David Kwok Cheng

US Patent:

6366103, Apr 2, 2002

Filed:

Jul 6, 1999

Appl. No.:

09/348751

Inventors:

David Cheng - Sunnyvale CA 94087

International Classification:

G01R 1073

US Classification:

324754, 324758

Abstract:

A multiple test probe system is disclosed. The multiple test probe system includes a support and a mount pivotally coupled to the support. The mount is capable of pivoting to a number of testing positions. A number of probe assemblies are coupled to the mount and associated with a corresponding number of testing positions. The probe assemblies include a number of electrical contacts coupled to a number of wires in a probe bus regardless of a testing position of the mount. The multiple test probe system further includes an actuator coupled to the mount to cause the mount to move between the testing positions.

US Patent:

6454519, Sep 24, 2002

Filed:

Mar 7, 1997

Appl. No.:

08/813480

Inventors:

Masato M. Toshima - Sunnyvale CA
Phil M. Salzman - San Jose CA
Steven C. Murdoch - Palo Alto CA
Cheng Wang - San Jose CA
Mark A. Stenholm - Fremont CA
James Howard - Santa Clara CA
Leonard Hall - San Jose CA
David Cheng - Sunnyvale CA

Assignee:

Applied Materials, Inc. - Santa Clara CA

International Classification:

B65G 4905

US Classification:

414805, 414217, 4142171, 41422201, 414939, 414940, 118719, 118500

Abstract:

A workpiece loading interface is included within a workpiece processing system which processes workpieces, typically wafers, in a vacuum. The workpiece loading interface includes two separate chambers. Each chamber may be separately pumped down. Thus, while a first cassette of wafers, from a first chamber is being accessed, a second cassette of wafers may be loaded in the second chamber and the second chamber pumped down. Each chamber is designed to minimize intrusion to a clean room. Thus a door to each chamber has a mechanism which, when opening the door, first moves the door slightly away from an opening in the chamber and then the door is moved down parallel to the chamber. After the door is opened, a cassette of wafers is lowered through the opening in a motion much like a drawbridge. The cassette may be pivoted within the chamber when the position from which wafers are accessed from the cassette differs from the position from which the cassette is lowered out of the chamber.

US Patent:

6483672, Nov 19, 2002

Filed:

Jun 30, 1999

Appl. No.:

09/343951

Inventors:

Patrick Clinton Arnett - Morgan Hill CA
David Cheekit Cheng - Palo Alto CA
Sakhrat Khizroev - Pittsburgh PA
David Allen Thompson - San Jose CA

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G11B 539

US Classification:

360313

Abstract:

Both the read and write heads are trimmed to approximately 100 nm wide, indicated by Wr and Ww, respectively. The etch depth for the MR element, MR Trenches, is 200 nm and the etch depth for the write head, Write Trenches, is 1 m. In order to confirm that inactive regions are actually those selected for irradiation, during trimming the center of the trimmed MR element has been offset by approximately 300 nm from the center of the original MR element. This offset is observed in the final result.

US Patent:

6653853, Nov 25, 2003

Filed:

Feb 1, 2002

Appl. No.:

10/066391

Inventors:

David Cheng - Sunnyvale CA 94087

International Classification:

G01R 1073

US Classification:

324754, 324758

Abstract:

A multiple test probe system is disclosed. The multiple test probe system includes a support and a mount pivotally coupled to the support. The mount is capable of pivoting to a number of testing positions. A number of probe assemblies are coupled to the mount and associated with a corresponding number of testing positions. The probe assemblies include a number of electrical contacts coupled to a number of wires in a probe bus regardless of a testing position of the mount. The multiple test probe system further includes an indexing device coupled to the mount to cause the mount to move between the testing positions, whereby the indexing device is a multiple linear actuator assembly.

US Patent:

6788079, Sep 7, 2004

Filed:

Feb 1, 2002

Appl. No.:

10/066394

Inventors:

David Cheng - Sunnyvale CA 94087

International Classification:

G10R 1073

US Classification:

324754, 324758

Abstract:

A multiple test probe system is disclosed. The multiple test probe system includes a support and a mount pivotally coupled to the support. The mount is capable of pivoting to a number of testing positions. A number of probe assemblies are coupled to the mount and associated with a corresponding number of testing positions. The probe assemblies include a number of electrical contacts coupled to a number of wires in a probe bus regardless of a testing position of the mount. The multiple test probe system further includes an indexing device coupled to the mount to cause the mount to move between the testing positions, whereby the indexing device is a Geneva Mechanism.

US Patent:

7369750, May 6, 2008

Filed:

Apr 24, 2002

Appl. No.:

10/131661

Inventors:

David J. Cheng - Cupertino CA, US
Mark G. Young - Cupertino CA, US
Pradhan S. Rao - Sunnyvale CA, US

Assignee:

Microsoft Corporation - Redmond WA

International Classification:

H04N 5/91
G06F 13/00

US Classification:

386 83, 725 58, 725 80

Abstract:

Systems, methods, and computer program products for managing and prioritizing record events. A priority manager includes an event list that lists scheduled record events. Each event in the event list has a priority that is different from the other events in the event list. If some of the events conflict, then those events with the highest priority in the event list are recorded. A user can assign priority to events when they are scheduled or at a later time. This enables event conflicts to be resolved by the user when the events are initially scheduled. When an event conflict arises later, the conflict is resolved by the priority manager according to the relative priority of the events in the event list.

US Patent:

7657423, Feb 2, 2010

Filed:

Oct 31, 2003

Appl. No.:

10/697333

Inventors:

Georges R. Harik - Mountain View CA, US
Simon Tong - Mountain View CA, US
David R. Cheng - Avondale PA, US

Assignee:

Google Inc. - Mountain View CA

International Classification:

G06F 17/27

US Classification:

704 9, 704 1, 704 10, 707 2, 707 3, 707 4, 707 5, 707 6, 715261

Abstract:

A system offers potential completions for fragments of text. The system may obtain a text fragment and identify documents that include the text fragment. The system may locate sentences within the documents that include at least a portion of the text fragment, identify sentence endings associated with the located sentences, and present the sentence endings as potential completions for the text fragment.

US Patent:

7748944, Jul 6, 2010

Filed:

Oct 30, 2007

Appl. No.:

11/929357

Inventors:

JB Price - Los Gatos CA, US
Jed Keller - Los Gatos CA, US
Laurence Dulmage - Nevada City CA, US
David Cheng - Sunnyvale CA, US

Assignee:

Crossing Automation, Inc. - Mountain View CA

International Classification:

B65G 49/07

US Classification:

414805, 414217, 414939

Abstract:

A method and apparatus for semiconductor processing is disclosed. In one embodiment, a method of transporting a wafer within a cluster tool, comprises placing the wafer into a first segment of a vacuum enclosure, the vacuum enclosure being attached to a processing chamber and a factory interface. The wafer is transported to a second segment of the vacuum enclosure using a vertical transport mechanism, wherein the second segment is above or below the first segment.

Address:

4886 Reno Ln, El Sobrante, CA 94803

VIN:

5FNRL38677B012554

Make:

HONDA

Model:

ODYSSEY

Year:

2007