Darryl Dewayne Walker

US Patent:

52668436, Nov 30, 1993

Filed:

Mar 16, 1993

Appl. No.:

8/032740

Inventors:

Darryl Walker - Dallas TX
Daniel F. McLaughlin - Dallas TX

Assignee:

Texas Instruments Incorporated - Dallas TX

International Classification:

H03K 301
H03K 17687

US Classification:

3072962

Abstract:

The described embodiments of the present invention provide a substrate slew circuit that eliminates electron injection. The slew circuit comprises a semiconductor substrate, at least one transistor and a control circuit. One of a source/drain of a first transistor in the slew circuit is connected to Vss, the other of the source/drain of the first transistor is connected to the gate and one of a source/drain of a second transistor, the other of the source/drain of the second transistor is connected to the substrate. A control circuit is connected to the gate of the first transistor for controlling the passage of voltage from the one of a source/drain of the first transistor to the substrate via the gate and the one of a source/drain of the second transistor. The sensitivity of the slew circuit can be made programmable by adding one or more more n-channel transistors in stacked diode configuration between the other of the source/drain of the first transistor and the substrate.

US Patent:

55766331, Nov 19, 1996

Filed:

Jun 7, 1995

Appl. No.:

8/484224

Inventors:

Robert N. Rountree - Plano TX
Dan Cline - Plano TX
Darryl G. Walker - Sugar Land TX
Francis Hii - Singapore, SG
David W. Bergman - Bedford TX

Assignee:

Texas Instruments Incorporated - Dallas TX

International Classification:

H03K 19003
G06F 1116

US Classification:

326 10

Abstract:

A circuit for selecting a block spare in a semiconductor device is designed with a programmable circuit (14), storing an internal address and producing an address match signal AM and a block select signal BS in response to first (A) and second (B) address signals and the internal address. A global spare circuit (28) produces a global spare select signal (GSS), in response to the address match signal. A block spare circuit (34) produces a block spare select signal (BSS), in response to the global spare select signal and the block select signal.

US Patent:

55089623, Apr 16, 1996

Filed:

Jun 29, 1994

Appl. No.:

8/267701

Inventors:

Daniel F. McLaughlin - Dallas TX
Darryl G. Walker - Sugar Land TX

Assignee:

Texas Instruments Incorporated - Dallas TX

International Classification:

G11C 1124

US Classification:

36518909

Abstract:

The plate voltage for a Dynamic Random Access Memory storage cell array is provided by two amplifiers. The first amplifier operates at a relatively low power level and compensates for leakage in the storage cell array, the compensation initiated by a departure of the plate from a nominal value which exceeds a preselected amount. The second amplifier operates at a higher power level and provides compensation for transients in the plate voltage resulting from the charging and discharging of the storage cells. Because the transients occur when the storage cells are accessed, the second amplifier is enabled only when a group of storage cells is accessed. In addition to operating at a higher power level, the second amplifier is more sensitive and responds to smaller excursions from the nominal voltage. Both the first and the second amplifiers have separate driver circuits for responding to excursions above and for responding to excursions below the nominal voltage.

US Patent:

53427998, Aug 30, 1994

Filed:

Feb 22, 1993

Appl. No.:

8/020486

Inventors:

Darryl Walker - Dallas TX
Daniel F. McLaughlin - Dallas TX

Assignee:

Texas Instruments Incorporated - Dallas TX

International Classification:

H01L 21335

US Classification:

437 51

Abstract:

The described embodiments of the present invention provide a substrate slew circuit that eliminates electron injection. The slew circuit comprises a semiconductor substrate, at least one transistor and a control circuit. One of source/drain of a first transistor (26) in the slew circuit is connected to Vss, the other of the source/drain of the first transistor (26) is connected to the substrate, or in another embodiment of the invention, to one of a source/drain of a second transistor (28), the gate and other of the source/drain of the second transistor (28) being connected to the substrate. A control circuit is connected to the gate of the first transistor for controlling the passage of voltage from the one of a source/drain of the first transistor (26) to the substrate via the gate and the one of a source/drain of the second transistor (28). The sensitivity of the slew circuit can be made programmable by adding p-channel transistors in stacked diode configuration between the other of the source/drain of the first transistor (26) and the substrate.

US Patent:

53131118, May 17, 1994

Filed:

Aug 11, 1993

Appl. No.:

8/105487

Inventors:

Darryl Walker - Dallas TX
Daniel F. McLaughlin - Dallas TX

Assignee:

Texas Instruments Incorporated - Dallas TX

International Classification:

H03K 301

US Classification:

3072962

Abstract:

The described embodiments of the present invention provide a substrate slew circuit that eliminates electron injection. The slew circuit comprises a semiconductor substrate, first and second transistors and a control circuit. One of a source/drain of the source/drain of the first transistor is connected to a reference voltage. One of a source/drain of the second transistor is connected to a gate of the first transistor, the other of the source/drain of the second transistor is coupled to receive a first voltage signal from a substrate pump. The control circuit is connected to the gate of the second transistor for controlling the passage of current from the other of the source/drain of the second transistor to the one of a source/drain of the second transistor.

US Patent:

55482252, Aug 20, 1996

Filed:

May 26, 1994

Appl. No.:

8/249499

Inventors:

Robert N. Rountree - Plano TX
Dan Cline - Plano TX
Darryl G. Walker - Sugar Land TX
Francis Hii - Toa Payoh, SG
David W. Bergman - Bedford TX

Assignee:

Texas Instruments Incorportated - Dallas TX

International Classification:

H03K 19003

US Classification:

326 13

Abstract:

A circuit for selecting a block spare in a semiconductor device is designed with a programmable circuit (14), storing an internal address and producing an address match signal AM and a block select signal BS in response to first (A) and second (B) address signals and the internal address. A global spare circuit (28) produces a global spare select signal (GSS), in response to the address match signal. A block spare circuit (34) produces a block spare select signal (BSS), in response to the global spare select signal and the block select signal.