Christine M Bui

US Patent:

20170131348, May 11, 2017

Filed:

Nov 11, 2015

Appl. No.:

14/938835

Inventors:

Hai Dau - San Ramon CA, US
Lim Hooi Weng - Singapore, SG
Kothandan Shanmugam - Singapore, SG
Christine Bui - Gilroy CA, US

International Classification:

G01R 31/28
G01R 1/067

Abstract:

In one embodiment, the present invention includes an interface apparatus for semiconductor testing. The interface apparatus comprises a housing substrate and two product substrates. The first product substrate has a first micro-scale conductive pattern and is situated within a first opening of the housing substrate. The second product substrate has a second micro-scale conductive pattern and is situated within a second opening of the housing substrate. The first and the second micro-scale conductive patterns are aligned to a conductive semiconductor wafer pattern using a continuous translucent media having targets corresponding to the conductive semiconductor wafer pattern.

US Patent:

20170093101, Mar 30, 2017

Filed:

Sep 24, 2015

Appl. No.:

14/864823

Inventors:

Hai Dau - San Ramon CA, US
Lim Hooi Weng - Singapore, SG
Kothandan Shanmugam - Singapore, SG
Christine Bui - Gilroy CA, US

International Classification:

H01R 27/02
H01R 43/20
H01R 43/02

Abstract:

In one embodiment, the present invention includes an interface apparatus for semiconductor testing. The interface apparatus includes a housing. The housing includes a lower housing substrate and an upper housing substrate. The lower housing substrate has a plurality of apertures arranged according to a fine pitch, and the upper housing substrate has a plurality of apertures arranged according to a coarse pitch. A plurality of wires passes through the plurality of apertures from the lower housing substrate to the upper housing substrate. Each wire has plated conductive ends emanating from opposing sides of the housing. The plurality of apertures of the lower housing substrate corresponds to the plurality of apertures of the upper housing substrate. The interface apparatus transforms a pattern having a course pitch to a pattern having a fine pitch.

Address:

12805 Bissonnet St APT 215, Houston, TX 77099

VIN:

JHLRE38347C051053

Make:

HONDA

Model:

CR-V

Year:

2007