D.o Information Technology Corp Jul 2015 - Sep 2017
User Interface and User Experience Designer
International Technological University (Itu) Jan 2015 - Mar 2015
Solution Designer
Oriental Art Jun 2014 - Dec 2014
Design Consultant
Betel Life Jun 2012 - Aug 2012
Industrial Designer Internship
Rainbow Retailer Dec 2002 - Sep 2005
Sales
Education:
San Jose State University 2010 - 2014
Bachelors, Product Design
Skills:
Sketching Indesign 3D Modeling Sketchup Solidworks Photoshop Illustrator Keyshot Microsoft Word Powerpoint Graphic Design Autocad Product Design
Interests:
Listening To Music Outdoor Exercise Watching Movies Photography Reading
Dr. Lin graduated from the Kaohsiung (takau) Med Coll, Kaohsiung, Taiwan (385 01 Prior 1/71) in 1976. He works in Elizabeth, NJ and specializes in Internal Medicine. Dr. Lin is affiliated with Trinitas Regional Medical Center Williamson St Campus.
Eddy Tjhia - Sunnyvale CA Chi Lin - Milpitas CA Anjali Anagol-Subbarao - San Jose CA
Assignee:
National Semiconductor Corporation - Santa Clara CA
International Classification:
G03F 720
US Classification:
430394
Abstract:
A photolithographic process for forming a lead frame pattern or other pattern is described. In the preferred embodiment, a mask approximately 12 inches by 12 inches contains two nearly identical patterns: a first lead frame pattern is provided on one half of the mask, and a second lead frame pattern, having features reduced by 0. 3 mil, is provided on the other half of the mask. The first pattern is positioned over a copper web having a layer of photoresist laminated on it, and ultraviolet light is transmitted through the first pattern. The photoresist is thus exposed by a first image formed by the first pattern. While the copper web remains stationary, the mask is moved perpendicular to the length of the copper web so that the second pattern now forms a second image overlying the photoresist pattern from the first image. The photoresist layer is then exposed by the second image. The two nearly identical patterns on the mask essentially double expose the photoresist except for a 0.
The invention provides a resistive memory with better area efficiency without degrading reliability, which includes an array area, word lines, a local bit line, source lines, and a shared bit line. In the array area, memory cells are arranged in a matrix, and each memory cells includes a variable resistance element and an accessing transistor. The word lines extend in a row direction of the array area and are connected to the memory cells in the row direction. The local bit line extends in a column direction of the array area. The source lines extend in the column direction and are connected to first electrodes of the memory cells in the column direction. The shared bit line is connected to the local bit line. The shared bit line extends in the row direction and is connected to second electrodes of the memory cells in the row direction.
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