Chun N Wong

age ~59

from Lubbock, TX

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Also known as:

Chun L Ng
Nam Wong Chun
Nam Yiu Chun

Connected to:

Chun Wong Phones & Addresses

Lubbock, TX
Baltimore, MD
Round Rock, TX
Spring, TX

Work

Company:

Ng, Tam, Ko & Chan
Address:

Lawyers & Attorneys

Chun Wong - Lawyer

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Office:

Ng, Tam, Ko & Chan

ISLN:

919758214

Admitted:

1993

Isbn (Books And Publications)

Introduction to Mathematical Physics: Methods and Concepts

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Author
Chun Wa Wong

ISBN #
0195044738

Name / Title

Company / Classification

Phones & Addresses

Chun Wah Wong
Manager

CLEAN FUTURE ENTERPRISES, LLC

5850 San Felipe St STE 670, Houston, TX 77057

Chun Wah Wong
Manager

HWP REGRINDERS, LLC

5850 San Felipe St STE 670, Houston, TX 77057

Chun Wong

FLYING DUMPLING, LLC

Chun Wong
Owner, Manager

China Wok
Eating Place

9762 Groffs Ml Dr, Garrison, MD 21117
4109983655

Chun Wah Wong
Managing

RAINBOW PLASTICS SOLUTIONS, LLC
Nonclassifiable Establishments · Plastics Materials and Basic Shapes, Nsk · Whol Plastic Materials/Shapes

8303 SW Fwy STE 760, Houston, TX 77074
5850 San Felipe St, Houston, TX 77057

Chun Wah Wong
Manager

GREENHILL RECYCLING MANAGEMENT, LLC
Management Services · Management Services, Nsk

8303 SW Fwy STE 760, Houston, TX 77074
5850 San Felipe St, Houston, TX 77057

Chun Wong
Principal

Chino Buffet
Eating Place

13711 Westheimer Rd, Houston, TX 77077

Chun Ying Wong
President

FLASH ELECTRONICS INTERNATIONAL

Us Patents

System And Method For Detecting Structural Damage
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US Patent:

20050072234, Apr 7, 2005
Filed:

May 20, 2004
Appl. No.:

10/849571
Inventors:

Weidong Zhu - Elkridge MD, US
Guangyao Xu - Baltimore MD, US
Nengan Zheng - Baltimore MD, US
Benjamin Emory - Baltimore MD, US
Chun Wong - Lubbock TX, US
International Classification:

G01H001/14
G01M007/08
US Classification:

073579000, 073012010, 702056000
Abstract:

A system and method for detecting structural damage is provided that utilizes a general order perturbation methodology involving multiple perturbation parameters. The perturbation methodology is used iteratively in conjunction with an optimization method to identify the stiffness parameters of structures using natural frequencies and/or mode shape information. The stiffness parameters are then used to determine the location and extent of damage in a structure. A novel stochastic model is developed to model the random impact series produced manually or to generate a random impact series in a random impact device. The random impact series method or the random impact device can be used to excite a structure and generate vibration information used to obtain the stiffness parameters of the structure. The method or the device can also just be used for modal testing purposes. The random impact device is a high energy, random, and high signal-to-noise ratio system.

System And Method For Detecting Structural Damage
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US Patent:

20080294354, Nov 27, 2008
Filed:

May 16, 2008
Appl. No.:

12/153348
Inventors:

Weidong Zhu - Elkridge MD, US
Guangyao Xu - Baltimore MD, US
Nengan Zheng - Baltimore MD, US
Benjamin Haynes Emory - Baltimore MD, US
Chun Nam Wong - Lubbock TX, US
International Classification:

G01N 29/12
G01N 29/46
US Classification:

702 39, 702 56
Abstract:

A system and method for detecting structural damage is provided that utilizes a general order perturbation methodology involving multiple perturbation parameters. The perturbation methodology is used iteratively in conjunction with an optimization method to identify the stiffness parameters of structures using natural frequencies and/or mode shape information. The stiffness parameters are then used to determine the location and extent of damage in a structure. A novel stochastic model is developed to model the random impact series produced manually or to generate a random impact series in a random impact device. The random impact series method or the random impact device can be used to excite a structure and generate vibration information used to obtain the stiffness parameters of the structure. The method or the device can also just be used for modal testing purposes. The random impact device is a high energy, random, and high signal-to-noise ratio system.

License Records

Chun Wan Wong

License #:

0402053474

Category:

Professional Engineer License

Resumes

Chun Hang Wong

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Host

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Industry:

Hospitality

Work:

Disney Parks & Resorts
Host

Chun Fai Wong

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Industry:

Accounting

Education:

Tung Wah Group of Hospitals Kap Yan Directors' College 1992 - 1995
High school, General

Chun Ha Wong

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Chun Wong

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Chun Fai Frankie Wong

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Chun Chung Wong

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Chun Ho Wong

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Medicine Doctors

Chun T. Wong

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Specialties:

Gastroenterology

Work:

Total Chinatown Gastroenterology
98 E Broadway FL 6, New York, NY 10002
2129663316 (phone), 2129663317 (fax)

Education:

Medical School
New York University School of Medicine
Graduated: 1999

Procedures:

Colonoscopy
Electrocardiogram (EKG or ECG)
Sigmoidoscopy
Upper Gastrointestinal Endoscopy
Vaccine Administration

Conditions:

Constipation
Gastric Cancer
Gastritis and Duodenitis
Infectious Liver Disease
Liver Cancer

Languages:

Chinese
English
Spanish

Description:

Dr. Wong graduated from the New York University School of Medicine in 1999. He works in New York, NY and specializes in Gastroenterology. Dr. Wong is affiliated with New York Presbyterian Lower Manhattan Hospital.

Chun Tung Wong, New York NY

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Specialties:

Internal Medicine
Gastroenterology
Endocrinology, Diabetes & Metabolism

Work:

New York Downtown Med Assoc
170 William St, New York, NY 10038
Greater Houston Physicians Medical Association PLLC
9200 Pinecroft Dr, Shenandoah, TX 77380
Bellevue Hospital Center
462 1St Ave, New York, NY 10016

Education:

Brown University (1999)