

International Classification:

A61C 1904

US Classification:

433 72

Abstract:

Periodontal analysis apparatus includes a probe member having a tip, a probe housing having a guide channel in which the probe member is disposed for reciprocating movement with the tip of the probe member extending from the channel, force applying means for reciprocating the probe member in the housing, and transducer means in the housing for monitoring motion of the probe member and sensing perturbations in probe motion caused by the CEJ and providing output signals indicative thereof.