Christopher Anthony Kirby

Address:

217 Hitching Post Dr, Bel Air, MD 21014

VIN:

JM1CR293670141497

Make:

MAZD

Model:

5

Year:

2007

US Patent:

20060138604, Jun 29, 2006

Filed:

Dec 27, 2004

Appl. No.:

11/020270

Inventors:

Christopher Kirby - Gambrills MD, US
Robert Horner - Severn MD, US
Harlan Cramer - Columbia MD, US
Robert Howell - Silver Spring MD, US
Robert Tranchini - Ellicott City MD, US
Gregory DeSalvo - Joppa MD, US
Gilbert Dix - Annapolis MD, US
Jeremiah Horner - Glen Burnie MD, US

Assignee:

NORTHROP GRUMMAN CORPORATION - Los Angles CA

International Classification:

H01L 23/58

US Classification:

257640000

Abstract:

An improved dielectric suitable for use in electronic and micro-electromechanical (MEMS) components. The dielectric includes silicon nitride having a percentage of Si:H bonds greater than a percentage of N:H bonds, in order to reduce the level of charge trapping of the silicon nitride.

US Patent:

20140061833, Mar 6, 2014

Filed:

Sep 5, 2012

Appl. No.:

13/603788

Inventors:

Thomas J. Knight - Silver Spring MD, US
Christopher F. Kirby - Gambrills MD, US

Assignee:

NORTHROP GRUMMAN SYSTEMS CORPORATION - Los Angeles CA

International Classification:

H01L 31/0232
H01L 27/144

US Classification:

257432, 257E31127, 257E27127

Abstract:

Photo-conducting infrared sensors are provided including a substrate (e.g., silicon) with one or more trenches formed on a first surface. An infrared-reflective film can be deposited directly or indirectly onto and conforming in shape with the first surface of the substrate. A lead chalcogenide film can be deposited directly or indirectly over the top of the infrared-reflective film and conforming in shape with the first surface of the substrate. Accordingly, the infrared-reflective film is directly or indirectly sandwiched between the substrate and the lead chalcogenide film.

US Patent:

20200144114, May 7, 2020

Filed:

Nov 1, 2018

Appl. No.:

16/178306

Inventors:

BRIAN PAUL WAGNER - BALTIMORE MD, US
CHRISTOPHER F. KIRBY - GAMBRILLS MD, US
MICHAEL RENNIE - ASHLAND VA, US
JAMES T. KELLIHER - ELKRIDGE MD, US

Assignee:

NORTHROP GRUMMAN SYSTEMS CORPORATION - FALLS CHURCH VA

International Classification:

H01L 21/768
H01L 23/532
H01L 21/02

Abstract:

A method is provided of forming a superconductor device interconnect structure. The method comprises forming a first dielectric layer overlying a substrate and forming a superconducting interconnect element in the first dielectric layer. The superconducting interconnect element includes a top surface aligned with a top surface of the first dielectric layer to form a first interconnect layer. The superconductor device interconnect structure is moved into a dielectric deposition chamber. The method further comprises performing a cleaning process on a top surface of the first interconnect layer in the dielectric deposition chamber to remove oxidization from a top surface of the first interconnect layer, and depositing a second dielectric layer over the first interconnect layer in the dielectric deposition chamber.

US Patent:

20180351072, Dec 6, 2018

Filed:

Jun 2, 2017

Appl. No.:

15/612326

Inventors:

CHRISTOPHER F. KIRBY - GAMBRILLS MD, US
VIVIEN M. LUU - LINTHICUM MD, US
MICHAEL RENNIE - ASHLAND VA, US
SEAN R. MCLAUGHLIN - SEVERN MD, US

Assignee:

NORTHROP GRUMMAN SYSTEMS CORPORATION - FALLS CHURCH VA

International Classification:

H01L 39/24
H01L 21/768
H01L 21/02
H01L 23/522
H01L 23/532

Abstract:

A method of forming a superconductor interconnect structure is disclosed. The method includes forming a dielectric layer overlying a substrate, forming an interconnect opening in the dielectric layer, and moving the substrate to a deposition chamber. The method further includes depositing a superconducting metal in the interconnect opening, by performing a series of superconducting deposition and cooling processes to maintain a chamber temperature at or below a predetermined temperature until the superconducting metal has a desired thickness, to form a superconducting element in the superconductor interconnect structure.

US Patent:

20180337138, Nov 22, 2018

Filed:

May 17, 2017

Appl. No.:

15/597565

Inventors:

VIVIEN LUU - LINTHICUM MD, US
CHRISTOPHER F. KIRBY - GAMBRILLS MD, US
BRIAN WAGNER - BALTIMORE MD, US
MICHAEL RENNIE - ASHLAND VA, US

Assignee:

NORTHROP GRUMMAN SYSTEMS CORPORATION - FALLS CHURCH VA

International Classification:

H01L 23/532
H01L 23/522
H01L 21/768
H01L 21/02

Abstract:

A method is provided of forming a superconductor interconnect structure. The method comprises forming a dielectric layer overlying a substrate, forming an interconnect opening in the dielectric layer, and moving the substrate to a deposition chamber. The method further comprises performing a cleaning process on the top surface of the dielectric layer and in the interconnect opening while in the deposition chamber, and depositing a superconducting metal in the interconnect opening while in the deposition chamber to form a superconducting element in the superconductor interconnect structure.

US Patent:

20180151430, May 31, 2018

Filed:

Nov 28, 2016

Appl. No.:

15/362400

Inventors:

Christopher F. KIRBY - Gambrills MD, US
Michael Rennie - Ashland VA, US
Daniel J. O'Donnell - Manassas VA, US
Sandro J. Di Giacomo - Ellicott City MD, US

Assignee:

NORTHROP GRUMMAN SYSTEMS CORPORATION - FALLS CHURCH VA

International Classification:

H01L 21/768
H01L 39/24
H01L 39/12
H01L 21/02
H01L 21/027
H01L 21/311
H01L 21/321
H01L 23/528
H01L 23/522
H01L 23/532
H01P 3/08
H01P 11/00
H01L 23/66

Abstract:

A method of forming a superconductor structure is provided. The method comprises forming a superconducting element in a first dielectric layer that has a top surface aligned with the top surface of the first dielectric layer, forming a second dielectric layer over the first dielectric layer and the superconducting element, and forming an opening in the second dielectric layer to a top surface of the superconducting element. The method also comprises performing a cleaning process on the top surface of the superconducting element to remove oxides formed on the top surface of the superconducting element at a first processing stage, forming a protective barrier over the top surface of the superconducting element, and moving the superconductor structure to a second processing stage for further processing.

US Patent:

20180138389, May 17, 2018

Filed:

Nov 15, 2016

Appl. No.:

15/351755

Inventors:

CHRISTOPHER F. KIRBY - GAMBRILLS MD, US
MICHAEL RENNIE - MECHANICSVILLE VA, US
DANIEL J. O'DONNELL - MANASSAS MD, US

Assignee:

NORTHROP GRUMMAN SYSTEMS CORPORATION - FALLS CHURCH VA

International Classification:

H01L 39/24
H01L 39/12
H01L 39/02

Abstract:

A method of forming a superconductor device structure is disclosed. The method comprises forming a base electrode in a first dielectric layer, forming a junction material stack over the base electrode, forming a hardmask over the junction material stack, etching away a portion of the junction material stack to form a Josephson junction (JJ) over the base electrode, and depositing a second dielectric layer over the hardmask, the JJ, the base electrode and the first dielectric layer. The method additionally comprises forming a first contact through the second dielectric layer to the base electrode to electrically couple the first contact to a first end of the JJ, and forming a second contact through the second dielectric layer and the hardmask to electrically coupled the second contact to a second end of the JJ.

US Patent:

20180062061, Mar 1, 2018

Filed:

Aug 23, 2016

Appl. No.:

15/244827

Inventors:

CHRISTOPHER F. KIRBY - GAMBRILLS MD, US
MICHAEL RENNIE - ASHLAND VA, US
AURELIUS L. GRANINGER - SYKESVILLE MD, US

Assignee:

NORTHROP GRUMMAN SYSTEMS CORPORATION - FALLS CHURCH VA

International Classification:

H01L 39/24
H01L 39/02

Abstract:

A method is provided of forming a superconductor device interconnect structure. The method includes forming a first high temperature dielectric layer overlying a substrate, forming a base electrode in the first high temperature dielectric layer with the base electrode having a top surface aligned with the top surface of the first high temperature dielectric layer, and depositing a second high temperature dielectric layer over the first high temperature dielectric layer and the base electrode. The method further comprises forming a first contact through the second dielectric layer to a first end of the base electrode, forming a Josephson junction (JJ) overlying and in contact with the first contact, and forming a second contact through the second dielectric layer to a second end of the base electrode.