Bryan J Robbins

age ~61

from Beavercreek, OH

Also known as:
  • Melissa Robbins
  • Brian J Robbins
  • Bryan J Bobbins
  • Emily Robbins
  • Elizabeth Robbins
Phone and address:
3790 Mesquite Dr, Dayton, OH 45440
9373062279

Bryan Robbins Phones & Addresses

  • 3790 Mesquite Dr, Dayton, OH 45440 • 9373062279 • 9373201097
  • Beavercreek, OH
  • 15 Misty Ridge Cir, Poughkeepsie, NY 12603 • 8454624688
  • Beacon, NY
  • Cincinnati, OH
  • 3790 Mesquite Dr, Beavercreek, OH 45440 • 9373201097

Work

  • Position:
    Professional/Technical

Education

  • Degree:
    Graduate or professional degree

Us Patents

  • Method To Improve A Testability Analysis Of A Hierarchical Design

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  • US Patent:
    6532571, Mar 11, 2003
  • Filed:
    Jan 21, 2000
  • Appl. No.:
    09/489240
  • Inventors:
    Richard M. Gabrielson - Vestal NY
    Kevin W. McCauley - Greene NY
    Richard F. Rizzolo - Red Hook NY
    Bryan J. Robbins - Poughkeepsie NY
    Joseph M. Swenton - Owego NY
  • Assignee:
    International Business Machines Corporation - Armonk NY
  • International Classification:
    G06F 1750
  • US Classification:
    716 4, 714729, 714738, 714733, 714726
  • Abstract:
    A method to improve the testability and analysis of a hierarchical semiconductor chip design formed from a plurality of macros, each macro identifying a particular portion of a semiconductor chip design. This method includes providing a first macro netlist that identifies a logical description of a first portion of the semiconductor chip design and performing RPT analysis on the first macro netlist. The method also includes providing a second macro netlist identifying a logical description of a second portion of the semiconductor chip design and performing an RPT analysis on the second macro netlist. The first macro netlist is combined with the second macro netlist and an RPT analysis is performed on the combination of the first and second macro netlists.
  • Method And Apparatus For Programmable Lbist Channel Weighting

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  • US Patent:
    6671838, Dec 30, 2003
  • Filed:
    Sep 27, 2000
  • Appl. No.:
    09/671413
  • Inventors:
    Timothy J. Koprowski - Newburgh NY
    Mary P. Kusko - Hopewell Junction NY
    Lawrence K. Lange - Wappingers Falls NY
    Bryan J. Robbins - Poughkeepsie NY
  • Assignee:
    International Business Machines Corporation - Armonk NY
  • International Classification:
    G11C 2900
  • US Classification:
    714726, 714718, 324765, 365201, 365221
  • Abstract:
    An exemplary embodiment of the invention is a built-in self-test (BIST) method and apparatus for testing the logic circuits on an integrated circuit. Random test pattern data is generated by a random pattern generator. A random resistant fault analysis (RRFA) program is used to determine the weighting requirements, on a per channel basis, for testing the logic circuits. The weighting requirements from the RRFA program are applied to the random test pattern data resulting in weighted test pattern data. The weighted test pattern data is then programmably applied to the scan chain.
  • Method And System For Determining Repeatable Yield Detractors Of Integrated Circuits

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  • US Patent:
    6751765, Jun 15, 2004
  • Filed:
    Nov 27, 2000
  • Appl. No.:
    09/722880
  • Inventors:
    Richard F. Rizzolo - Red Hook NY
    Rocco E. DeStefano - Rhinebeck NY
    Joseph E. Eckelman - Hopewell Junction NY
    Thomas G. Foote - Milan NY
    Steven Michnowski - Wappingers Falls NY
    Franco Motika - Hopewell Junction NY
    Phillip J. Nigh - Williston VT
    Bryan J. Robbins - Poughkeepsie NY
  • Assignee:
    International Business Machines Corporation - Armonk NY
  • International Classification:
    G01R 3128
  • US Classification:
    714732, 714738
  • Abstract:
    An exemplary embodiment of the invention is a method for LBIST testing integrated circuit. The method includes generating a plurality of multi-bit test patterns and grouping the multi-bit test patterns by a plurality of test pattern partitions including a first test pattern partition having a first number of bits and a second test pattern partition having second number of bits greater than the first number. The first test pattern partition is applied to the integrated circuit to generate a first signature that is compared to a first reference signature to detect a failure. The second test pattern partition is applied to the integrated circuit to generate a second signature that is compared to a second reference signature to detect a failure in the integrated circuit.
  • Method And Apparatus For Facilitating Random Pattern Testing Of Logic Structures

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  • US Patent:
    6836865, Dec 28, 2004
  • Filed:
    Oct 9, 2001
  • Appl. No.:
    09/973398
  • Inventors:
    Mary P. Kusko - Hopewell Junction NY
    William V. Huott - Holmes NY
    Bryan J. Robbins - Poughkeepsie NY
    Timothy Charest - West Hurley NY
  • Assignee:
    International Business Machines Corporation - Armonk NY
  • International Classification:
    G01R 3128
  • US Classification:
    714726, 714729, 714728, 714727
  • Abstract:
    A method for preparing a logic structure for random pattern testing is disclosed. In an exemplary embodiment of the invention, the method includes configuring a select mechanism within a data scan chain, the select mechanism configured between a first register in the data scan chain and a second register. A parallel data path is routed within the scan chain, the parallel data path beginning from an input side of the first register, running through the select mechanism, and ending at an input side of the second register. Thus configured, the select mechanism is capable of switching a source path of input data to said second register from a normal data path to the parallel data path. When the parallel data path is selected as the source path of input data to the second register, data loaded into the second register matches data loaded into the first register.
  • Synchronous Bi-Directional Data Transfer Having Increased Bandwidth And Scan Test Features

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  • US Patent:
    6990076, Jan 24, 2006
  • Filed:
    May 18, 1999
  • Appl. No.:
    09/313261
  • Inventors:
    Timothy G. McNamara - Fishkill NY, US
    Bryan J. Robbins - Poughkeepsie NY, US
    William R. Reohr - Bronx NY, US
  • International Classification:
    H04J 15/00
  • US Classification:
    370241, 714726
  • Abstract:
    At least one swapper circuit is electrically connected to a bus between a plurality of entities sharing the bus. The swapper comprises a pair of series connected latches and a tristate circuits, one for each data direction, connected in parallel. The swapper acts as a revolving door, capturing data traveling from either side of the bus and shuffling the data to the other side without collision. A latch circuit is connected at either end of the bus for capturing data arriving from the other side. In addition, each of the drive entities is provided with a master/slave latched equipped with scan-in/scan-out ports, respectively, to enable testing of the circuit by allowing internal nodes of the circuit to be observed without requiring an external connection for each node accessed. In a VLSI arrangement, the scan-in/scan-out ports are connected together from a plurality of such circuits such that a variety of test patterns for various hardware configurations may be realized.
  • Automated Bist Test Pattern Sequence Generator Software System And Method

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  • US Patent:
    7117415, Oct 3, 2006
  • Filed:
    Jan 15, 2004
  • Appl. No.:
    10/757781
  • Inventors:
    Donato O. Forlenza - Hopewell Junction NY, US
    Orazio P. Forlenza - Hopewell Junction NY, US
    William J. Hurley - Poughkeepsie NY, US
    Bryan J. Robbins - Poughkeepsie NY, US
  • Assignee:
    International Business Machines Corporation - Armonk NY
  • International Classification:
    G01R 31/28
    G06F 11/00
  • US Classification:
    714733, 714736
  • Abstract:
    Methods and systems for reducing the volume of test data associated with built in self testing (BIST) test methodologies (e. g. , logical BIST, array BIST, etc. ) and pattern structures are provided. Embodiments of the present invention store a limited number of “dynamic” test parameters for each test sequence that have changed relative to a previous test sequence.
  • Verification Of Array Built-In Self-Test (Abist) Design-For-Test/Design-For-Diagnostics (Dft/Dfd)

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  • US Patent:
    7921346, Apr 5, 2011
  • Filed:
    Oct 31, 2008
  • Appl. No.:
    12/262976
  • Inventors:
    Donato Orazio Forlenza - Hopewell Junction NY, US
    Orazio Pasquale Forlenza - Hopewell Junction NY, US
    Bryan J. Robbins - Beavercreek OH, US
    Phong T. Tran - Highland NY, US
  • Assignee:
    International Business Machines Corporation - Armonk NY
  • International Classification:
    G01R 31/28
  • US Classification:
    714733, 714 30, 714 36, 714718, 714724, 714726, 714727, 714729, 714734, 714738, 714741, 365200, 365201, 36518501, 711102, 711103, 716 4, 716 18
  • Abstract:
    A method, system and computer program product for testing the Design-For-Testability/Design-For-Diagnostics (DFT/DFD) and supporting BIST functions of a custom microcode array. Upon completion of the LSSD Flush and Scan tests, the ABIST program is applied to target the logic associated direct current (DC) and alternating current (AC) faults of ABIST array Design-For-Testability/Design-For-Diagnostics DFT/DFD functions that support the microcode array. A LSSD test of the DFT functional combinational logic is performed by applying generated LSSD deterministic test patterns targeting the ABIST design-for-test faults to determine if the DFT supporting the microcode array is functioning correctly. Additional tests may be terminated upon resulting failure of the applied ABIST DFT circuitry surrounding the arrays.
  • Method And Apparatus For Performing Logic Built-In Self-Testing Of An Integrated Circuit

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  • US Patent:
    7934134, Apr 26, 2011
  • Filed:
    Jun 5, 2008
  • Appl. No.:
    12/133830
  • Inventors:
    Donato O. Forlenza - Hopewell Junction NY, US
    Orazio P. Forlenza - Hopewell Junction NY, US
    Bryan J. Robbins - Beavercreek OH, US
    Phong T. Tran - Highland NY, US
  • Assignee:
    International Business Machines Corporation - Armonk NY
  • International Classification:
    G01R 31/28
  • US Classification:
    714733, 714726, 714727, 714729, 714734
  • Abstract:
    A method for performing a logical built-in self-test of an integrated circuit is disclosed. The method includes performing a flush and scan test to determine whether the scan chains function correctly. If one of the scan chains does not function correctly, the logical built-in self-test is terminated. If each of the scan chains functions correctly, a structural test of the design-for-test logic supporting LBIST is performed to determine whether the LBIST design-for-test logic functions correctly. If the LBIST design-for-test logic does not function correctly, the logical built-in self-test is terminated. If the LBIST design-for-test logic functions correctly, a level sensitive scan design test of the functional combinational logic is performed using the logic supporting LBIST design-for-test to determine if the integrated circuit functions correctly.

Isbn (Books And Publications)

The Essence of Aikido

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Author
Bryan Robbins

ISBN #
0865680973

Name / Title
Company / Classification
Phones & Addresses
Mr. Bryan Robbins
Owner
Custom Wheels & Performance
NFLD Custom Wheels Inc.
Auto Parts & Supplies - Custom Wheels/Rims
40 O'Leary Avenue, St. John's, NL A1B 2C7
7097262668
Bryan Robbins
Owner
Custom Wheels & Performance
Auto Parts & Supplies - Custom Wheels/Rims
7097262668

Medicine Doctors

Bryan Robbins Photo 1

Bryan Neil Robbins

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Specialties:
Anesthesiology
Education:
University of Miami(1990)

Resumes

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Bryan Robbins

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Location:
15 Polk Ct, North Potomac, MD 20878
Industry:
Computer Hardware
Work:
Ibm Jun 1988 - Jun 2005
Design For Test Senior Engineer

Teradyne 1983 - 1985
Cooperative Education Student
Education:
Purdue University 1986 - 1988
Master of Science, Masters, Electrical Engineering
Purdue University 1982 - 1986
Colerain High School 1978 - 1982
Skills:
Process Improvement
Engineering
Testing
Perl
Project Management
Verilog
Semiconductors
Dft
Unix
Linux
Programming
Asic
Microprocessors
Cadence Virtuoso
Debugging
Vhdl
Vlsi
Shell Scripting
Interests:
Environment
Education
Poverty Alleviation
Hiking
Biking
Camping
Science and Technology
Disaster and Humanitarian Relief
Human Rights
Animal Welfare
Health
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Bryan Robbins

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Bryan Robbins

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Bryan Robbins

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Bryan Robbins

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Bryan Robbins Photo 7

Auto Mechanic

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Industry:
Automotive
Work:
Nca
Auto Mechanic
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Bryan Robbins

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Lawyers & Attorneys

Bryan Robbins Photo 9

Bryan Robbins - Lawyer

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Specialties:
Chapter 13 Bankruptcy
Chapter 7 Bankruptcy
Family Law
ISLN:
924013224
Admitted:
2013
Law School:
Wayne State University Law School, JD - Juris Doctor, 2011
Bryan Robbins Photo 10

Bryan Robbins - Lawyer

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Specialties:
Litigation
Criminal Defense
Family
Bankruptcy & Debt
Estate Planning
Criminal Defense
ISLN:
920453351
Admitted:
2008
Law School:
St. Louis University, J.D., 2008

Myspace

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Bryan Robbins

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Locality:
California
Gender:
Male
Birthday:
1943
Bryan Robbins Photo 12

bryan robbins

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Locality:
LONDON, KENTUCKY
Gender:
Male
Birthday:
1946
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bryan robbins

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Locality:
NORTH WILKESBORO, North Carolina
Gender:
Male
Birthday:
1927
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Bryan Robbins

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Locality:
CELINA, Ohio
Gender:
Male
Birthday:
1950
Bryan Robbins Photo 15

Bryan Robbins

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Locality:
pheonix, Arizona
Gender:
Male
Birthday:
1948
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Bryan Robbins

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Locality:
Sterling Heights, Michigan
Gender:
Male
Birthday:
1951

Googleplus

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Bryan Robbins

Work:
Spotless Films - Owner, etc.
Westwind Media / ABC Television - Telecine Assist
Rushes - DI Supervisor, Colorist, Telecine Assist
Day O Productions - Production Coordinator
Lightstone Entertainment - Intern
Education:
Gnomon School of VFX - Compositing and Effects, Video Symphony - Avid Editing, Santa Monica Academy of Entertainment and Technology - General Production and Post-production
About:
Independent production and post-production professional, with experience on all sides of commercials, music videos, and currently focusing on the growing future of social media. 
Bryan Robbins Photo 18

Bryan Robbins

Work:
Rackspace - Linux Administrator (2011)
Education:
Texas State University–San Marcos - Computer Science
Bryan Robbins Photo 19

Bryan Robbins

Work:
FINRA - Software tester (2012)
Tagline:
Software is essential to life; therefore, make it good.
Bryan Robbins Photo 20

Bryan Robbins

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Bryan Robbins

Relationship:
Its_complicated
About:
Living in IN. but lived in FL. alot of the time
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Bryan Robbins

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Bryan Robbins

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Bryan Robbins

Plaxo

Bryan Robbins Photo 25

Bryan Robbins

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Palm Beach FloridaBio Med Laser Repair service tec

Flickr

Facebook

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Bryan Robbins

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Friends:
Robert Hodges, Drew Bernard, Alyssa Morrow, Makinzi Nicole, Bryan Robbins. Photo Log in to contact Bryan Robbins.
Bryan Robbins. Photo Log in to contact Bryan Robbins.
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Bryan Robbins

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Bryan Robbins

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Bryan Robbins

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Bryan Robbins Photo 38

Bryan Robbins

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Bryan Robbins

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Bryan Robbins

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Bryan Robbins

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Classmates

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Bryan Robbins

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Schools:
River Oaks Academy Belle Chasse LA 1978-1982
Community:
Cindy Stevens, Fred Walker, Shern Taylor, Gary Gregg
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Bryan Robbins

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Schools:
Clearwater Largo Christian School Clearwater FL 1979-1981
Community:
David Stanley, Cheryl Hinder, Jeannie Wagner
Bryan Robbins Photo 44

Bryan Robbins, Jones High...

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Bryan Robbins Photo 45

Bryan Robbins, Mclouth Hi...

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Bryan Robbins Photo 46

Clearwater Largo Christia...

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Graduates:
Bryan Robbins (1979-1981),
Lisa Johannsen (1980-1982),
Jennifer Mcdermott (1983-1987),
Cheryl Hinder (1983-1987),
Barbara Nichols (1979-1983)
Bryan Robbins Photo 47

Jones High School, Jones,...

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Graduates:
Bryan Robbins (1988-1992),
Victoria Johnson (1999-2003),
Clyde Parker (1961-1965),
Rudy Pluto (1988-1992)
Bryan Robbins Photo 48

Wilkes Central High Schoo...

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Graduates:
Bryan Robbins (1983-1987),
Glenda Moore (1964-1968),
Vanessa Davis (1980-1984)

News

Small farmers struggle as drought kills vegetables

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  • Bryan Robbins, who runs the Greensburg Decatur County farmers market in Indiana, said it experienced a similar drop in attendance in recent weeks, so he started a new program for elderly customers who may be leery of the heat.
  • Date: Jul 31, 2012
  • Source: Google

Youtube

Paramount Pictures CEO Brian Robbins on box o...

Turn to CNBC TV for the latest stock market news and analysis. From ma...

  • Duration:
    2m 29s

Nickelodeon CEO Brian Robbins on streaming, y...

Turn to CNBC TV for the latest stock market news and analysis. From ma...

  • Duration:
    3m 48s

AwesomenessTV's CEO says millennials are so y...

That's according to Brian Robbins, co-founder and CEO of AwesomenessTV...

  • Duration:
    36m 54s

Keynote: Brian Robbins, AwesomenessTV - MIPJu...

Brian Robbins is one of the entertainment industry's most prolific pro...

  • Duration:
    29m 29s

'Top Gun' is a 'historic win' for the movie b...

Paramount Pictures CEO Brian Robbins joins CNBC's 'Squawk Box' to reac...

  • Duration:
    2m 27s

marijuana- brian robbins

a great song.

  • Duration:
    5m 11s

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