David Bruce Fortner

US Patent:

20040251920, Dec 16, 2004

Filed:

Jun 11, 2003

Appl. No.:

10/459957

Inventors:

Roger Engelbart - St. Louis MO, US
David Fortner - Sullivan MO, US
Nancy Wood - Clayton MO, US

International Classification:

G01R027/08

US Classification:

324/700000

Abstract:

Apparatus and methods for materials inspection using microwave sensing are disclosed. In one aspect, a system for detecting corrosion of a workpiece includes a scanning assembly having a support assembly adapted to be coupled to the workpiece, and a first translation device coupled to the support assembly. A microwave sensor is coupled to the first translation device. The first translation device is adapted to translate the microwave sensor along at least a first direction, and the microwave sensor is adapted to transmit incident microwave signals onto the workpiece and to receive reflected microwave signals reflected from the workpiece. In an alternate aspect, a system may further include a second translation device that is adapted to translate the microwave sensor along at least a second direction that is transverse to the first direction.