Calvin R Jones

US Patent:

40016730, Jan 4, 1977

Filed:

Jun 30, 1975

Appl. No.:

5/591421

Inventors:

Gerald George Barrett - San Jose CA
Louis Michael Hornung - Austin TX
Calvin Coolidge Jones - Austin TX

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G01R 3312

US Classification:

324 34R

Abstract:

A method of both testing all loops of a long serial magnetic bubble domain chip, and repairing the chip for automatic bypass of defective loops. Each repair station associated with each loop is sequentially loaded with a bubble domain. Then new domains are sequentially generated and positioned adjacent each loop. The domains initially loaded into the repair stations are shifted out in parallel for propagation along the loops. The new domains are then loaded in parallel into the repair stations. The domains propagated along the loops are read to determine defective loops, and form a basis for generating a repair pattern. The repair pattern is then loaded in parallel into the repair stations for sealing off defective loops.