Catherine L Danial from Wayne, NJ, age 58

Method Of Making Count Probe With Removable Count Wafer
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US Patent:

54329922, Jul 18, 1995
Filed:

Dec 23, 1993
Appl. No.:

8/173432
Inventors:

Thomas L. Barnes - Sunrise FL
James W. Colburn - Margate FL
Catherine L. Danial - Coconut Creek FL
Sangvorn Rutnarak - Long Grove IL
Assignee:

Abbott Laboratories - Abbott Park IL
International Classification:

B23P 1902
US Classification:

29525
Abstract:

A method of making a count probe comprises the following steps. A member is made having a conduit and an opening. A wafer is made including an aperture. The wafer is removably inserted into the opening such that the wafer is removably retained within the opening by an interference fit between the wafer and the member.

Mechanical Capture Of Count Wafer For Particle Analysis
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US Patent:

54020620, Mar 28, 1995
Filed:

Dec 23, 1993
Appl. No.:

8/173735
Inventors:

Thomas L. Barnes - Sunrise FL
James W. Colburn - Margate FL
Catherine L. Danial - Coconut Creek FL
Sangvorn Rutnarak - Long Grove IL
Assignee:

Abbott Laboratories - Abbott Park IL
International Classification:

G01N 1506
G01N 2706
US Classification:

324 714
Abstract:

A particle count probe comprises a wafer having an aperture. A first member is provided having a fluid passageway. A second member is removably mounted to the first member, and cooperates with the first member and the wafer to position the wafer so that the aperture of the wafer aligns with the fluid passageway.

Method Of Making Stress Relieved Count Probe
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US Patent:

55009921, Mar 26, 1996
Filed:

Mar 20, 1995
Appl. No.:

8/407790
Inventors:

Thomas L. Barnes - Sunrise FL
James W. Colburn - Margate FL
Catherine L. Danial - Coconut Creek FL
William R. Jones - Hialeah FL
Millard D. Longman - Coral Springs FL
Assignee:

Abbott Laboratories - Abbott Park IL
International Classification:

B23P 1902
US Classification:

29525
Abstract:

A method of making a count probe for counting particles comprises the following steps. A count wafer is formed along with a core member having an opening for accepting the count wafer. The count wafer is applied to the opening in the core member to form an interference fit between the count wafer and the core member. After application of the count wafer to the opening in the core member, the core member is annealed to relieve stress in the core member.