Christopher B Dix

US Patent:

20090037160, Feb 5, 2009

Filed:

Jul 31, 2007

Appl. No.:

11/831876

Inventors:

Christopher W. Dix - Hillsboro OR, US

International Classification:

G06F 17/50

US Classification:

703 14

Abstract:

In accordance with an embodiment of the present invention, a method of serving IBIS data may include determining a circuit specified for signal integrity simulation. IBIS data may be obtained for the circuit specified, from which polynomials may be determined to be representative of at least a portion of the IBIS data. The polynomial information determined may be stored in a file with indexing for enabling its subsequent selective retrieval by way of a request for the IBIS data for the specified circuit.

US Patent:

7187157, Mar 6, 2007

Filed:

Dec 5, 2003

Appl. No.:

10/728685

Inventors:

Christopher W. Dix - Hillsboro OR, US

Assignee:

Lattice Semiconductor Corporation - Hillsboro OR

International Classification:

G05F 1/40
H02H 7/00

US Classification:

323271

Abstract:

In accordance with an embodiment of the present invention, two transistors are simultaneously controlled by a controller to control the application of power to a load and monitor a voltage level at the load. The controller may control the application of power to a number of loads simultaneously and may further provide voltage tracking for the loads.