- Santa Clara CA, US Lilia May - Chandler AZ, US Rajen S. Sidhu - Chandler AZ, US Mukul P. Renavikar - Chandler AZ, US Ashay A. Dani - Chandler AZ, US Edward R. Prack - Phoenix AZ, US Carl L. Deppisch - Chandler AZ, US Anna M. Prakash - Chandler AZ, US James C. Matayabas - Gilber AZ, US Jason Jieping Zhang - Chandler AZ, US Srinivasa R. Aravamudhan - Beaverton OR, US Chang Lin - Portland OR, US
An apparatus is described that includes a substrate and a mold compound disposed on the substrate. The semiconductor die is embedded within the mold compound and is electrically coupled to lands on the substrate. Solder balls are disposed around the semiconductor die on the substrate. Each of the solder balls have a solid coating thereon. The solid coating contains a cleaning agent to promote its solder ball's coalescence with another solder ball. Respective vias are formed in the mold compound that expose the solder balls and their respective solid coatings. In combined or alternate embodiments outer edges of the mold compound have smaller thickness than regions of the mold compound between the vias and the semiconductor die. In combined or alternate embodiments micro-channels exist between the solder balls and the mold compound.
Package Structure To Enhance Yield Of Tmi Interconnections
Thomas J. De Bonis - Tempe AZ, US Lilia May - Chandler AZ, US Rajen S. Sidhu - Chandler AZ, US Mukul P. Renavikar - Chandler AZ, US Ashay A. Dani - Chandler AZ, US Edward R. Prack - Phoenix AZ, US Carl L. Deppisch - Chandler AZ, US Anna M. Prakash - Chandler AZ, US Jason Jieping Zhang - Chandler AZ, US Srinivasa R. Aravamudhan - Beaverton OR, US Chang Lin - Portland OR, US
An apparatus is described that includes a substrate and a mold compound disposed on the substrate. The semiconductor die is embedded within the mold compound and is electrically coupled to lands on the substrate. Solder balls are disposed around the semiconductor die on the substrate. Each of the solder balls have a solid coating thereon. The solid coating contains a cleaning agent to promote its solder ball's coalescence with another solder ball. Respective vias are formed in the mold compound that expose the solder balls and their respective solid coatings. In combined or alternate embodiments outer edges of the mold compound have smaller thickness than regions of the mold compound between the vias and the semiconductor die. In combined or alternate embodiments micro-channels exist between the solder balls and the mold compound.
Lin Chang (1988-1995), Frances Rizzo (1976-1981), Andrea Filipovich (1992-1996), Stacey Same (1975-1979), Eddie Fields (1988-1992), Laurie Greenfeld (1974-1979)
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