David A Probst

US Patent:

20230053254, Feb 16, 2023

Filed:

Aug 13, 2021

Appl. No.:

17/401716

Inventors:

- Northridge CA, US
Akhil Srinivasan - Woodland Hills CA, US
David L. Probst - Chandler AZ, US
Melissa Tsang - Los Angeles CA, US
Mohsen Askarinya - Chandler AZ, US
Riley Clayton Kimball - Tempe AZ, US
Robert McKinlay - West Hills CA, US
Vu Nguyen - Chandler AZ, US
Wally Dong - Chandler AZ, US
Xin Heng - Glendale CA, US
Brennan Toshner - Northridge CA, US

Assignee:

Medtronic MiniMed, Inc. - Northridge CA

International Classification:

A61B 5/1468
A61B 5/145

Abstract:

A method of testing one or more analyte sensors each comprising a first electrode; a second electrode; and a material layer disposed on or above the first electrode; the method including (a) applying a voltage potential to the first electrode with respect to the second electrode; (b) measuring a test signal comprising an output current from the first electrode that results from the application of the voltage potential; (c) using the test signal from (b) to observe an electrical characteristic of the analyte sensor; and (d) correlating the electrical characteristic a parameter associated with an electrochemical response of the analyte sensor to an analyte, wherein the testing is under dry conditions without exposure of the electrodes to a fluid containing the analyte or an in-vivo environment containing the analyte.

US Patent:

20210077717, Mar 18, 2021

Filed:

Sep 12, 2019

Appl. No.:

16/569401

Inventors:

- Northridge CA, US
Peter Ajemba - Canyon Country CA, US
Steven C. Jacks - Culver City CA, US
Robert C. Mucic - Glendale CA, US
Tyler R. Wong - Pasadena CA, US
Melissa Tsang - Sherman Oaks CA, US
Chi-En Lin - Van Nuys CA, US
Mohsen Askarinya - Chandler AZ, US
David Probst - Chandler AZ, US

International Classification:

A61M 5/172
A61B 5/145
A61M 5/142
A61B 5/1495

Abstract:

Medical devices and related systems and methods are provided. A method of calibrating an instance of a sensing element involves obtaining fabrication process measurement data from a substrate having the instance of the sensing element fabricated thereon, obtaining a calibration model associated with the sensing element, determining calibration data associated with the instance of the sensing element for converting the electrical signals into a calibrated measurement parameter based on the fabrication process measurement data using the calibration model, and storing the calibration data in a data storage element associated with the instance of the sensing element.