Brian R Marshall

US Patent:

20120047479, Feb 23, 2012

Filed:

Mar 9, 2008

Appl. No.:

12/530453

Inventors:

James M. Paris - Portland OR, US
Brian Marshall - Wilsonville OR, US
John G. Ferguson - Tualatin OR, US
Anant S. Adke - Lake Oswego OR, US

International Classification:

G06F 17/50

US Classification:

716112

Abstract:

Techniques for incrementally analyzing layout design data are disclose. With various implementations, a subsequent incremental analysis can be made for only portions of layout design data, using a subset of available analysis criteria, or some combination of both. For example, the analysis can be limited to errors identified in a previous analysis process, to changes in the layout design data made after a previous analysis process, to particular areas specified by a designer, or some combination thereof. Still further, the analysis process may be performed using only a subset of analysis criteria relevant to the portions of the design data being analyzed, a subset of the initial analysis criteria that the design data failed in a previous analysis process, a subset of the initial analysis criteria selected by the designer, or some combination thereof. Further, such an incremental analysis process can be initiated before a previous analysis process has completed.