Emerson Process Management - Austin, TX since Feb 2013
Software Engineer
Johns Hopkins University Applied Physics Laboratory Apr 2009 - Feb 2013
Systems Engineer
SpaceWorks Engineering, Inc. May 2008 - Dec 2008
Intern - Engineering Economics Group
Appelrouth Tutoring Sep 2007 - Dec 2008
Tutor
Education:
The Johns Hopkins University 2010 - 2012
Masters of Science, Systems Engineering
Georgia Institute of Technology 2004 - 2008
Bachelor of Science, Aerospace Engineering, Management (Operations Certificate)
Skills:
Matlab Vitech Core Systems Engineering Engineering System Testing Data Analysis Systems Analysis Presentation Development Analyst Briefings Technical Writing Simulations Defense Testing Microsoft Office Leadership Integration Industrial Ethernet
Certifications:
Astqb Icagile Istqb Foundation Level Icagile Certified Professional - Agile Testing (Icp-Tst)
Jersey Mike's Subs New Braunfels, TX 2012 to 2014 Multi-Unit Franchise Business OwnerLiberty Tax Service New Braunfels, TX 2006 to 2012 Multi-Unit Franchise Business OwnerTexas State University San Marcos San Marcos, TX 2007 to 2008 University Graduate Teaching AssistantKeller Williams/ ERA Realty New Braunfels, TX 2005 to 2008 Real Estate Agent and BrokerUnited States Army Doha 2001 to 2005 Military LeaderUnited States Army
2001 to 2005 College Professor
Education:
Texas State University San Marcos Baccalaureate in Teacher Education
- Round Rock TX, US Aaron C. Jones - Austin TX, US Christopher Cho - Round Rock TX, US
International Classification:
G05B 19/418 G06F 13/20
Abstract:
An Ethernet I/O card (EIOC) scanner device facilitates configuration of a process control system to enable improved integration of EIOC-enabled field devices (and associated field device variables) into the process control system. Specifically, the EIOC scanner may: (i) analyze decoder files for EIOC-enabled field devices to automatically identify field device variables that the EIOC-enabled field devices are configured to transmit or receive; and (ii) quickly and easily facilitate a configuration of the process control system to integrate into the process control system the EIOC-enabled field devices and any associated field device variables identified by the EIOC scanner.