Daniel B Collins

US Patent:

8428909, Apr 23, 2013

Filed:

Sep 19, 2008

Appl. No.:

12/233985

Inventors:

Daniel J. Collins - Maple Glen PA, US

Assignee:

Siemens Industry, Inc. - Alpharetta GA

International Classification:

G01D 18/00

US Classification:

702185, 702179

Abstract:

The present invention relates generally to statistics and calibration of instruments. More particularly, the invention encompasses the use of statistics to determine calibration of instruments. The present invention is also directed to a remote system for determination of re-calibration of instruments. The present invention also teaches the use of multiple statistical tests to determine need for calibration. The invention also includes a novel use of tests, such as, the F-Test, the Z-Test, to determine need for calibration. Furthermore, this invention relates to an alternate instrument scheme consisting of the use of redundant sensors and statistical analysis to avoid unnecessary calibrations and to detect sensors that are starting to drift before they go out of calibration. With this invention reduced calibration cost, increased data integrity, and reduced off-spec uncertainty is achieved.

US Patent:

20180100894, Apr 12, 2018

Filed:

Oct 7, 2016

Appl. No.:

15/287810

Inventors:

Larry Venetsky - Mount Laurel NJ, US
Ross Boczar - Feasterville PA, US
Russell Shannon - Ocean Gate NJ, US
Daniel Collins - Toms River NJ, US
George Lehaf - Holmdel NJ, US
Steven Singer - Bensalem PA, US

Assignee:

United States of America as represented by the Secretary of the Navy - Patuxent River MD

International Classification:

G01R 31/317

Abstract:

Disclosed here is a system which uses simulations of an electronic circuit and a classifier to create an optimized Test Program Set. A user provides a model of the circuit, including descriptions of common faults. Candidate test signals are simulated in the circuit, evaluated using a classifier and a fitness function which optimizes for fault detection and isolation, and evolved according to a genetic algorithm. The system records the best test signals and terminates after reaching a certain fitness, or after a certain time. The process generates necessary information for an optimized Test Program Set for a given Unit Under Test circuit. This allows test program sets to be generated for complex circuits in a largely automated manner.