Charles B Lutz

US Patent:

7974386, Jul 5, 2011

Filed:

Jul 31, 2006

Appl. No.:

11/496155

Inventors:

Charles Craig Lutz - Flowery Branch GA, US
Jason Curtis Spielvogel - Bethlehem GA, US
Gregory Adams Irwin - Duluth GA, US
Calvin Laurance - Pell City AL, US

Assignee:

AT&T Intellectual Property I, L.P. - Atlanta GA

International Classification:

H04M 1/24
H04M 3/08
H04M 3/22

US Classification:

379 1501, 379 101, 379 901, 379 903, 379 904, 379 1001

Abstract:

Methods, systems, and computer-readable media for testing failure rate of newly installed network elements within a predetermined amount of time prior to customer use of the network elements are provided. An order report including information regarding one or more network elements is accessed, and based on the information provided by the orders report, a network element from the one or more network elements to be tested is determined. Information regarding the network element to be tested is retrieved from the orders report and included on a ticket created for the network element to be tested. The ticket created for the network element is then forwarded to a test device for testing of the network element associated with the forwarded ticket.

US Patent:

7974387, Jul 5, 2011

Filed:

Oct 23, 2006

Appl. No.:

11/552024

Inventors:

Charles Lutz - Flowery Branch GA, US
Nicole LaTrese Nall - Stone Mountain GA, US
Daniel Spain - Alabaster AL, US

Assignee:

AT&T Intellectual Property I, L.P. - Atlanta GA

International Classification:

H04M 1/24
H04M 3/08
H04M 3/22

US Classification:

379 2909, 379 101, 379 903, 379 1401, 379 1501, 379 3201

Abstract:

Customer problem reports are collected and analyzed in order to monitor, analyze, and proactively prevent the same or similar problems from reoccurring in the future. A selection of customer problem reports are received and may be prioritized for analysis. Associated network elements may be scheduled for monitoring and/or testing at a greater frequency. Network elements may be the subject of new problem reports which may be dispatched to technicians for proactive analysis and repair.

US Patent:

8230278, Jul 24, 2012

Filed:

Nov 26, 2007

Appl. No.:

11/944855

Inventors:

Charles Lutz - Flowery Branch GA, US
Jason Spielvogel - Wheeling WV, US
Nicole Nall - Lithonia GA, US
Barron Cain - Roswell GA, US
William Keyes - Dacula GA, US
Gregory Irwin - Duluth GA, US

Assignee:

AT&T Intellectual Property, I, LP - Atlanta GA

International Classification:

G01R 31/28

US Classification:

714724, 370242

Abstract:

A test system having a sub-system to sub-system bridge may be provided that utilizes the useful attributes of a plurality of circuit testing techniques, while reducing deficiencies associated with certain types of circuit testing. A bridged test system structure is utilized to facilitate circuit testing that is more effective and time efficient. The method analyzes performance data acquired by a first component for one or more circuits, and sends that performance data to a second test component. The second test component provides test signals to the circuits, using the performance date to enhance the use of the test signals, and also provides test response data for the circuits in response to the provided test signals.

US Patent:

8443245, May 14, 2013

Filed:

Jun 26, 2012

Appl. No.:

13/533308

Inventors:

Charles Lutz - Flowery Branch GA, US
Jason Spielvogel - Wheeling WV, US
Nicole Nall - Lithonia GA, US
Barron Cain - Roswell GA, US
William Keyes - Dacula GA, US
Gregory Irwin - Duluth GA, US

Assignee:

AT&T Intellectual Property I, L.P. - Atlanta GA

International Classification:

G01R 31/28

US Classification:

714724, 370242

Abstract:

A test system having a sub-system to sub-system bridge may be provided that utilizes the useful attributes of a plurality of circuit testing techniques, while reducing deficiencies associated with certain types of circuit testing. A bridged test system structure is utilized to facilitate circuit testing that is more effective and time efficient. The method analyzes performance data acquired by a first component for one or more circuits, and sends that performance data to a second test component. The second test component provides test signals to the circuits, using the performance date to enhance the use of the test signals, and also provides test response data for the circuits in response to the provided test signals.