Donald A Stephenson

US Patent:

6614534, Sep 2, 2003

Filed:

Dec 14, 1999

Appl. No.:

09/460280

Inventors:

Michael A. Marcus - Honeoye Falls NY
Jiann-Rong Lee - Webster NY
Donald A. Stephenson - Rochester NY
Thomas F. Kaltenbach - Webster NY

Assignee:

Eastman Kodak Company - Rochester NY

International Classification:

G01B 1102

US Classification:

356503, 356497

Abstract:

A method of simultaneously measuring the thickness, group index of refraction, and top and bottom surface profiles of a sample, includes the steps of locating the sample between a surface of a transparent optical flat and a parallel reflective surface such that the respective optical distances between any two of the surface of the optical flat, the top surface of the sample, the bottom surface of the sample, and the reflective surface are distinct and in a known relative optical distance relationship, the distance between the surface of the transparent optical flat and the parallel reflective surface being known. A low-coherent light interferometer operating in an autocorrelation configuration is employed to measure the distance between the optical flat surface and the top surface of the sample, the optical thickness of the sample, and the distance between the bottom surface of the sample and the reflective surface at a plurality of locations over the sample, employing the known relative optical distance relationships. Top and bottom surface profiles and a thickness profile of the sample are generated from the measured distances and the known distance between the surface of the transparent optical flat and the parallel reflective surface. An group index of refraction profile is generated from the measured optical thickness and bottom surface profiles.

US Patent:

6916221, Jul 12, 2005

Filed:

Nov 18, 2002

Appl. No.:

10/298747

Inventors:

Thomas F. Kaltenbach - Webster NY, US
Paul J. Guiguizian - Pittsford NY, US
Donald A. Stephenson - Rochester NY, US

Assignee:

Eastman Kodak Company - Rochester NY

International Classification:

H01J009/42

US Classification:

445 3, 3151691

Abstract:

A method of determining defects in OLED devices having a plurality of pixels, each with its own emissive layer, which are capable of being excited by input light to produce an output color light response, including illuminating one or more OLED devices or a portion of an OLED device with light in a predetermined portion of the spectrum so that the pixel emissive layers are excited to produce an output color response for each pixel, capturing an image of the output light produced by the excited pixels and converting such captured light into a digital image; and determining device pixel size, shape, location, and emitted light intensity from the digital image and comparing such size, shape, location, and emitted light intensity with predetermined acceptable size, shape, location, and emitted light intensity ranges to determine whether there is a defect in the OLED device(s).

US Patent:

20040050108, Mar 18, 2004

Filed:

Aug 29, 2002

Appl. No.:

10/230908

Inventors:

Mary Winters - Rochester NY, US
Carlos Alonzo - Rochester NY, US
Paul McLaughlin - Rochester NY, US
John Pulver - Kendall NY, US
Anna Hrycin - Rochester NY, US
Donald Stephenson - Rochester NY, US

Assignee:

Eastman Kodak Company

International Classification:

C03B011/06

US Classification:

065/374110, 065/374120

Abstract:

A method for fabricating a molding tool for mold glass optical elements therewith is taught. The method comprises the steps of figuring the molding tool to have a predetermined mold surface; applying an attenuating coating to the predetermined mold surface; implanting metal ions through the attenuating coating and into the predetermined mold surface; and removing the attenuating coating leaving the predetermined mold surface with metal ions implanted therein. The method of fabrication allows for the molding tool made therewith to be used for molding optical elements from eco-glasses such as titania at high temperatures without generating adverse surface chemistry effects in the molded element

US Patent:

20050126226, Jun 16, 2005

Filed:

Feb 1, 2005

Appl. No.:

11/048558

Inventors:

Mary Winters - Rochester NY, US
Carlos Alonzo - Rochester NY, US
Paul McLaughlin - Rochester NY, US
John Pulver - Kendall NY, US
Anna Hrycin - Rochester NY, US
Donald Stephenson - Rochester NY, US

International Classification:

C03B023/00

US Classification:

065102000, 065374120, 065374110

Abstract:

A method for fabricating a molding tool for mold glass optical elements therewith is taught. The method comprises the steps of figuring the molding tool to have a predetermined mold surface; applying an attenuating coating to the predetermined mold surface; implanting metal ions through the attenuating coating and into the predetermined mold surface; and removing the attenuating coating leaving the predetermined mold surface with metal ions implanted therein. The method of fabrication allows for the molding tool made therewith to be used for molding optical elements from eco-glasses such as titania at high temperatures without generating adverse surface chemistry effects in the molded element.

US Patent:

47535113, Jun 28, 1988

Filed:

Oct 7, 1985

Appl. No.:

6/776235

Inventors:

Richard R. Bowers - Rochester NY
James P. Carroll - Spencerport NY
Frederick B. Messbauer - Rochester NY
Donald A. Stephenson - Rochester NY

Assignee:

Eastman Kodak Company - Rochester NY

International Classification:

G02B 638

US Classification:

350 9621

Abstract:

A selected value of attenuation can be inserted in an expanded beam fiber optic connector or coupling component. The attenuator includes a spacer member having planar ends slightly inclined to one another so that the axes of the lenses in the two halves of the connection are caused to be misaligned when the spacer member is disposed between the lenses. An adapter kit is disclosed for modifying an existing connector lacking the ability to selectively attenuate. The kit includes a housing extension member and a spacer member.