David S Hess

US Patent:

7535247, May 19, 2009

Filed:

Jan 18, 2006

Appl. No.:

11/335037

Inventors:

Peter Andrews - Beaverton OR, US
David Hess - Beaverton OR, US
Robert New - Beaverton OR, US

Assignee:

Cascade Microtech, Inc. - Beaverton OR

International Classification:

G01R 31/00

US Classification:

324770

Abstract:

A system includes an imaging device suitable for effectively positioning a probe for testing a semiconductor wafer. The system includes an objective lens for sensing the device under test and an imaging device sensing a first video sequence including multiple frames of an overlapping region of the device under test. A video signal is provided to a display including multiple frames of the overlapping region of the device under test. An operator indicating a region of the video signal of devices under test and the system in response presenting an enlarged view of a plurality of different regions of the device under test in a plurality of windows free from user input, where the region and the plurality of different regions are simultaneously displayed on the display.

US Patent:

7656172, Feb 2, 2010

Filed:

Jan 18, 2006

Appl. No.:

11/335069

Inventors:

Peter Andrews - Beaverton OR, US
David Hess - Beaverton OR, US

Assignee:

Cascade Microtech, Inc. - Beaverton OR

International Classification:

G01R 31/02

US Classification:

324754

Abstract:

A semiconductor testing system that includes an plural imaging devices for capturing plural video sequences from a single optical path and concurrently displaying the video sequences for effectively positioning a probe for testing a semiconductor wafer.

US Patent:

7898281, Mar 1, 2011

Filed:

Dec 12, 2008

Appl. No.:

12/316511

Inventors:

Peter Andrews - Beaverton OR, US
David Hess - Beaverton OR, US
Robert New - Beaverton OR, US

Assignee:

Cascade Mircotech, Inc. - Beaverton OR

International Classification:

G01R 31/00

US Classification:

324770

Abstract:

A system includes an imaging device for capturing a video sequence and a display for displaying the video in a window of the display and effectively positioning a probe relative to probe pads of a device under test for testing a semiconductor wafer supported by a support of a probing environment.

US Patent:

7940069, May 10, 2011

Filed:

Dec 15, 2009

Appl. No.:

12/653574

Inventors:

Peter Andrews - Beaverton OR, US
David Hess - Beaverton OR, US

Assignee:

Cascade Microtech, Inc. - Beaverton OR

International Classification:

G01R 31/02

US Classification:

32475501

Abstract:

A testing system that includes an plural imaging devices capturing plural video sequences from a single optical path and concurrently displaying the video sequences for effectively positioning a probe for testing a semiconductor wafer.

US Patent:

20060169897, Aug 3, 2006

Filed:

Jan 18, 2006

Appl. No.:

11/335014

Inventors:

Peter Andrews - Beaverton OR, US
David Hess - Beaverton OR, US

International Classification:

G21K 7/00

US Classification:

250310000

Abstract:

A system that includes an imaging device for effectively positioning a probe for testing a semiconductor wafer.

US Patent:

20130010099, Jan 10, 2013

Filed:

Mar 14, 2011

Appl. No.:

13/634009

Inventors:

Peter Andrews - Beaverion OR, US
David Hess - Beaverton OR, US

Assignee:

CASCADE MICOTECH, INC. - Beaverton OR

International Classification:

H04N 7/18

US Classification:

348 79, 348E07085

Abstract:

A system that includes an imaging device for effectively positioning a probe for testing a semiconductor.

US Patent:

20210373073, Dec 2, 2021

Filed:

May 6, 2021

Appl. No.:

17/313789

Inventors:

- Livermore CA, US
Gavin Neil Fisher - Fenny Compton, GB
David Randle Hess - Beaverton OR, US

International Classification:

G01R 31/311
G01R 31/319

Abstract:

Methods of producing augmented probe system images and associated probe systems. A method of producing an augmented probe system image includes recording a base probe system image, generating the augmented probe system image at least partially based on the base probe system image, and presenting the augmented probe system image. The augmented probe system image includes a representation of at least a portion of the probe system that is obscured in the base probe system image. In some examples, a probe system includes a chuck, a probe assembly, an imaging device, and a controller programmed to perform methods disclosed herein.

US Patent:

20190369141, Dec 5, 2019

Filed:

May 23, 2019

Appl. No.:

16/421173

Inventors:

- Beaverton OR, US
David Randle Hess - Beaverton OR, US
Chunyi Yin Leong - San Jose CA, US

International Classification:

G01R 1/02
G01R 1/04
G01R 1/067
G01R 31/26

Abstract:

Probe stations for testing a plurality of devices under test and associated methods are disclosed herein. The methods include generating a test routine and executing the test routine. The probe stations include probe stations that perform the methods.