David M Click

US Patent:

20160276976, Sep 22, 2016

Filed:

Nov 19, 2013

Appl. No.:

14/442487

Inventors:

- Orlando FL, US
David K. Click - Orlando FL, US
Robert M. Reedy - Auburndale FL, US
Winston V. Schoenfeld - Oviedo FL, US

Assignee:

UNIVERSITY OF CENTRAL FLORIDA RESEARCH FOUNDATION, INC. - Orlando FL

International Classification:

H02S 50/10

Abstract:

A method, a system and a program product for use when monitoring degradation of a photovoltaic cell each use a plurality of current-voltage curves for the photovoltaic cell obtained at a plurality of predetermined times, where the plurality of current-voltage curves is obtained when the photovoltaic cell (or related module, string or array) is in operational service. The use of such a plurality of current-voltage curves provides for extraction of a plurality of degradation characteristics or parameters for the photovoltaic cell.