David S Rundle

US Patent:

20080135771, Jun 12, 2008

Filed:

Mar 7, 2006

Appl. No.:

11/815343

Inventors:

Viatcheslav Vydrin - Pittsburgh PA, US
Robert K. Davis - Pittsburgh PA, US
David S. Rundle - Butler PA, US

Assignee:

II-VI INCORPORATED - Saxonburg PA

International Classification:

G01T 1/24

US Classification:

25037009

Abstract:

A radiation detection system is operative for converting () a radiation event into an electrical signal having an amplitude related to the energy of said radiation event, converting () at least a portion of the electrical signal into a count value related to the amplitude of the electrical signal and determining () the energy of the radiation event from the count value.

US Patent:

20080267353, Oct 30, 2008

Filed:

Jun 15, 2006

Appl. No.:

11/916591

Inventors:

David S. Rundle - Butler PA, US

Assignee:

II-VI INCORPORATED - Saxonburg PA

International Classification:

G01B 15/02
G01N 23/201

US Classification:

378 87, 378 89, 378 86

Abstract:

A specimen inspection system includes a photon source for outputting photons along a transmission path and a conveyor for translating a specimen completely through the transmission path. A radiation detector is positioned offset with respect to the transmission path for detecting photons that are scattered from the transmission path in response to interaction with the specimen passing therethrough. A controller determines from the detected scattered photons that a first material is present in the specimen.

US Patent:

20110101231, May 5, 2011

Filed:

Jun 11, 2009

Appl. No.:

12/865218

Inventors:

David S. Rundle - Butler PA, US

Assignee:

EV PRODUCTS, INC. - Saxonburg PA

International Classification:

H05G 1/60

US Classification:

25037009

Abstract:

In a method of count correction for pixels of a pixilated photon counting detector, the average count value output by each of a plurality of pixels during a period of time is determined. A product is determined of the actual average count value and a multiplying correction factor. A corrected count value is then determined for the pixel equal to a sum of the product and an additive correction factor. The multiplying correction factor equals a square root of a quotient of a desired average count value to be output by each of the plurality of pixels during the period of time divided by the actual average count value. The additive correction factor equals a product of the multiplying correction factor and the actual average count value subtracted from the desired average count value.

US Patent:

20220308242, Sep 29, 2022

Filed:

Mar 25, 2022

Appl. No.:

17/704520

Inventors:

Ge Wang - Loudonville NY, US
Mengzhou Li - Troy NY, US
David S. Rundle - Butler PA, US

Assignee:

Rensselaer Polytechnic Institute - Troy NY

International Classification:

G01T 1/17
G06N 3/04
G06N 3/08
G01T 1/36

Abstract:

A method for x-ray photon-counting data correction. The method includes generating, by a training data generation module, training input spectral projection data based, at least in part, on a reference spectral projection data. The training input spectral projection data includes at least one of a pulse pileup distortion, a charge splitting distortion, and/or noise. The method further includes training, by a training module, a data correction artificial neural network (ANN) based, at least in part, on training data. The data correction ANN includes a pulse pileup correction ANN, and a charge splitting correction ANN. The training data includes the training input spectral projection data and the reference spectral projection data.

US Patent:

20230035618, Feb 2, 2023

Filed:

Aug 26, 2022

Appl. No.:

17/896279

Inventors:

- Troy NY, US
Ruibin Feng - Troy NY, US
David Rundle - Butler PA, US

Assignee:

Rensselaer Polytechnic Institute - Troy NY

International Classification:

G01T 1/17
G01T 1/18
G06T 7/00

Abstract:

A neural network based corrector for photon counting detectors is described. A method for photon count correction includes receiving, by a trained artificial neural network (ANN), a detected photon count from a photon counting detector. The detected photon count corresponds to an attenuated energy spectrum. The attenuated energy spectrum is related to characteristics of an imaging object and is based, at least in part, on an incident energy spectrum. The method further includes correcting, by the trained ANN, the detected photon count to produce a corrected photon count. The method may include reconstructing, by image reconstruction circuitry, an image based, at least in part, on the corrected photon count.

US Patent:

20200408929, Dec 31, 2020

Filed:

Dec 7, 2018

Appl. No.:

16/770675

Inventors:

- Troy NY, US
Ruibin Feng - Troy NY, US
David Rundle - Butler PA, US

Assignee:

RENSSELAER POLYTECHNIC INSTITUTE - Troy NY

International Classification:

G01T 1/17
G01T 1/18
G06T 7/00

Abstract:

A neural network based corrector for photon counting detectors is described. A method for photon count correction includes receiving, by a trained artificial neural network (ANN), a detected photon count from a photon counting detector. The detected photon count corresponds to an attenuated energy spectrum. The attenuated energy spectrum is related to characteristics of an imaging object and is based, at least in part, on an incident energy spectrum. The method further includes correcting, by the trained ANN, the detected photon count to produce a corrected photon count. The method may include reconstructing, by image reconstruction circuitry, an image based, at least in part, on the corrected photon count.