Christopher J Webb

US Patent:

7643796, Jan 5, 2010

Filed:

Apr 12, 2006

Appl. No.:

11/402677

Inventors:

Christopher J. Webb - Scottsdale AZ, US

Assignee:

Honeywell International Inc. - Morristown NJ

International Classification:

H04B 7/00
H04B 7/14
H04B 17/00
G08B 1/08
G08C 17/02

US Classification:

455 412, 455 661, 455 6711, 3405391, 34087001

Abstract:

An apparatus includes at least one process element and a first transceiver configured to communicate with the at least one process element. The apparatus also includes a second transceiver configured to communicate wirelessly with the first transceiver and to communicate with a process control system. The process control system may transmit data to the at least one process element via the first transceiver and the second transceiver. The process control system may also receive data from the at least one process element via the first transceiver and the second transceiver.

US Patent:

20210333789, Oct 28, 2021

Filed:

Jul 8, 2021

Appl. No.:

17/370528

Inventors:

- Charlotte NC, US
Andrew Trenchard - Hampshire, GB
Christopher Webb - Scottsdale AZ, US

International Classification:

G05B 23/02

Abstract:

A method includes obtaining measurements associated with a plurality of controlled variables (CVs) and a plurality of manipulated variables (MVs). The method also includes detecting an irregular operating condition of a CV or an MV. The method also includes analyzing case specific operating conditions based on the irregular operating condition. The method further includes removing the irregular operating condition based on analyzing the case specific operating conditions.

US Patent:

20210263485, Aug 26, 2021

Filed:

Feb 20, 2020

Appl. No.:

16/796276

Inventors:

- MORRIS PLAINS NJ, US
Christopher J. Webb - Scottsdale AZ, US

International Classification:

G05B 13/04

Abstract:

A cascaded MPC system includes an upper tier controller and lower tier controller having stored constraints for controlling a process having manipulated variables (MVs), controlled variables (CVs), and conjoint manipulated variable (CMV). The upper tier passes a target value for the CMV to the lower tier which optimizes for determining a local optimal operating point for the MVs, CVs, and CMV, moves towards the target value starting at the CMVs local operating point, and optimizes for identifying of the constraints as selected constraint(s) when the moving is truncated, passes the selected constraint(s) to the upper tier which performs an overall optimization for the process using the selected constraint to generate an optimal value for the CMV that lower tier uses as a new CMV target value for redetermining updated local optimal operating points for the MVs, CVs, and CMV, and for controlling the process utilizing the updated operating points.

US Patent:

20210088988, Mar 25, 2021

Filed:

Aug 24, 2020

Appl. No.:

17/000478

Inventors:

- Morris Plains NJ, US
Sanjay Dave - Bangalore, IN
Christopher J. Webb - Scottsdale AZ, US
Michael Niemiec - Dexter MI, US
Mandar Vartak - Bangalore, IN
Sriram Hallihole - Bangalore, IN

International Classification:

G05B 13/04
G05B 19/4063
G05B 19/406
G05B 19/418
G05B 23/02

Abstract:

A method includes obtaining data identifying values of one or more controlled variables associated with an industrial process controller. The method also includes identifying periods when at least one of the one or more controlled variables has been moved to an associated limit by the controller. The method further includes, for each identified period, (i) identifying a standard deviation of predicted values for the associated controlled variable and (ii) determining a control giveaway value for the associated controlled variable based on the standard deviation. The control giveaway value is associated with an offset between the associated controlled variable's average value and the associated limit. In addition, the method includes identifying variances in the one or more controlled variables using the control giveaway values and generating a graphical display identifying one or more impacts or causes for at least some of the variances.

US Patent:

20200348629, Nov 5, 2020

Filed:

May 20, 2020

Appl. No.:

16/879243

Inventors:

- Morris Plains NJ, US
Andrew Trenchard - Romsey, GB
Christopher J. Webb - Scottsdale AZ, US
Matthew G. Grizzle - Phoenix AZ, US
Mandar Vartak - Bangalore, IN
Sriram Hallihole - Bangalore, IN

International Classification:

G05B 13/04
G05B 19/4063
G05B 19/406
G05B 19/418
G05B 23/02

Abstract:

A method includes obtaining data associated with operation of a model-based industrial process controller. The method also includes identifying at least one estimated impact of at least one operational problem of the industrial process controller, where each estimated impact is expressed in terms of a lost opportunity associated with operation of the industrial process controller. The method further includes presenting the at least one estimated impact to a user. The at least one estimated impact could include impacts associated with noise or variance in process variables used by the industrial process controller, misconfiguration of an optimizer in the industrial process controller, one or more limits on one or more process variables, a quality of at least one model used by the industrial process controller, a quality of one or more inferred properties used by the industrial process controller, or one or more process variables being dropped from use by the industrial process controller.

US Patent:

20180356773, Dec 13, 2018

Filed:

May 7, 2018

Appl. No.:

15/973272

Inventors:

- Morris Plains NJ, US
Sanjay K. Dave - Bangalore, IN
Christopher J. Webb - Scottsdale AZ, US
Michael Niemiec - Dexter MI, US
Mandar Vartak - Bangalore, IN
Sriram Hallihole - Bangalore, IN

International Classification:

G05B 13/04

Abstract:

A method includes obtaining data identifying values of one or more controlled variables associated with an industrial process controller. The method also includes identifying periods when at least one of the one or more controlled variables has been moved to an associated limit by the controller. The method further includes, for each identified period, (i) identifying a standard deviation of predicted values for the associated controlled variable and (ii) determining a control giveaway value for the associated controlled variable based on the standard deviation. The control giveaway value is associated with an offset between the associated controlled variable's average value and the associated limit. In addition, the method includes identifying variances in the one or more controlled variables using the control giveaway values and generating a graphical display identifying one or more impacts or causes for at least some of the variances.

US Patent:

20180356806, Dec 13, 2018

Filed:

May 7, 2018

Appl. No.:

15/972534

Inventors:

- Morris Plains NJ, US
Andrew John Trenchard - Romsey, GB
Christopher J. Webb - Scottsdale AZ, US
Matthew G. Grizzle - Phoenix AZ, US
Mandar Vartak - Bangalore, IN
Sriram Hallihole - Bangalore, IN

International Classification:

G05B 19/418

Abstract:

A method includes obtaining data associated with operation of a model-based industrial process controller. The method also includes identifying at least one estimated impact of at least one operational problem of the industrial process controller, where each estimated impact is expressed in terms of a lost opportunity associated with operation of the industrial process controller. The method further includes presenting the at least one estimated impact to a user. The at least one estimated impact could include impacts associated with noise or variance in process variables used by the industrial process controller, misconfiguration of an optimizer in the industrial process controller, one or more limits on one or more process variables, a quality of at least one model used by the industrial process controller, a quality of one or more inferred properties used by the industrial process controller, or one or more process variables being dropped from use by the industrial process controller.

US Patent:

20180356811, Dec 13, 2018

Filed:

May 7, 2018

Appl. No.:

15/972432

Inventors:

- Morris Plains NJ, US
Christopher J. Webb - Scottsdale AZ, US
Sanjay K. Dave - Bangalore, IN
Michael Niemiec - Dexter MI, US
Mandar Vartak - Bangalore, IN
Sriram Hallihole - Bangalore, IN

International Classification:

G05B 23/02

Abstract:

A method includes obtaining data identifying values of one or more process variables associated with an industrial process controller and identifying one or more constraint violations using the data. The method also includes, for each identified constraint violation, analyzing a behavior of the controller, a behavior of an industrial process being controlled, and how the controller was being used by at least one operator for a period of time. At least part of the period of time is prior to the identified constraint violation. The method further includes generating a graphical display based on the analysis, where the graphical display identifies one or more probable causes for at least one of the one or more constraint violations.