David K Chen

US Patent:

7196009, Mar 27, 2007

Filed:

May 9, 2003

Appl. No.:

10/434772

Inventors:

Brian L. Bex - Camas WA, US
David K. Chen - Camas WA, US

Assignee:

SEH America, Inc. - Vancouver WA

International Classification:

H01L 21/302

US Classification:

438691, 438692, 438693, 451402, 451403

Abstract:

A method of fabricating a lapping carrier is provided that includes the steps of defining at least one opening extending through a workpiece that is sized to receive a wafer, and cryogenically tempering the workpiece to produce a lapping carrier. By cryogenically tempering the workpiece, the conversion of the crystalline structure of the workpiece to a martensite crystalline structure is enhanced, thereby improving the hardness of the lapping carrier. A lapping carrier is also provided that has a crystalline structure, of which at least 70% is a martensite crystalline structure. An apparatus for lapping a wafer is further provided that includes a hardened lapping carrier and at least one lapping plate proximate the lapping carrier for lapping wafer(s) disposed within the at least one opening defined by the lapping carrier.

US Patent:

20020123335, Sep 5, 2002

Filed:

Oct 31, 2001

Appl. No.:

09/999656

Inventors:

Michael Luna - Carnation WA, US
David Chen - San Carlos CA, US
Stephen Dusse - Woodside CA, US

International Classification:

H04M003/00

US Classification:

455/419000, 455/466000, 455/426000

Abstract:

A method and apparatus for provisioning a mobile station over a wireless network are described. The mobile station contains a browser to allow navigation of hypermedia content. The browser sends a request for provisioning content to a remote provisioning server via the wireless network. The request includes a network resource locator. In response, the provisioning server sends a markup language document via a wireless network to the mobile station, containing a reference to provisioning content. The browser retrieves the provisioning content based on the reference and stores the provisioning content in the mobile station. The provisioning content is used in the mobile station to enhance a capability of the mobile station.

US Patent:

20120109623, May 3, 2012

Filed:

Nov 1, 2010

Appl. No.:

12/916951

Inventors:

William B. Dolan - Kirkland WA, US
David L. Chen - Austin TX, US

Assignee:

Microsoft Corporation - Redmond WA

International Classification:

G06F 17/28

US Classification:

704 2

Abstract:

The subject disclosure generally describes a technology by which text and/or speech descriptions are collected by showing a stimulus such as video clips to contributors (e.g., of a crowd-sourcing service). The descriptions, which are in the language of each contributor's choice, are of the same stimulus and thus associated with one another. While each contributor may be monolingual, the technique allows for the collection of approximately bilingual data, since more than one language may be represented among the different contributors. The descriptions may be used as translation data for training a machine translation engine, and as paraphrase data (grouped by the same language) for training a machine paraphrasing system. Also described is evaluating the quality of a machine paraphrasing system via a distinctiveness metric.

US Patent:

20160200941, Jul 14, 2016

Filed:

Sep 8, 2014

Appl. No.:

14/916844

Inventors:

- Morristown NJ, US
Bright ZHANG - Shanghai, CN
Huifeng DUAN - Shanghai, CN
Wanchao JIANG - Shanghai, CN
Yunzi JIANG - Shanghai, CN
Zhe DING - Shanghai, CN
David K. Chen - Vancouver WA, US
Yanming SHEN - Shanghai, CN
Wei Jun WANG - Shanghai, CN

International Classification:

C09D 183/08

Abstract:

Poly fluorine-containing siloxane coatings having improved hydrophobic and oleophobic properties and solutions for creating such coatings are provided. In some embodiments, the coating includes a polymer having a plurality of Si—O—Si linkages; and at least two fluorine-containing moieties, each attached to at least one of the Si—O—Si linkages. Each fluorine-containing moiety independently includes a linking portion attached to a silicon of one of the Si—O—Si linkages, wherein the linking portion is of a formula selected from the group consisting of: —[CH]— where a is an integer from 1 to 10 and —[CH]CONH[CH]— where b and c are independently an integer from 0 to 10. Each fluorine-containing moiety also independently includes a fluorinated portion attached to the linking portion, wherein the fluorinated portion is selected from a fluorinated-alkyl group having 1-10 carbon atoms and a perfluoro-ether containing organic group.

US Patent:

20160155605, Jun 2, 2016

Filed:

Feb 8, 2016

Appl. No.:

15/018104

Inventors:

- Milpitas CA, US
David Chen - Portland OR, US
Vivekanand Kini - Sunnyvale CA, US
Hong Xiao - Pleasanton CA, US

International Classification:

H01J 37/28
H01J 37/04
H01J 37/26

Abstract:

A system for adaptive electron beam scanning may include an inspection sub-system configured to scan an electron beam across the surface of a sample. The inspection sub-system may include an electron beam source, a sample stage, a set of electron-optic elements, a detector assembly and a controller communicatively coupled to one or more portions of the inspection sub-system. The controller may assess one or more characteristics of one or more portions of an area of the sample for inspection and, responsive to the assessed one or more characteristics, adjust one or more scan parameters of the inspection sub-system.

US Patent:

20140319342, Oct 30, 2014

Filed:

Apr 23, 2014

Appl. No.:

14/260053

Inventors:

- Milpitas CA, US
David Chen - Portland OR, US
Vivekanand Kini - Sunnyvale CA, US
Hong Xiao - Pleasanton CA, US

Assignee:

KLA-Tencor Corporation - Milpitas CA

International Classification:

H01J 37/28
G01N 23/225

US Classification:

250307, 250310

Abstract:

A system for adaptive electron beam scanning may include an inspection sub-system configured to scan an electron beam across the surface of a sample. The inspection sub-system may include an electron beam source, a sample stage, a set of electron-optic elements, a detector assembly and a controller communicatively coupled to one or more portions of the inspection sub-system. The controller may assess one or more characteristics of one or more portions of an area of the sample for inspection and, responsive to the assessed one or more characteristics, adjust one or more scan parameters of the inspection sub-system.