Christopher J Manning

US Patent:

6469790, Oct 22, 2002

Filed:

Apr 26, 1999

Appl. No.:

09/299022

Inventors:

Christopher J. Manning - Moscow ID 83840

International Classification:

G01B 902

US Classification:

356451, 356455

Abstract:

A novel variation of Michelsons interferometer uses tilt- and shear-compensation optics to allow various mirror motions to produce variation of path difference. The tilt-compensation mechanism consists of two complementary reflections from a single plane mirror and, in some cases, the beamsplitter, to produce a beam having a constant angle of propagation, typically the same as the input beam. Using a retroreflector to invert the image of a single plane mirror or a sequence of plane mirrors before the second reflections produces complementary reflections. A particularly efficient embodiment of the present invention uses one or more balanced disk-shaped mirrors to effect very rapid variation of path difference by nutation or precession. Other advantages of tilt-compensation include photometric stability. This interferometer has applications in spectrometry, spectral imaging and metrology.

US Patent:

6967722, Nov 22, 2005

Filed:

Oct 21, 2002

Appl. No.:

10/277439

Inventors:

Christopher J. Manning - Troy ID, US

International Classification:

G01B009/02

US Classification:

356452

Abstract:

The tilt-compensated interferometers of the present invention are novel variations of Michelson's interferometer that use tilt- and shear-compensation to provide excellent photometric accuracy even when there are imperfections in the scanning motion used to produce variation of path difference. The tilt-compensation mechanism of the present invention consists of antiparallel reflections from a beamsplitter element and a roof reflector element, which elements are held rigidly in alignment. Several particularly useful embodiments of the invention are described. Other advantages of the present invention include photometric stability and reduced cost because manual alignment is not required. This interferometer has applications in spectrometry, spectral imaging and metrology.

US Patent:

7224464, May 29, 2007

Filed:

Aug 2, 2001

Appl. No.:

09/922363

Inventors:

Christopher J. Manning - Troy ID, US

International Classification:

G01B 9/02

US Classification:

356451

Abstract:

A novel tilt-compensated interferometer geometry is described. The design uses tilt- and shear-compensation optics to simultaneously maintain high throughput and precise interferometric alignment, even in the presence of non-ideal scanning motions. The tilt-compensation mechanism consists of a novel beamsplitter/reflector assembly that produces two anti-parallel beams. A variety of enhancements to the basic design are described, providing a family of related interferometer designs. These interferometers have applications in spectrometry, spectral imaging and metrology.

US Patent:

20060238769, Oct 26, 2006

Filed:

Nov 21, 2005

Appl. No.:

11/284983

Inventors:

Christopher Manning - Troy ID, US

International Classification:

G01B 9/02
G01J 3/45

US Classification:

356455000

Abstract:

A novel variation of Michelson's interferometer uses tilt- and shear-compensation optics together with a beamsplitter and parallel reflector assembly to allow various mirror motions to produce variation of path difference. The tilt-compensation mechanism consists of two complementary reflections from a single plane mirror to produce a beam having a constant angle of propagation, typically the same as the input beam. Using a retroreflector to invert the image of the single plane mirror before the second reflection produces the complementary reflections. A particularly efficient embodiment of the present invention uses a balanced disk-shaped mirror to effect very rapid variation of path difference by nutation or precession. Other advantages of tilt-compensation include photometric stability. This interferometer has applications in spectrometry, spectral imaging and metrology.

US Patent:

20080068612, Mar 20, 2008

Filed:

May 26, 2007

Appl. No.:

11/805897

Inventors:

Christopher Manning - Troy ID, US

International Classification:

G01J 3/45

US Classification:

356452000

Abstract:

A novel tilt-insensitive interferometer geometry is described. The design uses tilt-insensitive optics to simultaneously maintain high throughput and precise interferometric alignment, even in the presence of non-ideal scanning motions. A variety of enhancements to the basic design are described, providing a family of related interferometer designs. These spectrometers have applications in spectrometry, spectral imaging and metrology.

US Patent:

20080204757, Aug 28, 2008

Filed:

Aug 16, 2007

Appl. No.:

11/893750

Inventors:

Christopher Manning - Troy ID, US

International Classification:

G01B 9/02

US Classification:

356451

Abstract:

Novel spectrometer arrangements are described. They may employ a resin-based preconcentration system to sample chemical vapors. A field-widened interferometer modulates radiant energy. The signal generated by the interaction of the radiant energy with the sample is detected and processed by a computer. A variety of enhancements to the basic design are described, providing a family of related spectrometer designs. These spectrometers have applications in spectrometry, spectral imaging and metrology.

US Patent:

20120167698, Jul 5, 2012

Filed:

Aug 16, 2011

Appl. No.:

13/210854

Inventors:

Alexander van Geen - New York NY, US
Benjamin Bostick - New York NY, US
Christopher Manning - Troy ID, US

International Classification:

G01N 1/04

US Classification:

7386444

Abstract:

A groundwater sampling tool that includes an elongated hollow coring tube having a proximal end and a distal end for collecting groundwater and sediment; a Peltier element located in close proximity to a wall of the elongated hollow coring tube adapted to freeze groundwater and sediment collected by the elongated hollow coring tube.

US Patent:

61788228, Jan 30, 2001

Filed:

Nov 19, 1997

Appl. No.:

8/974385

Inventors:

Christopher J. Manning - Moscow ID

International Classification:

G01N 332

US Classification:

73668

Abstract:

Three or more frequency components are used as deformation waveforms to perturb a sample during spectroscopic measurement. Simultaneously measuring more than one frequency allows for multiplexing. Further, many frequencies insure that the optimal perturbation frequencies for a particular measurement are present. The multiplex advantage of a particular spectroscopic instrument may accrue simultaneously with a multiplex advantage in the characterization of the time dependence of the sample response.