David E Spencer

US Patent:

6742059, May 25, 2004

Filed:

Feb 4, 2000

Appl. No.:

09/498287

Inventors:

Stephen Todd - Shrewsbury MA
Andreas Bauer - Acton MA
David Kurt Spencer - Northborough MA
Walter T. Dobberpuhl - Milford MA

Assignee:

EMC Corporation - Hopkinton MA

International Classification:

G06F 300

US Classification:

710 19, 709219, 709224, 710 15

Abstract:

There is disclosed a client-server configuration including a peripheral device wherein multiple servers interface with both the client and the peripheral. Management software for determining the operating state of the peripheral, known as server agent software, is employed in the multiple servers under control of the client. In order to avoid conflicting information reflecting multiple operating states of the peripheral, a primary/secondary algorithm is used to enable the client to determine only one peripheral operating state while allowing each server to also verify its connectivity to the peripheral and to the client.

US Patent:

7763820, Jul 27, 2010

Filed:

Nov 27, 2007

Appl. No.:

11/986830

Inventors:

David B. Spencer - Bedford MA, US
R. Lynn Conley - Nashville TN, US
Richard E. Hill - Nashville TN, US
Robert H. Parrish - Nashville TN, US
Charles E. Roos - Nashville TN, US

Assignee:

Spectramet, LLC - Wilmington DE

International Classification:

B07C 5/00

US Classification:

209576, 209579, 209589, 356316, 356318, 378 45, 378 47

Abstract:

A piece of material that includes low-Z elements is classified based on photonic emissions detected from the piece of material. Both XRF spectroscopy and OES techniques, for example, Laser-Induced Breakdown Spectroscopy (LIBS) and spark discharge spectroscopy, may be used to classify the piece of material. A stream of pieces of material are moved along a conveying system into a stimulation and detection area. Each piece of material, in turn, is stimulated with a first and second stimulus, of a same or different type, causing the piece of material to emit emissions, for example, photons, which may include at least one of x-ray photons (i. e. , x-rays) and optical emissions. These emissions then are detected by one or more detectors of a same or different type. The piece of materials is then classified, for example, using a combination of hardware, software and/or firmware, based on the detected emissions, and then sorted.

US Patent:

20130079918, Mar 28, 2013

Filed:

Aug 31, 2012

Appl. No.:

13/600969

Inventors:

David B. Spencer - Bedford MA, US
Jeffrey J. Webster - Leeds MA, US
Aldo M. Reti - Cape Coral FL, US
Richard E. Hill - Nashville TN, US
R. Lynn Conley - Antioch TN, US

Assignee:

Spectramet, LLC - Bedford MA

International Classification:

B07C 5/34
G01N 23/223

US Classification:

700223, 378 45, 378 49

Abstract:

Systems for sorting materials, such as those made of metal, are described. The systems may operate by irradiating the materials with x-rays and then detecting fluoresced x-rays, transmitted x-rays, or both. Detection of the fluoresced x-rays may be performed using an x-ray fluorescence detector array. The systems may be configured to provide high throughput sorting of small pieces of materials.

US Patent:

20130264249, Oct 10, 2013

Filed:

Jun 3, 2013

Appl. No.:

13/908534

Inventors:

David B. Spencer - Bedford MA, US
R. Lynn Conley - Antioch TN, US
Richard E. Hill - Nashville TN, US
Robert H. Parrish - Nashville TN, US
Charles E. Roos - Nashville TN, US

International Classification:

B07C 5/342

US Classification:

209589

Abstract:

A piece of material that includes low-Z elements is classified based on photonic emissions detected from the piece of material. Both XRF spectroscopy and OES techniques, for example, Laser-Induced Breakdown Spectroscopy (LIBS) and spark discharge spectroscopy, may be used to classify the piece of material. A stream of pieces of material are moved along a conveying system into a stimulation and detection area. Each piece of material, in turn, is stimulated with a first and second stimulus, of a same or different type, causing the piece of material to emit emissions, for example, photons, which may include at least one of x-ray photons (i.e., x-rays) and optical emissions. These emissions then are detected by one or more detectors of a same or different type. The piece of materials is then classified, for example, using a combination of hardware, software and/or firmware, based on the detected emissions, and then sorted.

US Patent:

39544559, May 4, 1976

Filed:

May 20, 1974

Appl. No.:

5/471324

Inventors:

Merton C. Flemings - Lexington MA
Robert Mehrabian - Arlington MA
David B. Spencer - Bedford MA

Assignee:

Massachusetts Institute of Technology - Cambridge MA

International Classification:

C22C 2300
C22C 1800
C22C 3300

US Classification:

75134R

Abstract:

A metal composition characterized by degenerate dendritic or nodular primary discrete solid particles suspended in a secondary phase having a lower melting point than the primary particles and which secondary phase can be solid or liquid. The method involves raising the temperature of a metal alloy to a value at which the alloy is largely or completely in the molten state. The melt then is subjected to vigorous agitation and the temperature is reduced to increase the portion of the mixture in solid degenerate dendrite or nodular form up to about sixty-five percent, but usually up to about fifty percent, while continuing the agitation. At this juncture the temperature of the liquid-solid composition can be reduced to cause solidification thereof or it can be cast. The solidified composition can be stored and later it can be brought again to the liquid-solid mixture state and then recast.

US Patent:

62337300, May 15, 2001

Filed:

Dec 16, 1998

Appl. No.:

9/213073

Inventors:

Stephen Todd - Shrewsbury MA
David Spencer - Northboro MA
Andreas Bauer - Acton MA
David DesRoches - Methuen MA

Assignee:

EMC Corporation - Hopkinton MA

International Classification:

G06F 9445

US Classification:

717 4

Abstract:

Program revision compatibility in an object-oriented environment is provided operating between a first and a second program. The first program has a parent object with an initial group of fields and an inherited child object with an initial group of fields. In one embodiment, an expansion descriptor is established in the first program which provides a data storage location for data of a new field. The data of the new field is sent to the data storage location of the expansion descriptor and a child object identifier is associated with the data of the new field in the expansion descriptor. The expansion descriptor is sent to the second program along with object information of the child object corresponding to the initial group of fields. The second program recognizes the expansion descriptor and may update a corresponding child object of the second program regardless of whether the second program has been updated with the new field.