Chris N Atkinson

age ~45

from Pickton, TX

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Also known as:

Christopher N Atkinson
Chris Atkins

Connected to:

Chris Atkinson Phones & Addresses

Pickton, TX
Josephine, TX
Nevada, TX
2212 Westridge Dr, Plano, TX 75075
Rowlett, TX
Dallas, TX
Allen, TX
Richardson, TX

Wikipedia References

Chris Atkinson

About:

Born:

30 November 1979 • Bega, New South Wales, Australia

Work:

Position:

Stockbroker

Education:

Studied at:

Bond University

Specialty:

Leader

Skills & Activities:

Activiti:

World Rally championhip driver

Activity:

Driving

Sport:

Ultimate • Rallying

Skill:

Professional

Award:

Scholarship

Chris Atkinson

Chris Atkinson (Footballer)

Name / Title

Company / Classification

Phones & Addresses

Chris Atkinson

EXPONENTIAL PROPERTY GROUP I, LLC
Nonresidential Building Operator · Business Consulting Services · Nonclassifiable Establishments

3191 Lk Dr, Southlake, TX 76092
1 Colonial Ct, Roanoke, TX 76262
PO Box 92915, Grapevine, TX 76092
1705 Pt West Dr, Little Rock, AR 72211

Amazon

Lonely Planet Discover Turkey (Travel Guide)

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Lonely Planet: The world's leading travel guide publisher Lonely Planet Discover Turkey is your passport to all the most relevant and up-to-date advice on what to see, what to skip, and what hidden discoveries await you. Ride a hot-air balloon over Cappadocia's honeycomb landscapes, walk amid the an...

Author
Lonely Planet, James Bainbridge, Brett Atkinson, Chris Deliso, Steve Fallon, Will Gourlay, Jessica Lee, Virginia Maxwell, Tom Spurling

Binding
Paperback

Pages
392

Publisher
Lonely Planet

ISBN #
1742202829

EAN Code
9781742202822

ISBN #
8

Strategies for Effective Maintenance: A Guide for Process Criticality Assessment and Maintenance Schedule Setting Using a Qualitative Approach

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This guide sets out the underlying principles for effective maintenance, then provides decision aids and logic flow diagrams to help readers arrive at appropriate conclusions for their own situation.IChemE, the Institution of Chemical Engineers, is the center for chemical, biochemical and process en...

Author
Mike Briggs, Chris Atkinson

Binding
Paperback

Pages
800

Publisher
Inst of Chemical Engineers UK

ISBN #
0852954352

EAN Code
9780852954355

ISBN #
4

Lonely Planet Turkey (Travel Guide)

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#1 best-selling guide to Turkey* Lonely Planet Turkey is your passport to all the most relevant and up-to-date advice on what to see, what to skip, and what hidden discoveries await you. Ride a hot-air balloon over Cappadocia's honeycomb landscapes, walk amid the ancient ruins of Ephesus, or witness...

Author
Lonely Planet, James Bainbridge, Brett Atkinson, Chris Deliso, Steve Fallon, Will Gourlay, Jessica Lee, Virginia Maxwell, Tom Spurling

Binding
Paperback

Pages
704

Publisher
Lonely Planet

ISBN #
1742200397

EAN Code
9781742200392

ISBN #
3

It's Never Too Late: Creating the Life of Your Dreams

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You are NEVER too late! What does it take to go from a convicted drug addict without a penny in your pocket to a successful millionaire businessman, whose passion is helping other people turn their lives around? There is a secret, but it may not be what you think! In It's Never Too Late, the Atkinso...

Author
Chris Atkinson, Debbie Atkinson

Binding
Paperback

Pages
216

Publisher
Next Century Publishing

ISBN #
1629038288

EAN Code
9781629038285

ISBN #
1

Lonely Planet Turquia (Travel Guide) (Spanish Edition)

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Spanish language edition of Lonely Planet's Turkey guidebook.

Author
Lonely Planet, James Bainbridge, Brett Atkinson, Chris Deliso, Steve Fallon, Will Gourlay, Jessica Lee, Virginia Maxwell, Tom Spurling

Binding
Paperback

Pages
704

Publisher
Lonely Planet

ISBN #
8408118102

EAN Code
9788408118107

ISBN #
9

Us Patents

Error Reduction In Semiconductor Processes
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US Patent:

6848066, Jan 25, 2005
Filed:

Aug 4, 2003
Appl. No.:

10/634008
Inventors:

Chris D. Atkinson - Lewisville TX, US
Keith W. Melcher - McKinney TX, US
Richard L. Guldi - Dallas TX, US
Assignee:

Texas Instruments Incorporated - Dallas TX
International Classification:

G01R 3128
US Classification:

714724, 430 30
Abstract:

A photolithography system includes a photolithography tool that includes a stage upon which a semiconductor wafer is mounted. The tool is operable to move the stage to automatically focus a pre-determined image on a surface of the semiconductor wafer. The tool is further operable to log movements of the stage. The system also includes an automation host computer operable to poll the photolithography tool to obtain data reflecting the logged movements of the stage. The automation host computer is further operable to analyze the data and compare the data to pre-determined error conditions. The host computer also takes a pre-determined action, including sending an electronic mail message to the personal computers of relevant line personnel, in the event the data meets the pre-determined error conditions.

System And Method For Exposure Of Partial Edge Die
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US Patent:

7374866, May 20, 2008
Filed:

Oct 8, 2004
Appl. No.:

10/961939
Inventors:

Chris D. Atkinson - Lewisville TX, US
Richard L. Guldi - Dallas TX, US
Shangting Detweiler - Dallas TX, US
Assignee:

Texas Instruments Incorporated - Dallas TX
International Classification:

G03F 7/00
US Classification:

430313, 430396
Abstract:

According to one embodiment of the present invention, a method of forming a semiconductor device includes forming a photoresist layer on a surface of a wafer. The wafer includes an array of die that includes a plurality of complete die and at least one partial edge die. The wafer has an edge that has a substantially rounded profile causing undersized patterns in semiconductor devices formed on partial edge die. A first exposure intensity is assigned to a first group of die on the surface of the wafer. The first group of die includes a group of complete die, and the first exposure intensity is assigned based at least in part on the location of the first group of die on the surface of the wafer. A second exposure intensity is assigned to a second group of die on the surface of the wafer. The second group of die includes at least one partial edge die.

Method And Apparatus For Cassette Integrity Testing Using A Wafer Sorter
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US Patent:

7596456, Sep 29, 2009
Filed:

Nov 18, 2005
Appl. No.:

11/282997
Inventors:

Kelly C. Mollenkopf - McKinney TX, US
Chris D. Atkinson - Lewisville TX, US
Richard L. Guldi - Dallas TX, US
Assignee:

Texas Instruments Incorporated - Dallas TX
International Classification:

G01B 3/00
G01B 5/00
G01B 3/44
G01B 3/52
G01N 37/00
US Classification:

702 34, 702 33, 702 82
Abstract:

A system and methods for the evaluation of the integrity of a wafer cassette and the disposition thereof are based upon evaluation of wafer measurement data obtained using a wafer sorter cassette mapping system utilized in-line during wafer sorting operations. In one embodiment, wafers are placed into slots in the wafer cassette. A wafer sorter cassette mapping sensor is scanned over the wafers in the wafer cassette. The positions of the wafers are measured while scanning the sensor over the wafers. The wafer position measurements are evaluated using a modeling system to determine slot positions, and a determination of the integrity of the cassette is generated. If the integrity determination indicates that the cassette is deformed beyond a predetermined value, the cassette is replaced. The measurement data may be stored in a data base for further trend analysis or for replacement forecasting.

By-Die-Exposure For Patterning Of Holes In Edge Die
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US Patent:

8273523, Sep 25, 2012
Filed:

Dec 28, 2006
Appl. No.:

11/617130
Inventors:

Shangting Detweiler - Dallas TX, US
Basab Chatterjee - Allen TX, US
Chris D. Atkinson - Lewisville TX, US
Richard L. Guldi - Dallas TX, US
Assignee:

Texas Instruments Incorporated - Dallas TX
International Classification:

G03F 7/20
US Classification:

430313
Abstract:

In accordance with the invention, there are semiconductor devices and methods of making semiconductor devices and holes. The method of making a semiconductor device can comprise forming a photoresist layer over a surface of a wafer, wherein the wafer comprises an edge that has a substantially rounded profile, an array of dies, and at least one edge die. The method can also comprise dividing a shot area into a plurality of shot portions and assigning a blind ID to each of the plurality of shot portions. The method can further comprise identifying one or more edge shot portions on the edge of the wafer for additional exposure; and exposing one or more times identified one or more edge shot portions on the edge of the wafer and blocking non-identified one or more non-edge shot portions.

Error Reduction In Semiconductor Processes
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US Patent:

20030068833, Apr 10, 2003
Filed:

Oct 5, 2001
Appl. No.:

09/972497
Inventors:

Chris Atkinson - Lewisville TX, US
Keith Melcher - McKinney TX, US
Richard Guldi - Dallas TX, US
International Classification:

H01L021/00
H01L021/66
G01R031/26
US Classification:

438/007000, 438/014000
Abstract:

A photolithography system includes a photolithography tool that includes a stage upon which a semiconductor wafer is mounted. The tool is operable to move the stage to automatically focus a pre-determined image on a surface of the semiconductor wafer. The tool is further operable to log movements of the stage. The system also includes an automation host computer operable to poll the photolithography tool to obtain data reflecting the logged movements of the stage. The automation host computer is further operable to analyze the data and compare the data to pre-determined error conditions. The host computer also takes a pre-determined action, including sending an electronic mail message to the personal computers of relevant line personnel, in the event the data meets the pre-determined error conditions.

System And Method For Analyzing A Light Beam Of A Wafer Inspection Tool Or An Exposure Tool
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US Patent:

20080056557, Mar 6, 2008
Filed:

Aug 31, 2006
Appl. No.:

11/514798
Inventors:

Chris Dale Atkinson - Lewisville TX, US
Richard L. Guldi - Dallas TX, US
International Classification:

G06K 9/00
US Classification:

382144
Abstract:

A system operable to detect a light beam generated by a light source includes a substrate that comprises a wafer operable to be inspected by a wafer inspection tool or exposed by an exposure tool. One or more image sensors are disposed outwardly from the substrate. An image sensor of the one or more image sensors is operable to detect a light beam and generate a sensor signal representing the detected light beam.

Isbn (Books And Publications)

Strategies for Effective Maintenance

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Author
Chris Atkinson

ISBN #
0852954352

Myspace

Chris Atkinson

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Locality:

Las Vegas

Gender:

Male

Birthday:

1944

Chris Atkinson

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Locality:

Millville, New Jersey

Gender:

Male

Birthday:

1943

Chris Atkinson

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Locality:

ROCKLIN, CALIFORNIA

Gender:

Male

Birthday:

1946

chris atkinson

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Locality:

Truckee, California

Gender:

Male

Birthday:

1939

Chris Atkinson

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Locality:

Paignton, Southwest

Gender:

Male

Birthday:

1947

Chris Atkinson

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Locality:

Orange Park, Florida

Gender:

Male

Birthday:

1946

News

Abdel Nader's jumper gives No. 11 Iowa State much-needed road win at No. 22 ...

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Canisius stormed back by making four 3-pointers and two free throws in the final 1:02 of regulation.Chris Atkinson (13 points) made both of the free throws during that stretchand also canned two 3-pointers including the game-tying triple with 12 seconds left that put the game into overtime.
Date: Dec 22, 2015
Category: Sports
Source: Google

Youtube

DC SHOES: BLOCK & ATKINSON, RWD PRACTICE

... rally driver Chris Atkinson. From more on Block and DC Rally, For ...

Duration:

3m 20s

Driver Special: Chris Atkinson @ Coates Hire ...

Watch LIVE rally! All stages of every rally live or on demand with liv...

Duration:

8m 23s

The Legacy and history of Subaru World Rally ...

In this documentary I will be talking about how The Subaru World Rally...

Duration:

10m 2s

Chris Atkinson - Subaru Impreza WRC S11 - Fin...

Chris Atkinson - Subaru Impreza WRC S11 - Finland 2005 SS18 Kuohu.

Duration:

3m 59s

Chris Atkinson vs Adam Wong - The Fight Proje...

Chris Atkinson (Ryano Belfast) vs Adam Wong (Next-Gen/IMMA) Amateur MM...

Duration:

7m 26s

WRC Mexico 2012: Ken Block and Chris Atkinson...

Rally Mexico is one of the best rallies of the year: fast, challenging...

Duration:

3m 10s

Plaxo

Chris Atkinson

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Spring Hill, TN

Chris Atkinson

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CEO at Atkinson LLC

Chris Atkinson

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Shaw

Classmates

Chris Atkinson

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Schools:

Pea Ridge Elementary School Pace FL 1997-2001

Community:

Carrie Holt, Scott Posey, Pamala Lane

Chris Atkinson

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Schools:

Pine Mountain Middle School Kennesaw GA 1982-1986

Chris Atkinson

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Schools:

Pine Mountain Middle School Kennesaw GA 1983-1987

Community:

Jim Duncan

Chris Atkinson

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Schools:

Clarkdale Attendance Center Meridian MS 1983-1987

Community:

Terry Rice

Chris Atkinson

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Schools:

Hampden Elementary School 55 Baltimore MD 1977-1980

Community:

Raymond Romero, Rose Tafoya

Chris Atkinson

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Schools:

Advanced Technologies Academy Las Vegas NV 2000-2004

Community:

Tracy Shelton, Pamela Allgood, Howard Yuan, Shawn Stone, Alicia Smith

Chris Atkinson (MacBain)

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Schools:

University of California in Davis Davis CA 1967-1971

Community:

Marianne Gomez, Abdul Ali, Patrick Kelly, Zarka Popovic

Chris Atkinson

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Schools:

Vista Grande Elementary School Danville CA 1965-1967, Gehringer Elementary School Oakley CA 1968-1970, Oakley Elementary School Oakley CA 1971-1974, La Paloma High School Brentwood CA 1976-1978

Community:

William Miller, Bill Jakeman