A rear-mount integrated rotary encoder comprises a mechanical portion and a printed circuit board portion. The mechanical portion of a rear mount integrated rotary encoder comprises a housing including a bushing for receiving one end of a rotatable shaft. The rotatable shaft passes through an open front portion of the housing and is mechanically connected to exposed rotatable circuit contacting members. The printed circuit board portion has an encoder contact pattern formed thereon. The printed circuit board has an area larger than the cross sectional area of the housing. The encoder contact pattern surrounds (or is at least concentric with respect to) an aperture in the circuit board. The rotatable shaft of the rotary encoder is passed through the aperture such that the rotatable circuit contacting members contact the encoder contact pattern on the circuit board. An elastomeric button is mounted on the front surface of the circuit board and surrounds the shaft of the rotary encoder to provide a spring-like action. The rotatable shaft is keyed to allow movement orthogonal to the plane of the circuit board while preventing rotation of the knob with respect to the rotatable shaft.
A signal acquisition instrument, such as an oscilloscope, having an input stage that is referenced to a user's ground is disclosed. Information gathered by the input stage is stored in a storage element powered by a floating power supply that is referenced to the user's ground. After storage, the storage element is disconnected from the floating power and from the user's ground and switched to a power supply referenced to the remainder of the system. FET switching is beneficial, and information can be stored either in an analog format or in a digital format.
Digital-To-Analog Conversion With Combined Pulse Modulators
A digital-to-analog converter includes first and second pulse modulators to generate first and second pulse modulated signals in response to first and second digital values, a third pulse modulator to generate a third pulse modulated signal in response to a third digital value, and a switch/filter circuit to generate an analog signal by combining the first and second pulse modulated signals in response to the third pulse modulated signal. The first and second pulse modulated signals may be low-pass filtered before being combined. In some embodiments, the third digital value may be incremented in a single direction between transitions of the first and second digital values. In some other embodiments, the third digital value may be incremented in opposite directions between alternating transitions of the first and second digital values.
Means Of Providing Variable Reactive Load Capability On An Electronic Load
Embodiments of the invention include an electronic load having variable reactive load capability and techniques for controlling and/or modeling a reactive component in a load. The electronic load can include a user interface through which a latency value is received from a user. A delay is created based on the latency value between the time that a variable of the input signal is sensed and the time that a variable of the input signal is driven to a new value, thereby simulating a reactive component in the electronic load based on the created delay. In one example embodiment, the driven variable can be stepped after the created delay to produce an approximation of a capacitive or inductive element. In another example embodiment, the driven variable can be slewed during the delay period using an arbitrary waveform generator, thereby more accurately simulating the reactive component.
Variable Current Source Having A Programmable Current-Steering Network
A variable current source having a programmable current-steering network is provided in which a plurality of field-effect transistors both provide current switching and form an integral part of the current source. This is accomplished by switching the field-effect transistors into and out of the feedback loop of a voltage follower, which in turn is connected to a current-setting resistor. Reference voltage for the current-setting resistor is provided by a variable voltage generator. The field-effect transistors are switched by means of a programmable digitally-switched bias generator circuit.
Multi-Signal Covariance And Correlation Processing On A Test And Measurement Instrument
- Beaverton OR, US David F. Hiltner - Beaverton OR, US
International Classification:
G06F 15/00
US Classification:
702190, 702189
Abstract:
Embodiments of the invention include methods and instruments for generating covariance and correlation values of two or more signals. The covariance or correlation values are used to compare intervals of interest of the two signals and to produce trigger events based on similarities between the two signals. A reference signal is digitized and stored, and then used as a reference when comparing to a real-time input signal. Mean values of the input signal and the previously stored reference signal are generated so that suitable covariance and correlation values can be generated. Threshold detectors detect when the covariance value and/or the correlation value exceed certain thresholds, which can cause the test and measurement instrument to be triggered.
Neugen, Inc.
Chief Technology Officer
Test Insight
Usa Technical Support Manager
Neugen, Inc.
Senior Ate Test Consultant
Neugen, Inc.
President
Ltx-Credence Jan 1991 - Oct 1993
Chief Applications Technologist
Skills:
Semiconductors Testing Debugging Mixed Signal Test Engineering Asic Semiconductor Industry Electronics Ic Test Equipment Analog Hardware Architecture Microprocessors Circuit Design Soc Product Engineering Failure Analysis Digital Signal Processors Engineering Management Simulations Embedded Systems Rf Manufacturing Electrical Engineering Silicon Characterization Engineering Fpga Vlsi Analog Circuit Design Microcontrollers Application Specific Integrated Circuits Integrated Circuits Technical Training Verilog Firmware Sensors Silicon Debug Device Characterization Test Program Development Labview Spc Design of Experiments Yield Enhancement Dft System on A Chip Field Programmable Gate Arrays Yield Pxi
Languages:
German
Certifications:
Technical Trainer For Advantest Advantest Corporation
General Manager Of Service At Tssi, President Of Neugen, Inc
David Hiltner 1984 graduate of Winnetonka High School in Kansas city, MO is on Classmates.com. See pictures, plan your class reunion and get caught up with David and other high ...