Douglas A. Mercer - Bradford MA David H. Robertson - Boxford MA Ernest T. Stroud - Greensboro NC David Reynolds - Dove Canyon CA
Assignee:
Analog Devices, Inc. - Norwood MA
International Classification:
H03K 32885
US Classification:
341133, 341144, 327 51
Abstract:
A differential switch accepts a binary control signal and its complement (which may be skewed with respect to the control signal) and latches both signals simultaneously. The latched output signals drive the control terminals of a differential switch pair which connects one of two terminals to a third terminal, depending upon the state of the control terminals. The differential switch may optionally include an inverter which complements the binary control signal, thus eliminating the need for external inversion of the control signal. The switch is particularly applicable for use in a digital to analog converter.
Digital To Analog Interface With Equalized Total Signal Delay And Method Of Making It
William G. J. Schofield - North Andover MA Douglas A. Mercer - Bradford MA
Assignee:
Analog Devices, Inc. - Norwood MA
International Classification:
H03M 166
US Classification:
341144, 333 62, 327395
Abstract:
A method of equalizing total signal delay across a digital to analog interface includes constructing a plurality of unit digital to analog converter cells each having a clock input and a data input and an analog output; constructing an analog output network for summing the analog outputs for delivery to a termination which in combination with the analog output network defines a first predetermined time delay between the unit cells; constructing a clock input distribution network for propagating a clock input to each of the unit cells tapped along the clock input distribution network; and connecting a second termination to the clock input distribution network for establishing the clock input distribution network as a transmission line and defining in combination with the clock input distribution network a second predetermined time interval delay between the clock input to the unit cells equal to the first predetermined in the interval delay for synchronizing the propagation of the clock inputs propagating along the clock input distribution network with the analog outputs propagating along the analog output network.
Current Switching Cell For Digital To Analog Converter
William G. J. Schofield - North Andover MA Douglas A. Mercer - Bradford MA
Assignee:
Analog Devices, Inc. - Norwood MA
International Classification:
H03M 166
US Classification:
341144, 327108
Abstract:
A current switching cell for a multi-cell DAC, each cell having a data input and an analog output and including a current switching circuit having a current node; a current definition circuit for providing current to the current switching circuit at the current node; the current definition circuit having a parasitic coupling between the input and the current node; a driver circuit responsive to a data input for actuating the current switching circuit to provide an analog output from the current from the current definition circuit; and a control circuit responsive to at least one common control signal for controlling the current definition circuit and isolating the parasitic coupling between the current node and the common control signal; the driver circuit may also have a parasitic coupling between its driver input and the current node and the control circuit may isolate the parasitic coupling between the current node and the driver input.
William G. J. Schofield - North Andover MA Douglas A. Mercer - Bradford MA
Assignee:
Analog Devices, Inc. - Norwood MA
International Classification:
H03M 166
US Classification:
341120, 341136, 327416, 323312
Abstract:
A calibrated current source includes current source having an output node; a calibration circuit; a load circuit; a cascode switching circuit including a pair of cascode switches, one connected between the local circuit and output node, the other connected between the calibration circuit and the output node; and a bias circuit selectively applying a bias voltage to the cascode switches to selectively connect the load circuit and the calibration circuit to the output node while maintaining a constant voltage at the output node and across the current source to provide a consistent current to the load and calibration circuits.
Douglas A. Mercer - Bradford MA Michael P. Timko - Andover MA
Assignee:
Analog Devices, Inc. - Norwood MA
International Classification:
G01R 2500
US Classification:
327 9, 327 94
Abstract:
A method and apparatus for measuring and controlling the phase difference or time difference between two signals is presented. In some embodiments two sample and hold (S/H) circuits are arranged as a cooperating system that alternately samples a first signal using the second as a reference. Chopping may be used at the input or output of the S/H circuits. In some embodiments, accurate measurement of digital signal phase differences, such as between two square waves, is obtained without the problems associated with traditional pulse-generation techniques that fail at high frequencies and short pulse lengths.
Digital/Analog Converter Including Gain Control For A Sub-Digital/Analog Converter
Douglas A. Mercer - Bradford MA William G. J. Schofield - North Andover MA
Assignee:
Analog Devices, Inc. - Norwood MA
International Classification:
H03M 166
US Classification:
341144, 341145
Abstract:
A digital to analog converter circuit is segmented into a main digital to analog converting unit including a plurality of current sources and a plurality of cascode units, each current source being connected to a cascode unit and a sub-digital to analog converting unit including a current source connected to a plurality of cascode units. A cascode bias unit is operatively connected to each cascode unit of the main digital to analog converting unit so as to bias each current source of the main digital to analog converting unit to operate at a same drain voltage. A second cascode bias unit is operatively connected to each cascode unit of the sub-digital to analog converting unit so as to bias the current source of the sub-digital to analog converting unit to operate at a same drain voltage. A reference voltage source is operatively connected to an input of the first cascode bias unit and connected to an input of the second cascode bias unit. The tying of the reference voltage source to both cascode bias circuits causes the operating emitter/source to collector/drain voltage of each current source transistor of the main digital to analog converting unit to be equal to the operating emitter/source to collector/drain voltage of the current source transistor of the sub-digital to analog converting unit.
William G. J. Schofield - North Andover MA Douglas A. Mercer - Bradford MA
Assignee:
Analog Devices, Inc. - Norwood MA
International Classification:
H03M 166
US Classification:
341144, 327408
Abstract:
Methods and devices for code independent switching in a digital-to-analog converter (DAC) are described. A synchronous digital circuit is triggered by a clocking signal and develops a digital data signal. A current steering circuit has a common source node for supplying current, and develops an analog output signal representative of the digital data signal. Any switching disturbances at the common source node are substantially data independent.
Memory Cell With Transistors Having Relatively High Threshold Voltages In Response To Selective Gate Doping
A method of forming a semiconductor circuit ( ). The method forms a first transistor (NT ) using various steps, such as by forming a first source/drain region ( ) as a first doped region in a fixed relationship to a semiconductor substrate ( ) and forming a second source/drain region ( ) as a second doped region in a fixed relationship to the semiconductor substrate. The second doped region and the first doped region are of a same conductivity type. Additionally, the first transistor is formed by forming a first gate ( ) in a fixed relationship to the first source/drain region and the second drain region. The method also forms a second transistor (ST ) using various steps, such as by forming a third source/drain region ( ) as a third doped region in a fixed relationship to the semiconductor substrate and forming a fourth source/drain region ( ) as a fourth doped region in a fixed relationship to the semiconductor substrate. The fourth doped region and the third doped region are of the same conductivity type as the first and second doped regions. Additionally, the second transistor is formed by forming a second gate ( ) in a fixed relationship to the third source/drain region and the fourth drain region.