David F Sanders

US Patent:

6696850, Feb 24, 2004

Filed:

Oct 2, 2002

Appl. No.:

10/266263

Inventors:

David L. Sanders - Camden Point MO

Assignee:

Interconnect Devices, Inc. - Kansas City KS

International Classification:

G01R 3102

US Classification:

324761, 324754, 3241581

Abstract:

A spring probe having a barrel, plunger and a back-drilled aperture is provided in which the centerline axis of the aperture is separate from the longitudinal axis of the plunger. A portion of the spring force directed along the longitudinal axis of the probe is transferred to a side force to bias the plunger against the barrel for electrical contact. The lighter, more uniform biasing and slight rotation/agitation of the plunger within that barrel increases the probe life and electrical performance.

US Patent:

7798867, Sep 21, 2010

Filed:

Nov 12, 2008

Appl. No.:

12/269235

Inventors:

David L. Sanders - Camden Point MO, US

Assignee:

Interconnect Devices, Inc. - Kansas City KS

International Classification:

H01R 13/24

US Classification:

439700, 439824

Abstract:

A contact probe assembly may include a cylindrical member including a barrel having a first opening located at a first end of the barrel and a second opening located at a second end of the barrel. The contact probe assembly may also have a plunger having a first end and second end. The first end of the plunger may be adapted to be removably received by the second opening of the barrel. The contact probe assembly may also include a cap having at least one o-ring. The cap may be configured to interconnect with the second end of the barrel such that the o-ring seals a gap between the plunger and the barrel. The contact probe assembly may have a plug that may be adapted to be removably received by the first opening of the barrel. The plug may be configured to seal the first opening.

US Patent:

20050184747, Aug 25, 2005

Filed:

Dec 20, 2004

Appl. No.:

11/017315

Inventors:

David Sanders - Camden Point MO, US

International Classification:

G01R031/02

US Classification:

324761000

Abstract:

A single-piece contact probe includes a tip, coil and base formed from a single piece of electrically conductive material. A helical groove is machined around the center portion of the probe then a bore is drilled from the base toward the tip along the longitudinal axis of the probe to form the coils.

US Patent:

54146461, May 9, 1995

Filed:

Apr 16, 1992

Appl. No.:

7/869371

Inventors:

David L. Sanders - Leavenworth KS
Timothy J. Rolbiecki - Kansas City MO

Assignee:

Brunson Instrument Company - Kansas City MO

International Classification:

G01N 2100

US Classification:

364556

Abstract:

A digital optical micrometer for mounting on an optical instrument and having an optical flat plano-parallel window which is connected to a micrometer drum. The drum can pivot or incline the optical plano-parallel window to cause displacement of a line of sight. The digital optical micrometer further has an LCD read-out that indicates the amount of displacement of the line of sight, a circuit that is connected to the optical plano-parallel window and provides an electrical signal having a signal property which varies in proportion to the inclination of the line of sight, and an analog-to-digital converter that is connected to the circuit and converts the electrical signal to a digital word having a binary value representative of the inclination of the line of sight. The optical micrometer further has a computer which has a clock input that provides for an automatic power down of the micrometer. The micrometer includes a linkage arrangement rotating the optical flat window which minimizes the error effect of gear backlash.