David Nathaniel Ray

US Patent:

6415654, Jul 9, 2002

Filed:

Oct 30, 2000

Appl. No.:

09/699803

Inventors:

David J. Ray - Agoura Hills CA 91301

International Classification:

G01B 528

US Classification:

73105

Abstract:

A scanning force microscope system that employs a laser ( ) and a probe assembly ( ) mounted in a removable probe illuminator assembly ( ), that is mounted to the moving portion of a scanning mechanism. The probe illuminator assembly may be removed from the microscope to permit alignment of said laser beam onto a cantilever ( ) after removal. This prevents damage to, and shortens alignment time of, the microscope during replacement and alignment of the probe assembly. The scanning probe microscope assembly ( ) supports a scanning probe microscope ( ). Scanning probe microscope ( ) holds a removable probe sensor assembly ( ). Removable probe sensor assembly ( ) may be transported and conveniently attached to the adjustment station ( ) where the probe sensor assembly parameters may be observed and adjusted if necessary. The probe sensor assembly ( ) may then be attached to the scanning probe microscope ( ).

US Patent:

6748794, Jun 15, 2004

Filed:

Jul 7, 2002

Appl. No.:

10/190404

Inventors:

David James Ray - Agoura Hills CA 91301

International Classification:

G01B 528

US Classification:

73105, 250306, 250307

Abstract:

A scanning force microscope system that employs a laser ( ) and a probe assembly ( ) mounted in a removable probe illuminator assembly ( ), that is mounted to the moving portion of a scanning mechanism. The probe illuminator assembly may be removed from the microscope to permit alignment of said laser beam onto a cantilever ( ) after removal. This prevents damage to, and shortens alignment time of, the microscope during replacement and alignment of the probe assembly. The scanning probe microscope assembly ( ) supports a scanning probe microscope ( ). Scanning probe microscope ( ) holds a removable probe sensor assembly ( ). Removable probe sensor assembly ( ) may be transported and conveniently attached to the adjustment station ( ) where the probe sensor assembly parameters may be observed and adjusted if necessary. The probe sensor assembly ( ) may then be attached to the scanning probe microscope ( ).

US Patent:

6910368, Jun 28, 2005

Filed:

Aug 10, 2004

Appl. No.:

10/850932

Inventors:

David J Ray - Agoura Hills CA, US

Assignee:

Raymax Technology, Inc. - Agoura Hills CA

International Classification:

G01N013/16
G01B005/28

US Classification:

73105

Abstract:

A scanning force microscope system that employs a laser () and a probe assembly () mounted in a removable probe illuminator assembly (), that is mounted to the moving portion of a scanning mechanism. The probe illuminator assembly may be removed from the microscope to permit alignment of said laser beam onto a cantilever () after removal. This prevents damage to, and shortens alignment time of, the microscope during replacement and alignment of the probe assembly. The scanning probe microscope assembly () supports a scanning probe microscope (). Scanning probe microscope () holds a removable probe sensor assembly (). Removable probe sensor assembly () may be transported and conveniently attached to the adjustment station () where the probe sensor assembly parameters may be observed and adjusted if necessary. The probe sensor assembly () may then be attached to the scanning probe microscope ().

US Patent:

7692138, Apr 6, 2010

Filed:

Oct 19, 2007

Appl. No.:

11/975548

Inventors:

David James Ray - Agoura Hills CA, US
Nicholas Gregory Doe - San Ramon CA, US
Terence Rogers Lundy - Bolinas CA, US

International Classification:

G01B 5/28

US Classification:

250234, 250216, 250235

Abstract:

A combination confocal and scanning probe microscope system permits accurate location of a sample within the field of view as the sample translates from one type of microscope to the other. Alternate embodiments permit both microscopes to view the same sample location at the same time. Further alternate embodiments include a confocal and a probe microscope integrated into a common optical path.

US Patent:

20070144244, Jun 28, 2007

Filed:

Dec 20, 2006

Appl. No.:

11/643449

Inventors:

David Ray - Agoura Hills CA, US

International Classification:

G01N 13/10
G01N 13/12
G12B 21/20

US Classification:

073105000, 250306000, 250307000

Abstract:

A scanning probe microscope comprises a probe module. In some embodiments the module is easily removed from the lateral and vertical scanning mechanisms. The module further comprises one or more vertical motion actuator that may be controlled by a multi-path feedback control loop. By coupling the second vertical motion actuator directly to the probe the speed of the scan may be increased over the speed of prior art microscopes. The feedback loop is part of the probe microscope and feedback paths may be independently designed to create independent control of multiple paths.

US Patent:

RE374040, Oct 9, 2001

Filed:

Feb 14, 1997

Appl. No.:

8/801084

Inventors:

Robert S. Harp - Westlake Village CA
David J. Ray - Agoura Hills CA

Assignee:

Quesant Instrument Corporation - Agoura Hills CA

International Classification:

G01B 528

US Classification:

73105

Abstract:

A scanning probe microscope is provided with a piezo-ceramic tube to carry the sensitive probe at its free end to translationally move the probe in the X and Y directions. Large stationary surfaces can then be scanned by probe tip motion. The tube is also capable of movement in the Z direction so that the tip can follow the contours of the surface. Optical detection means track the motion of the probe tip and generate signals corresponding to and representative of surface contours. In one mode of operation, the signals are used in a feed back loop to keep constant the spacing between the tip and the surface, in which case the error or control signals represent the contours.

US Patent:

53571053, Oct 18, 1994

Filed:

Nov 9, 1993

Appl. No.:

8/149290

Inventors:

Robert S. Harp - Westlake Village CA
David J. Ray - Agoura Hills CA

Assignee:

Quesant Instrument Corporation - Agoura Hills CA

International Classification:

G01N 2300
G01B 1100

US Classification:

250234

Abstract:

A scanning force microscope is provided with apparatus to modify the light source with a modulation scheme. Information relative to scanning tip motion is included in a modulated light beam which is then demodulated and filtered to recover the information in the form of a signal which corresponds to and is representative of a chosen parameter of tip motion.

US Patent:

56147120, Mar 25, 1997

Filed:

Mar 24, 1995

Appl. No.:

8/409999

Inventors:

David J. Ray - Agoura Hills CA

Assignee:

Quesant Instrument Corporation - Agoura Hills CA

International Classification:

H01J 3728

US Classification:

250307

Abstract:

A method for initially positioning the scanning probe of a scanning probe microscope includes the steps of initially using fine position control to reduce the distance between probe and sample and, if the sample surface is not encountered, reversing the direction of the fine position control to an intermediate position and then using a coarse control in predetermined increments to narrow the distance between the probe and the sample. The fine control is again used and if the sample surface is not encountered, the steps are repeated until the surface is encountered so that the scanning operation can commence.