David G Reyes

US Patent:

7880890, Feb 1, 2011

Filed:

Dec 28, 2007

Appl. No.:

11/966586

Inventors:

David Reyes - Boston MA, US
E. Robert Schildkraut - Waltham MA, US
Jinhong Kim - Brookline MA, US

Assignee:

Block Engineering, LLC - Marlborough MA

International Classification:

G01B 9/02

US Classification:

356450, 356452

Abstract:

An interferometer system includes an optical bench and at least two mirror structures, being patterned from one or more layers on the optical bench and erected to extend substantially perpendicularly to the bench to define two interferometer arms to provide a Micro-Electro-Mechanical Systems (MEMS) interferometer. The MEMS interferometer is further implemented in a Fourier transform spectrometer, which includes a common housing containing the interferometer and a gas cell, possibly including a preconcentrator.

US Patent:

8587787, Nov 19, 2013

Filed:

Dec 28, 2007

Appl. No.:

11/966594

Inventors:

David Reyes - Boston MA, US
E. Robert Schildkraut - Waltham MA, US
Jinhong Kim - Brookline MA, US

Assignee:

Block Engineering, LLC - Marlborough MA

International Classification:

G01J 3/45

US Classification:

356451

Abstract:

A Micro-Electro-Mechanical Systems (MEMS) interferometer is implemented in a Fourier transform spectrometer, which includes a common housing containing the interferometer and a gas cell, possibly including a preconcentrator. The interferometer system includes an optical bench and at least two mirror structures, being patterned from one or more layers on the optical bench and erected to extend substantially perpendicularly to the bench to define two interferometer arms to provide a MEMS interferometer.

US Patent:

20110063619, Mar 17, 2011

Filed:

Nov 19, 2010

Appl. No.:

12/950363

Inventors:

E. Robert Schildkraut - Waltham MA, US
Jinhong Kim - Brookline MA, US
David Reyes - Boston MA, US

Assignee:

BLOCK ENGINEERING, LLC - Marlborough MA

International Classification:

G01B 9/02
H01S 4/00

US Classification:

356452, 295921

Abstract:

An interferometer system includes an optical bench and at least two mirror structures, being patterned from one or more layers on the optical bench and erected to extend substantially perpendicularly to the bench to define two interferometer arms to provide a Micro-Electro-Mechanical Systems (MEMS) interferometer. The MEMS interferometer is further implemented in a Fourier transform spectrometer, which includes a common housing containing the interferometer and a gas cell, possibly including a preconcentrator.