Derek J Nelson

US Patent:

6421323, Jul 16, 2002

Filed:

Sep 12, 1996

Appl. No.:

08/713027

Inventors:

Derek J. Nelson - San Diego CA
Paul R. Hartmann - Escondido CA
Edward S. Tyburski - Carlsbad CA

Assignee:

Applied Digital Access, Inc. - Dover DE

International Classification:

G01R 3108

US Classification:

370249, 370252, 370470, 370526, 379 2602, 379 2701

Abstract:

A method and apparatus for automated sectionalization of a DS1/DS3 data path based upon information received at a single location along the path. A test and monitor device is located at a point of demarcation between an LEC and an IEC. A Remote Module is located at a point of demarcation between the LEC and CPE. The test and monitor device is fully ANSI compatible. The information that is received is processed in a three step process in order to generate a âSectionalizer Reportâ. In preparing the Sectionalizer Report, the information output from a filter is used to determine where particular Events originated.

US Patent:

7304958, Dec 4, 2007

Filed:

Jul 10, 2002

Appl. No.:

10/194520

Inventors:

Derek J. Nelson - San Diego CA, US
Paul R. Hartmann - Escondido CA, US
Edward S. Tyburski - Carlsbad CA, US

Assignee:

Acterna LLC - Germantown MD

International Classification:

G01R 31/08

US Classification:

370249, 370470

Abstract:

A method and apparatus for automated sectionalization of a DS1/DS3 data path based upon information received at a single location along the path. A test and monitor device is located at a point of demarcation between an LEC and an IEC. A Remote Module is located at a point of demarcation between the LEC and CPE. The test and monitor device is fully ANSI compatible. The information that is received is processed in a three step process in order to generate a “Sectionalizer Report”. In preparing the Sectionalizer Report, the information output from a filter is used to determine where particular Events originated.