Emerson Process Management - Austin, TX since Feb 2013
Software Engineer
Johns Hopkins University Applied Physics Laboratory Apr 2009 - Feb 2013
Systems Engineer
SpaceWorks Engineering, Inc. May 2008 - Dec 2008
Intern - Engineering Economics Group
Appelrouth Tutoring Sep 2007 - Dec 2008
Tutor
Education:
The Johns Hopkins University 2010 - 2012
Masters of Science, Systems Engineering
Georgia Institute of Technology 2004 - 2008
Bachelor of Science, Aerospace Engineering, Management (Operations Certificate)
Skills:
Matlab Vitech Core Systems Engineering Engineering System Testing Data Analysis Systems Analysis Presentation Development Analyst Briefings Technical Writing Simulations Defense Testing Microsoft Office Leadership Integration Industrial Ethernet
Certifications:
Astqb Icagile Istqb Foundation Level Icagile Certified Professional - Agile Testing (Icp-Tst)
Feb 2012 to 2000 Mortgage Closer IIIJ&S Title & Escrow, LLC Annandale, VA Feb 2009 to Dec 2011 Processor
Education:
University of Illinois at Urbana-Champaign Urbana, IL 2004 to 2008 Bachelor of Arts in Sociology
Skills:
Microsoft Office, UNIFI Application, Lotus Notes, Loan to Value, Debt to Income Ratios, Loan Product Pricing, Ability to Repay, Credit Risk, Income Analysis, RESPA Guidelines, State Specific Mortgage Laws, Title Examination, Appraisal Analysis
Apr 2009 to 2000 Associate Professional Staff ISpaceWorks Engineering Atlanta, GA May 2008 to Dec 2008 Summer and Fall Intern - Engineering Economics GroupAppelrouth Tutoring Atlanta, GA Sep 2007 to Dec 2008 TutorTheta Xi Beta Alpha Atlanta, GA Mar 2006 to May 2006 Junior Steward
Education:
Johns Hopkins University Baltimore, MD 2010 to 2012 MS in Systems EngineeringGeorgia Institute of Technology Atlanta, GA 2004 to 2008 BS in Aerospace EngineeringGeorgia Institute of Technology Atlanta, GA 2004 to 2008 BS in Management
- Round Rock TX, US Aaron C. Jones - Austin TX, US Christopher Cho - Round Rock TX, US
International Classification:
G05B 19/418 G06F 13/20
Abstract:
An Ethernet I/O card (EIOC) scanner device facilitates configuration of a process control system to enable improved integration of EIOC-enabled field devices (and associated field device variables) into the process control system. Specifically, the EIOC scanner may: (i) analyze decoder files for EIOC-enabled field devices to automatically identify field device variables that the EIOC-enabled field devices are configured to transmit or receive; and (ii) quickly and easily facilitate a configuration of the process control system to integrate into the process control system the EIOC-enabled field devices and any associated field device variables identified by the EIOC scanner.