David Mason Colby

US Patent:

6591205, Jul 8, 2003

Filed:

Oct 22, 1999

Appl. No.:

09/426227

Inventors:

David D. Colby - Richardson TX

Assignee:

Texas Instruments Incorporated - Dallas TX

International Classification:

G06F 1900

US Classification:

702 66, 708274

Abstract:

A method of waveform generation using a VLSI digital tester unit without an arbitrary waveform generator. A software application produces a series of vectors to drive a digital tester unit from a set of datapoints which defines a waveform needed in the test program. The set of datapoints can be generated in a test simulator such as SPICE or can be generated by digitizing the arbitrary waveform needed in a test program. The vectors describe the number of resistors of a pseudo arbitrary waveform generator (PAWG) circuit to be driven high in order to reproduce the desired waveform for input into the device under test. The software also determines the resolution, e. g. , 5 ns, of the waveform.