Donald W Sackett

US Patent:

20140022532, Jan 23, 2014

Filed:

Aug 22, 2012

Appl. No.:

13/591907

Inventors:

Donald W. Sackett - Bedford MA, US

International Classification:

G01J 3/42
G01J 3/44

US Classification:

356 51, 356300, 356301

Abstract:

A dual source system and method includes a high power laser used to determine elements in a sample and a lower power device used to determine compounds present in the sample. An optical subsystem directs photons from a sample to a detector subsystem after laser energy from the laser strikes the sample along an optical path. After energy from the device strikes the sample protons are directed to the detector subsystem along the same optical path. The detector subsystem receives photons after laser energy from the laser strikes the sample and provides a first signal, and receives photons after energy from the device strikes the sample and provides a second signal. A controller subsystem pulses the high power laser and processes the first signal to determine elements present in the sample, energizes the lower power device and processes the second signal to determine compounds present in the sample.

US Patent:

20190302040, Oct 3, 2019

Filed:

Apr 19, 2018

Appl. No.:

15/957448

Inventors:

- Woburn MA, US
Donald W. Sackett - Bedford MA, US

International Classification:

G01N 23/223

Abstract:

A portable hand held XRF analyzer and method wherein an X-ray source directs X-rays to a sample and a detector detects photons emitted by the sample. A controller subsystem controlling the X-ray source an I/O section and is responsive to the detector and I/O section. The controller subsystem is configured to present to the user, via the I/O section, a choice to invoke an aluminum alloy algorithm test. An aluminum alloy algorithm test is invoked if the operator chooses the aluminum alloy algorithm test. Then, the X-ray source is operated at a predetermined voltage level and predetermined current level and the detector output is analyzed to determine elements and their concentrations present in the sample. Preferably, if the analysis fails to detect one or more common aluminum alloy elements present in the sample and/or fails to specify a particular aluminum alloy, then the X-ray source is automatically operated at a higher voltage and lower current level to repeat the analysis step.

US Patent:

20170219429, Aug 3, 2017

Filed:

Apr 11, 2017

Appl. No.:

15/484767

Inventors:

- Woburn MA, US
Donald W. Sackett - Bedford MA, US

International Classification:

G01J 3/02
G01J 3/443
G01J 3/10
G01N 21/71

Abstract:

A LIBS analyzer and method includes a laser configured to produce a plasma on a sample at a focal point on the sample and a spectrometer responsive to radiation emitted from the plasma and configured to produce an output spectrum. A detector is positioned to detect low intensity pre-firing radiation produced by the laser and reflected off the sample from the focal point. The intensity of the low intensity pre-firing radiation is compared to a predetermined minimum and the laser pump sequence is halted if the intensity of the low intensity pre-firing radiation is less than the predetermined minimum.

US Patent:

20160252397, Sep 1, 2016

Filed:

Feb 26, 2015

Appl. No.:

14/632419

Inventors:

- Woburn MA, US
Donald W. Sackett - Bedford MA, US

International Classification:

G01J 3/443
G01J 3/10

Abstract:

A LIBS analyzer, preferably handheld, includes a laser configured to produce a plasma on a sample and a spectrometer responsive to radiation emitted from the plasma and configured to produce a spectrum. A controller subsystem is configured to control energizing the laser and to analyze the resulting spectrum from each laser pulse to determine if the laser is aimed at a sample. If the analyzed spectrum reveals the laser is not aimed at the sample, the controller subsystem halts the laser puke sequence.

US Patent:

20160252398, Sep 1, 2016

Filed:

Jul 16, 2015

Appl. No.:

14/800888

Inventors:

- Wobum MA, US
Donald W. Sackett - Bedford MA, US

International Classification:

G01J 3/443
G01J 3/10

Abstract:

A LIBS analyzer and method includes a laser configured to produce a plasma on a sample at a focal point on the sample and a spectrometer responsive to radiation emitted from the plasma and configured to produce an output spectrum. A detector is positioned to detect low intensity pre-firing radiation produced by the laser and reflected off the sample from the focal point. The intensity of the low intensity pre-firing radiation is compared to a predetermined minimum and the laser pump sequence is halted if the intensity of the low intensity pre-firing radiation is less than the predetermined minimum.

US Patent:

20150377805, Dec 31, 2015

Filed:

Jun 22, 2015

Appl. No.:

14/746130

Inventors:

- Woburn MA, US
Donald W. Sackett - Bedford MA, US

International Classification:

G01N 23/22
G01N 23/223
G01N 21/71

Abstract:

A combined handheld XRF and LIBS system and method includes an XRF subsystem with an X-ray source operated at a fixed medium voltage and configured to deliver X-rays to a sample without passing through a mechanized filter and a detector for detecting fluoresced radiation from the sample. The LIBS subsystem includes a low power laser source for delivering a laser beam to the sample and a narrow wavelength range spectrometer subsystem for analyzing optical emissions from the sample. The X-ray source is operated at the fixed medium voltage to analyze the sample for a first group of elements, namely, transition and/or heavy metals. The low power laser source is operated to analyze the sample for a second group of elements the XRF subsystem cannot reliably detect, namely, C, Be, Li, Na, and/or B, and to analyze the sample for a third group of elements the XRF subsystem cannot reliably detect at the fixed voltage, namely, Al, Si, and/or Mg, or where the XRF subsystem would require higher tube voltage, namely Cd, Ag, In, Sn, Sb, and/or Ba; and/or rare earth elements.