David A. Reichle - Boise ID Charles K. Snodgrass - Boise ID Charles S. Alexander - Boise ID Fremont S. Smith - Boise ID
Assignee:
Micron Technology, Inc. - Boise ID
International Classification:
G06F 1100
US Classification:
714815, 714700, 714724, 714736, 327261, 713503
Abstract:
Signal alignment circuitry aligns (i e. , deskews) test signals from a massively parallel tester. A timing portion of each signal is received by a rising edge delay element, a falling edge delay element, and a transition detector, all in parallel. The delay of the rising edge and falling edge delay elements is independently controlled by control circuitry. The outputs of the rising edge and falling edge delay elements are muxed together, and the output of the mux is selected in response to rising edge and falling edge transitions detected by the transition detector. The output of the mux is provided to pulse generating circuitry, which generates a pulse at each edge for use in clocking a data portion of each signal into a DQ flip-flop. The output of this DQ flip-flop is then latched in to another DQ flip-flop by a reference clock. To control the rising and falling edges of one of the test signals, and thereby align the signal with the other test signals, the control circuitry first sweeps the delay in the rising edge and falling edge delay elements until the latched-in signal transitions.
Circuitry For And System And Substrate With Circuitry For Aligning Output Signals In Massively Parallel Testers And Other Electronic Devices
David A. Reichle - Boise ID Charles K. Snodgrass - Boise ID Charles S. Alexander - Boise ID Fremont S. Smith - Boise ID
Assignee:
Micron Technology, Inc. - Boise ID
International Classification:
G06F 1100
US Classification:
714724, 714700, 714736, 714815, 327261, 713503
Abstract:
Signal alignment circuitry aligns (i. e. , deskews) test signals from a massively parallel tester. A timing portion of each signal is received by a rising edge delay element, a falling edge delay element, and a transition detector, all in parallel. The delay of the rising edge and falling edge delay elements is independently controlled by control circuitry. The outputs of the rising edge and falling edge delay elements are muxed together, and the output of the mux is selected in response to rising edge and falling edge transitions detected by the transition detector. The output of the mux is provided to pulse generating circuitry, which generates a pulse at each edge for use in clocking a data portion of each signal into a DQ flip-flop. The output of this DQ flip-flop is then latched in to another DQ flip-flop by a reference clock.
System And Method For Aligning Output Signals In Massively Parallel Testers And Other Electronic Devices
David A. Reichle - Boise ID Charles K. Snodgrass - Boise ID Charles S. Alexander - Boise ID Fremont S. Smith - Boise ID
Assignee:
Micron Technology, Inc. - Boise ID
International Classification:
G01R 3128
US Classification:
714724
Abstract:
Signal alignment circuitry aligns (i. e. , deskews) test signals from a massively parallel tester. A timing portion of each signal is received by a rising edge delay element, a falling edge delay element, and a transition detector, all in parallel. The delay of the rising edge and falling edge delay elements is independently controlled by control circuitry. The outputs of the rising edge and falling edge delay elements are muxed together, and the output of the flux is selected in response to rising edge and falling edge transitions detected by the transition detector. The output of the mux is provided to pulse generating circuitry, which generates a pulse at each edge for use in clocking a data portion of each signal into a DQ flip-flop. The output of this DQ flip-flop is then latched in to another DQ flip-flop by a reference clock. To control the rising and falling edges of one of the test signals, and thereby align the signal with the other test signals, the control circuitry first sweeps the delay in the rising edge and falling edge delay elements until the latched-in signal transitions.
Method And Apparatus For Signal Routing To Achieve Signal-Efficiency
Charles K. Snodgrass - Boise ID Robert L. Totorica - Boise ID David A. Reichle - Boise ID Charles S. Alexander - Boise ID
Assignee:
Micron Technology, Inc. - Boise ID
International Classification:
G06F 1750
US Classification:
39550013
Abstract:
The present invention provides for a method and an apparatus for routing electrical signals. The method includes accessing a plurality of electrical circuits. The apparatus includes a supervisory circuit capable of delivering two access signals from a group of first, second, third, and fourth access signals, wherein the supervisory circuit is capable of delivering one of the first and third access signals, and one of the second and fourth access signals. A plurality of electrical circuits is organized into first and second rows. A first portion of the plurality of electrical circuits in the first and second rows, is coupled to a first access signal line. A second portion of the plurality of electrical circuits in the first and second rows is coupled to a second access signal line. The first and second portions of the plurality of electrical circuits in said first row are coupled to a third access signal. The first and second portions of said plurality of electrical circuits in the second row are coupled to a fourth access signal.
Montebello Orthopedic Medical Group 6758 Passons Blvd, Pico Rivera, CA 90660 5626546899 (phone), 5626546895 (fax)
Education:
Medical School New York Medical College Graduated: 1972
Procedures:
Arthrocentesis Carpal Tunnel Decompression Hallux Valgus Repair Hip Replacement Hip/Femur Fractures and Dislocations Joint Arthroscopy Knee Arthroscopy Knee Replacement Lower Arm/Elbow/Wrist Fractures and Dislocations Shoulder Surgery
Conditions:
Internal Derangement of Knee Internal Derangement of Knee Ligaments Intervertebral Disc Degeneration Plantar Fascitis Sciatica
Languages:
English Korean Spanish
Description:
Dr. Alexander graduated from the New York Medical College in 1972. He works in Pico Rivera, CA and specializes in Orthopaedic Surgery and Orthopedic Sports Medicine. Dr. Alexander is affiliated with Beverly Hospital, St Vincent Medical Center and White Memorial Medical Center.
Dr. Alexander graduated from the New York Medical College in 1977. He works in Bridgeport, CT and specializes in Psychiatry. Dr. Alexander is affiliated with Greater Bridgeport Community Mental Health Center.
University Of Alabama Birmingham Pathology 619 19 St S, Birmingham, AL 35249 2059344303 (phone), 2059345499 (fax)
Education:
Medical School University of Virginia School of Medicine Graduated: 1971
Languages:
English
Description:
Dr. Alexander graduated from the University of Virginia School of Medicine in 1971. He works in Birmingham, AL and specializes in Anatomic Pathology & Clinical Pathology. Dr. Alexander is affiliated with University Of Alabama Hospital.
Speak HOPE, Inc. - Motivational Speaker (2011) Arthur Agency - PR Specialist (2011-2011)
Education:
Southern Illinois University Carbondale - Speech Comm (Masters)
About:
Charles P. Alexander is the founder of Speak HOPE, Inc. This motivational speaking movement focuses mainly on the empowerment of minorities, with an emphasis on African American males. Speak HOPE is h...
Tagline:
Focused on dreams beyond my current circumstance. Follow my org @SPEAKHOPE_. Thanks.
Charles Alexander
Education:
Northwest Secondary School
Charles Alexander
About:
There is a well-known and anticipated moment during every Charles Alexander Recording when the keyboards discreetly takes the lead to bring out some amazing original sounds with Well written lyrics an...